BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:US/Pacific BEGIN:DAYLIGHT DTSTART:20170312T030000 TZOFFSETFROM:-0800 TZOFFSETTO:-0700 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:PDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20171105T010000 TZOFFSETFROM:-0700 TZOFFSETTO:-0800 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:PST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20171218T061748Z UID:F424483B-E5B6-11E7-833E-0050568D7F66 DTSTART;TZID=US/Pacific:20170801T190000 DTEND;TZID=US/Pacific:20170801T203000 DESCRIPTION:Abstract\n\nThe anomalous Hall effect (AHE) is one of the oldes t and most prominent transport phenomena in magnetic materials. However\, the microscopic mechanism of the AHE has remained unresolved for more than a century because its rich phenomenology defies standard classification\, prompting conflicting claims of the dominant processess. We differentiate these processes through temperature-dependent measurements on epitaxial F e\, Ni\, Co\, and NixCu1-x films of varying thickness [1]\, [2]. The resul ts allow an unambiguous identification of both intrinsic and extrinsic mec hanisms of the anomalous Hall effect. The more recently discovered spin Ha ll effect (SHE) has attracted a great deal of attention because of its pot ential applications in spin current devices. Various methods have been dev eloped to generate and detect the SHE and search for materials with large spin Hall angles. These efforts notwithstanding\, reliable and accurate de termination of spin Hall angle remains a challenge. In this lecture I will first give a comprehensive discussion on the basic concepts of AHE and SH E. Expoliting the attributes of epitaxial magnetic thin films\, I will the n explain how to control independenly the different scattering processes t hrough temperature and layer thickness and to identifiy unambiguously the intrinsic and extrinsic mechanisms of the AHE. Finally\, based on the unde rstanding of the microscopic mechanisms of the AHE\, I will describe how w e developed a new method using H-patterned films to measure quantities inh erent in the SHE.\n\n[1] Y. Tian\, L. Ye\, and X\, Jin\, “Proper scaling of the anomalous Hall effect\,” Phys. Rev. Lett. 103\, 087206 (2009)\, doi : 10.1103/PhysRevLett.103.087206.\n\n[2] D.-Z. Hou\, G. Su\, Y. Tian\, X. Jin\, S. A. Yang\, and Q. Niu\, Phys. Rev. Lett. 114\, 217203 (2015)\, doi: 10.1103/PhysRevLett.114.217203.\n\nBiography\n\nXiaofeng Jin receive d the B.S. and Ph.D. degrees in physics from Fudan University in 1983 and 1989\, respectively. Concurrently\, he was at Laboratoire pour l’Utilisa tion du Rayonnement Electromagnetique (LURE) in Orsay\, France\, from June 1987 to May 1988. He joined the faculty at the Department of Physics\, Fu dan University\, in 1989\, and became full professor in 1995. He has been a visiting scholar at many research institutes including University of Cal ifornia\, Berkeley\; Chalmers University of Technology\, Goteborg\; Max-Pl anck Institute for Microstructure\, Halle\; University of Utah\; Institute for Materials Research\, Tohoku University\, Sendai\; and Hong Kong Unive rsity of Science and Technology. He has published over 100 technical artic les in peer-reviewed journals\, including book chapters and review article s\, and has given more than 50 invited presentations at international conf erences. He served as the chair of the 21st International Colloquium on Ma gnetic Films and Surfaces (ICMFS) in 2012 and on the advisary committes an d program committees of various international conferences on magnetism and spintronics. He is currently the chair of the International Union of Pure and Applied Physics (IUPAP) Magnetism Commission C9. He is a member of th e IEEE Magnetics Society.\n\nSan Jose\, Unknown\, United States LOCATION:San Jose\, Unknown\, United States ORGANIZER:zhaoqiang.bai@gmail.com SEQUENCE:0 SUMMARY:[Legacy Report] The Hall Effects Edwin Hall Never Imagined URL;VALUE=URI:https://events.vtools.ieee.org/m/155369 X-ALT-DESC:Description: <br /><p style="font-weight: 400\;"><strong>Abstrac t</strong></p>\n<p style="font-weight: 400\;"><strong>&nbsp\;</strong></p> \n<p style="font-weight: 400\;">The anomalous Hall effect (AHE) is one of the oldest and most prominent transport phenomena in magnetic materials. H owever\, the microscopic mechanism of the AHE has remained unresolved for more than a century because its rich phenomenology defies standard classif ication\, prompting conflicting claims of the dominant processess. We diff erentiate these processes through temperature-dependent measurements on ep itaxial Fe\, Ni\, Co\, and NixCu1-x films of varying thickness [1]\, [2]. The results allow an unambiguous identification of both intrinsic and extr insic mechanisms of the anomalous Hall effect. The more recently discovere d spin Hall effect (SHE) has attracted a great deal of attention because o f its potential applications in spin current devices. Various methods have been developed to generate and detect the SHE and search for materials wi th large spin Hall angles. These efforts notwithstanding\, reliable and ac curate determination of spin Hall angle remains a challenge. In this lectu re I will first give a comprehensive discussion on the basic concepts of A HE and SHE. Expoliting the attributes of epitaxial magnetic thin films\, I will then explain how to control independenly the different scattering pr ocesses through temperature and layer thickness and to identifiy unambiguo usly the intrinsic and extrinsic mechanisms of the AHE. Finally\, based on the understanding of the microscopic mechanisms of the AHE\, I will descr ibe how we developed a new method using H-patterned films to measure quant ities inherent in the SHE.</p>\n<p>[1] Y. Tian\, L. Ye\, and X\, Jin\, &ld quo\;Proper scaling of the anomalous Hall effect\,&rdquo\; Phys. Rev. Lett . 103\, 087206 (2009)\, doi : 10.1103/PhysRevLett.103.087206.</p>\n<p>[2] D.-Z. Hou\, G. Su\, Y. Tian\, X. Jin\, S. A. Yang\, and Q. Niu\, Phys. Rev . Lett. 114\, 217203 (2015)\, doi: 10.1103/PhysRevLett.114.217203.</p>\n<p >&nbsp\;</p>\n<p>&nbsp\;</p>\n<p>&nbsp\;</p>\n<p><strong>Biography</strong ></p>\n<p><strong>&nbsp\;</strong></p>\n<p>Xiaofeng Jin received the B.S. and Ph.D. degrees in physics from Fudan University in 1983 and 1989\, resp ectively. Concurrently\, he was at Laboratoire pour l&rsquo\;Utilisation d u Rayonnement Electromagnetique (LURE) in Orsay\, France\, from June 1987 to May 1988. He joined the faculty at the Department of Physics\, Fudan Un iversity\, in 1989\, and became full professor in 1995. He has been a visi ting scholar at many research institutes including University of Californi a\, Berkeley\; Chalmers University of Technology\, Goteborg\; Max-Planck I nstitute for Microstructure\, Halle\; University of Utah\; Institute for M aterials Research\, Tohoku University\, Sendai\; and Hong Kong University of Science and Technology. He has published over 100 technical articles in peer-reviewed journals\, including book chapters and review articles\, an d has given more than 50 invited presentations at international conference s. He served as the chair of the 21st International Colloquium on Magnetic Films and Surfaces (ICMFS) in 2012 and on the advisary committes and prog ram committees of various international conferences on magnetism and spint ronics. He is currently the chair of the International Union of Pure and A pplied Physics (IUPAP) Magnetism Commission C9. He is a member of the IEEE Magnetics Society.</p> END:VEVENT END:VCALENDAR