Seminar: Testing in the Year 2024 -- Big Changes are Coming -- By Dr. Phil Nigh

#Semiconductor #Test
Share

Abstract

 

We are facing major technological, cost & complexity challenges. Today, I believe we understand the drivers and emerging challenges -- but I don't think we've grasped how these changes will impact testing and how we will deliver high quality/reliability products in the future.  In this talk, I'll give my view on what Testing will be like 8 years from now.  Now is the time to start planning for these changes.

  •        Products will be a heterogeneous mix of IC components from multiple foundries -- each built using technologies optimized for cost and performance -- combined into a final component where this complexity is not apparent in the final application. 
  •        Products will adapt themselves to process variation, circuit marginalities, environmental changes and aging -- thereby simplifying Testing and achieving superior fault tolerance and power/performance.
  •        Data & Analytics will drive all production processes with particular improvement in exploiting real-time adaptation during the testing & manufacturing process. Testing will be viewed more as a production personalization and data collection process (driving fab/design improvements) -- than just sorting pass/failing dies.

 

Speaker Biography

 

Phil Nigh has been a Test Engineer for over 33 years at IBM and GLOBALFOUNDRIES and is responsible for defining & driving Test Strategy including test methods, design-for-test, diagnostic methods and Adaptive Testing. Phil received his PhD from Carnegie Mellon University in 1990. Phil received the Best Paper award at the International Test Conference in 1999 and has done a number of keynote addresses at conferences and workshops. He has organized the “Industry Test Challenges” workshop for over 10 years.

 



  Date and Time

  Location

  Hosts

  Registration



  • Date: 13 Jun 2016
  • Time: 12:00 PM to 01:00 PM
  • All times are (GMT-05:00) US/Eastern
  • Add_To_Calendar_icon Add Event to Calendar
  • 1000 River Street
  • Essex Junction, Vermont
  • United States 05452
  • Building: GLOBALFOUNDRIES Cafeteria (Meet at Main Lobby) Building 969

  • Contact Event Host
  • Attendees needed badges to attend (anyone without a GLOBALFOUNDRIES or IBM badge) must send an email to jeanne.bickford@globalfoundries.com by the end of the day on June 8.

    The note should contain their full name, and citizenship.

    All attendees requiring badges must be at the GLOBALFOUNDRIES main site lobby by 11:40 AM   -- The group attending will leave the main lobby at 11:55 -- those arriving after 11:40 may not be able to attend.

     

     

  • Co-sponsored by GLOBALFOUNDRIES


  Speakers

Topic:

Testing in the Year 2024 -- Big Changes are Coming -- By Dr. Phil Nigh

Abstract 


We are facing major technological, cost & complexity challenges. Today, I believe we understand the drivers and emerging challenges -- but I don't think we've grasped how these changes will impact testing and how we will deliver high quality/reliability products in the future.  In this talk, I'll give my view on what Testing will be like 8 years from now.  Now is the time to start planning for these changes.



  •        Products will be a heterogeneous mix of IC components from multiple foundries -- each built using technologies optimized for cost and performance -- combined into a final component where this complexity is not apparent in the final application. 

  •        Products will adapt themselves to process variation, circuit marginalities, environmental changes and aging -- thereby simplifying Testing and achieving superior fault tolerance and power/performance.

  •        Data & Analytics will drive all production processes with particular improvement in exploiting real-time adaptation during the testing & manufacturing process. Testing will be viewed more as a production personalization and data collection process (driving fab/design improvements) -- than just sorting pass/failing dies.


 

Biography:

Testing in the Year 2024 -- Big Changes are Coming -- By Dr. Phil Nigh

Topic:

Testing in the Year 2024 -- Big Changes are Coming -- By Dr. Phil Nigh

Biography:






Agenda

Attendees needed badges to attend (anyone without a GLOBALFOUNDRIES or IBM badge) must send an email to jeanne.bickford@globalfoundries.com by the end of the day on June 8.

The note should contain their full name, and citizenship.

All attendees requiring badges must be at the GLOBALFOUNDRIES main site lobby by 11:40 AM   -- The group attending will leave the main lobby at 11:55 -- those arriving after 11:40 may not be able to attend.