Everything You Can Do With Vector Nonlinear Microwave Measurements
MTT-S Distinguished Lecture Talk
The advent of nonlinear vector network analyzers (NVNA) has stimulated the introduction of new paradigms in microwave engineering for (1) the measurement, (2) the modeling and (3) the design of nonlinear microwave circuits such as microwave power amplifiers and oscillators
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- Date: 10 Nov 2016
- Time: 05:00 PM to 07:00 PM
- All times are (UTC-05:00) Eastern Time (US & Canada)
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- 154 Summit Street, Newark, NJ 07102
- Newark, New Jersey
- United States 07102
- Building: ECEC
- Room Number: 202
- Click here for Map
- Contact Event Host
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Dr. Ajay K. Poddar, Ph.: 201-560-3806, email:akpoddar@ieee.org
Dr. Durga Misra, +1-973-596-5739, email: dmisra@ieee.org
Dr. Edip Niver, email: edip.niver@njit.edu
- Co-sponsored by AP01/MTT17 & ED/CAS
- Starts 15 October 2016 10:00 AM
- Ends 10 November 2016 10:00 AM
- All times are (UTC-05:00) Eastern Time (US & Canada)
- No Admission Charge
Speakers
Dr. Patrick Roblin of Department of Electrical and Computer Engineering, The Ohio State University
Everything You Can Do With Vector Nonlinear Microwave Measurements
The advent of nonlinear vector network analyzers (NVNA) has stimulated the introduction of new paradigms in microwave engineering for (1) the measurement, (2) the modeling and (3) the design of nonlinear microwave circuits such as microwave power amplifiers and oscillators.
First the various types of NVNA architecture available, the procedure used to calibrate them and the calibration traceability will be presented. Then the various behavioral models used for the data representation will be reviewed. Circuit-based nonlinear microwave models of transistors can also be directly extracted from large-signal measurements. NVNA’s can further be used to verify the nonlinear embedding device model which predicts from the desired internal PA mode of operation, the required amplitude and phase of the multi-harmonic incident waves at the transistor measurement reference planes. Example of design of power amplifiers (PA) such as Doherty and Chireix amplifiers will be presented. Finally low-duty rate pulsed RF NVNA measurements used to study low-frequency memory effects such as parasitics BJT, self-heating, and trapping will be presented
Biography:
Dr. Patrick Roblin was born in Paris, France, in September 1958. He received the Maitrise de Physics degree from the Louis Pasteur University, Strasbourg, France, in 1980, and the M.S. and D.Sc. degrees in electrical engineering from Washington University, St. Louis, MO, in 1982 and 1984, respectively. In 1984, he joined the Department of Electrical Engineering, at The Ohio State University (OSU), Columbus, OH, as an Assistant Professor and is currently a Professor. His present research interests include the measurement, modeling, design and linearization of non-linear RF devices and circuits such as oscillators, mixers, power-amplifiers and MIMO systems. Starting 2016 he will be serving for three years as DML for IEEE-MTT.
Email:
Address:Department of Electrical and Computer Engineering, The Ohio State University, Colombus, United States
Dr. Patrick Roblin of Department of Electrical and Computer Engineering, The Ohio State University
Everything You Can Do With Vector Nonlinear Microwave Measurements
Biography:
Email:
Address:Colombus, United States
Dr. Patrick Roblin of Department of Electrical and Computer Engineering, The Ohio State University
Everything You Can Do With Vector Nonlinear Microwave Measurements
Biography:
Email:
Address:Colombus, United States
Agenda
Event Time:5:00 PM to 7:00 PM
5:00 PM- Refreshments and Networking
5:30PM-7:00 PM: Talk by Prof. Patrick Roblin, Department of Electrical and Computer Engineering,The Ohio State University
Seminar in ECE 202 All Welcome: There is no fee/charge for attending IEEE technical semiar. You don't have to be an IEEE Member to attend. Refreshmen is free for all attendess. Please invite your friends and colleagues to take advantages of this Invited Distinguished Lecture.