Space and Radiation Effects on Semiconductor Devices

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Abstract

Space and Nuclear radiation has major disruptive effects on electronic device operation and reliability, not only in space, but also for avionic and terrestrial applications. Single Event Effects (SEE) caused by a single charged particle presents a major challenge especially for scaled technologies. 

This is an IEEE Distinguished Lecturer Presentation by Nadim Haddad, Fellow, IEEE and a member of the Electron Devices Society (EDS) and the Nuclear and Plasma Sciences Society (NPSS).

Nadim received his BA in Physics and Mathematics from Kansas Wesleyan University and his MSEE from Michigan State University. He was instrumental to the development of nine generations of radiation hardened technology and products in support of military, civil and commercial applications at IBM, Loral, Lockheed Martin and BAE Systems. He retired from IBM as a Sr. Technical Staff Member and from BAE Systems as Technical Director and Engineering Fellow. After retirement, he served as a Term Engineer at Vanderbilt University. He authored or co-authored over 100 publications and is credited with 26 inventions. He is recognized in Marquis Who’s Who in America, Who’s Who in Science and Engineering and Who’s Who in the World.

 

 

 

 

 

 


  Date and Time

  Location

  Hosts

  Registration


  • Date: 27 Apr 2017
  • Time: 06:00 PM to 08:30 PM
  • All times are (GMT-05:00) US/Eastern
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  • 1616 Anderson Rd.
  • McLean, Virginia
  • United States 22102
  • Building: TeqCorner
  • Room Number: Conference Center -- 3rd floor
  • Contact Event Host
  • Co-sponsored by EDS
  • Starts 30 March 2017 12:20 PM
  • Ends 27 April 2017 12:20 PM
  • All times are (GMT-05:00) US/Eastern
  • No Admission Charge

  Speakers

SPACE AND RADIATION EFFECTS ON SEMICONDUCTOR DEVICES

Topic:

SPACE AND RADIATION EFFECTS ON SEMICONDUCTOR DEVICES

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Agenda

Co-sponsored by EDS


 

In this talk, Nadim Haddad will review operational environments, the effect of various radiation sources on device operation and reliability, and approaches to mitigate radiation effects. 

Nadim will also discuss the effects of technology scaling, and unique mechanisms affecting scaled devices that were negligible in older technologies.