Safety of Information and Communication Technology Equipment Used in Smart Grid Applications

#Smart #Grid #Information #and #Communication #Technology #Safety
Share

Safety of Information and Communication Technology Equipment Used in Smart Grid Applications

 

Don Gies

Senior Product Compliance Engineer

Adjunct Professor - NJIT

ddgies@verizon.net

IEEE Senior Member

 

 

Abstract— This paper explores the merger of power utility circuits with that of the information and communication technology (ICT) equipment under the smart grid and the safety implications that this poses, and determines what is the maximum voltage that ICT equipment, designed in accordance with IEC 62368-1 can directly access power-grid circuits. 

Keywords— Smart Grid, information and communication technology, safety

 



  Date and Time

  Location

  Hosts

  Registration



  • Date: 26 Oct 2017
  • Time: 06:00 PM to 08:00 PM
  • All times are (GMT-05:00) US/Eastern
  • Add_To_Calendar_icon Add Event to Calendar
  • NJIT
  • Warren and Summit
  • Newark, New Jersey
  • United States 07102
  • Building: ECE Building
  • Room Number: Second Floor Conference Room (right of elevator)
  • Click here for Map

  • Contact Event Host
  • Russell C. Pepe, RCDD

    201-960-6796

  • Co-sponsored by IM09
  • Starts 10 October 2017 11:00 AM
  • Ends 26 October 2017 06:00 PM
  • All times are (GMT-05:00) US/Eastern
  • No Admission Charge


  Speakers

Don Gies

Topic:

Safety of Information and Communication Technology Equipment Used in Smart Grid Applications

Biography:

Don Gies is a senior product compliance engineer.

Since 1989, he has worked at  Nokia Bell Labs as a lead subject matter expert in global product safety compliance, working primarily with  wireless base station equipment. 

Mr. Gies is also an adjunct professor at New Jersey Institute of Technology (NJIT), Newark, New Jersey USA, teaching graduate-level courses, "Transients in Power Systems," and "Economic Control of Interconnected Power Systems."

Prior to working at Bell Labs, Mr. Gies was a TEMPEST engineer for Honeywell-Signal Analysis Center, where he worked on various secure communications projects for the US Army Communications -Electronics Command.

Mr. Gies graduated from Rutgers University - College of Engineering as an electrical engineer.

Mr. Gies is a senior member of the IEEE, a member of the Board of Governors of the IEEE Product Safety Engineering Society, and chairs the Telecom Safety Technical Committee.

Don Gies

Topic:

Safety of Information and Communication Technology Equipment Used in Smart Grid Applications

Biography:






Agenda

6:00 pm  pizza and soda

6:30pm  Talk