2018 IEEE 27th North Atlantic Test Workshop (NATW)
IEEE sponsors:
- Green Mountain Section
- IEEE USA Washington, DC
- Region 01- Northeastern USA
The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. In addition to traditional topics, the 27th NATW will feature a general theme of "Sillicon Photonics." Topics are not limited to, the following: Analog, Mixed Signal and RF Testing, Built-In Self-Test (BIST), Board Level Testing, Delay and Performance Testing, Design Verification/Validation, Diagnosis and Debug, Fault Modeling/Simulation, FPGA and Embedded Core Testing, IDDQ Testing, DFM, Defect Analysis and Defect-Based Testing, Memory and MEMS Testing, Nanotechnology Testing, Online Testing, System-on-Chip (SoC) Test and Debug/Test Quality and System Reliability.
Date and Time
Location
Hosts
Registration
- Start time: 07 May 2018 09:00 AM
- End time: 09 May 2018 05:00 PM
- All times are (GMT-05:00) US/Eastern
- Add Event to Calendar
Agenda
Conference Details
Dates
07 May - 09 May 2018
Location
Essex Resort & Spa
70 Essex Way
Essex, VT, USA
Web site
natw.ieee.org
Contact
Ted Cooley
236 Dame Hill Road
Orford NH USA 03777
603-353-9325
603-398-4349
escooley03@gmail.com