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DTSTART:20190310T030000
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DTSTAMP:20181216T195841Z
UID:8B95970D-0108-4821-B553-5507A13EDA92
DTSTART;TZID=US/Eastern:20181214T080000
DTEND;TZID=US/Eastern:20181214T140000
DESCRIPTION:Part 1-A: Power Quality Metering Basics\n\n- Power quality defi
 nitions sags\, swells\, transients\n- What is Power Quality\n- Poor Power 
 Quality – what is it to you?\n- Key measurement points Power Energy and 
 Demand\n- Power quality terms used in the power industry\n- Power Quality 
 terms to avoid\n- Power quality facts and trends\n- What are voltage distu
 rbances\n- Common Power Quality Waveform Signatures such as Voltage Sags\,
  Momentary Interruptions\, Voltage Swells\n- PQ Parameters and PQ disturba
 nces\n- PQ Parameters to be recorded\n- PQ Disturbances briefly defined\n-
  PQ Disturbances – Causes\n- What are Harmonics\n- Where to Harmonics co
 me from?\n- Available power quality technology for the commercial and indu
 strial building industry\n\nPart 1-B: New Innovations for Electrical Power
  Management System (EPMS) and ASHRAE 90.1 8.4.3 Compliance\n\nAs the requi
 rement for power monitoring increases throughout the industry\, more “sm
 art technology” is required to record and transmit this information. We 
 will discuss the latest advancements in EPMS systems and products to meet 
 this need.\n\nTopics will include:\n\n- Power monitoring and controls\n- C
 yber security considerations\n- Embedded metering versus individual meteri
 ng\n- A demonstration of embedded metering with project examples\n- Networ
 king requirements\n- How to meet the needs of the EPMIS systems\n\nPart 2:
  To Switch or Not To Switch…Key approaches to meet NEC 240.87 for Arc Fl
 ash Protection\n\nPart 2-A: Tools you can use to select and implement redu
 ction of Arc-Flash\n\n- A better understanding of the intent of NEC 240.87
 \n- Arc-flash Mediation Techniques &amp; Tools\n- Determine cost effective met
 hods that comply\n- New options for the latest 2017 Code\n- How to calcula
 te Incident Energy\n- Arc-Current vs Available Fault Current\n- Time-Curve
  Software and Calculators\n\nPart 2 -B: How to Apply Zone Selective Interl
 ocking (ZSI)\n\n- How to Rely on ZSI\n- Applying ZSI to Arc-Reduction and 
 Selective Coordination circuit\n- ZSI Interconnections\n- Comparisons of Z
 SI functions with Time Current Curves\n- Understanding the fault protectio
 n sequences of ZSI\n- Code Compliance with ZSI\n- Cost Impact\n\nCo-sponso
 red by: Ken Oexle\n\nSpeaker(s): Matthew Strong\, Robert W. Jensen P.E.\n\
 nAgenda: \nThe seminar fee includes lunch\, refreshments and handouts. Non
 -members joining IEEE within 30 days of the seminar will be rebated 50% of
  the IEEE registration charge.\n\nFour hours of instruction will be provid
 ed. If desired\, IEEE Continuing Education Units (0.4 CEUs) will be offere
 d for this course - a small fee of $45 will be required for processing.\n\
 nPlease pay attention to the “Registration Fee” and choose the appropr
 iate choice either with or without CEUs.\n\nRoom: Auditorium\, Bldg: Hadle
 y Road Facility\, 4000 Hadley Road\, South Plainfield\, New Jersey\, Unite
 d States\, 07080
LOCATION:Room: Auditorium\, Bldg: Hadley Road Facility\, 4000 Hadley Road\,
  South Plainfield\, New Jersey\, United States\, 07080
ORGANIZER:RWQuade@ieee.org
SEQUENCE:1
SUMMARY:Power Monitoring and Arc-Flash reduction with regards to NEC 240.87
URL;VALUE=URI:https://events.vtools.ieee.org/m/184473
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;strong&gt;Part 1-A: Power Quality Metering B
 asics&lt;/strong&gt;&lt;/p&gt;\n&lt;ul&gt;\n&lt;li&gt;Power quality definitions sags\, swells\, tr
 ansients&lt;/li&gt;\n&lt;li&gt;What is Power Quality&lt;/li&gt;\n&lt;li&gt;Poor Power Quality &amp;nda
 sh\; what is it to you?&lt;/li&gt;\n&lt;li&gt;Key measurement points Power Energy and 
 Demand&lt;/li&gt;\n&lt;li&gt;Power quality terms used in the power industry&lt;/li&gt;\n&lt;li&gt;
 Power Quality terms to avoid&lt;/li&gt;\n&lt;li&gt;Power quality facts and trends&lt;/li&gt;
 \n&lt;li&gt;What are voltage disturbances&lt;/li&gt;\n&lt;li&gt;Common Power Quality Wavefor
 m Signatures such as Voltage Sags\, Momentary Interruptions\, Voltage Swel
 ls&lt;/li&gt;\n&lt;li&gt;PQ Parameters and PQ disturbances&lt;/li&gt;\n&lt;li&gt;PQ Parameters to 
 be recorded&lt;/li&gt;\n&lt;li&gt;PQ Disturbances briefly defined&lt;/li&gt;\n&lt;li&gt;PQ Disturb
 ances &amp;ndash\; Causes&lt;/li&gt;\n&lt;li&gt;What are Harmonics&lt;/li&gt;\n&lt;li&gt;Where to Harm
 onics come from?&lt;/li&gt;\n&lt;li&gt;Available power quality technology for the comm
 ercial and industrial building industry&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p&gt;&lt;strong&gt;Part 1-B:&amp;
 nbsp\; New Innovations for Electrical Power Management System (EPMS) and A
 SHRAE 90.1 8.4.3 Compliance&lt;/strong&gt;&lt;/p&gt;\n&lt;p&gt;As the requirement for power 
 monitoring increases throughout the industry\, more &amp;ldquo\;smart technolo
 gy&amp;rdquo\; is required to record and transmit this information.&amp;nbsp\; We 
 will discuss the latest advancements in EPMS systems and products to meet 
 this need.&lt;/p&gt;\n&lt;p&gt;Topics will include:&lt;/p&gt;\n&lt;ul&gt;\n&lt;li&gt;Power monitoring an
 d controls&lt;/li&gt;\n&lt;li&gt;Cyber security considerations&lt;/li&gt;\n&lt;li&gt;Embedded mete
 ring versus individual metering&lt;/li&gt;\n&lt;li&gt;A demonstration of embedded mete
 ring with project examples&lt;/li&gt;\n&lt;li&gt;Networking requirements&lt;/li&gt;\n&lt;li&gt;How
  to meet the needs of the EPMIS systems&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p&gt;&lt;strong&gt;&amp;nbsp\;&lt;/s
 trong&gt;&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;Part 2: To Switch or Not To Switch&amp;hellip\;Key appr
 oaches to meet NEC 240.87 for Arc Flash Protection&lt;/strong&gt;&lt;/p&gt;\n&lt;p&gt;&lt;stron
 g&gt;Part 2-A: Tools you can use to select and implement reduction of Arc-Fla
 sh&lt;/strong&gt;&lt;/p&gt;\n&lt;ul&gt;\n&lt;li&gt;A better understanding of the intent of NEC 240
 .87&lt;/li&gt;\n&lt;li&gt;Arc-flash Mediation Techniques &amp;amp\; Tools&lt;/li&gt;\n&lt;li&gt;Determ
 ine cost effective methods that comply&lt;/li&gt;\n&lt;li&gt;New options for the lates
 t 2017 Code&lt;/li&gt;\n&lt;li&gt;How to calculate Incident Energy&lt;/li&gt;\n&lt;li&gt;Arc-Curre
 nt vs Available Fault Current&lt;/li&gt;\n&lt;li&gt;Time-Curve Software and Calculator
 s&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;&amp;nbsp\;Part 2 -B: How to Apply Z
 one Selective Interlocking (ZSI)&lt;/strong&gt;&lt;/p&gt;\n&lt;ul&gt;\n&lt;li&gt;How to Rely on ZS
 I&lt;/li&gt;\n&lt;li&gt;Applying ZSI to Arc-Reduction and Selective Coordination circu
 it&lt;/li&gt;\n&lt;li&gt;ZSI Interconnections&lt;/li&gt;\n&lt;li&gt;Comparisons of ZSI functions w
 ith Time Current Curves&lt;/li&gt;\n&lt;li&gt;Understanding the fault protection seque
 nces of ZSI&lt;/li&gt;\n&lt;li&gt;Code Compliance with ZSI&lt;/li&gt;\n&lt;li&gt;Cost Impact&lt;/li&gt;\
 n&lt;/ul&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;The seminar fee includes lunch\, refres
 hments and handouts.&amp;nbsp\; Non-members joining IEEE within 30 days of the
  seminar will be rebated 50% of the IEEE registration charge.&lt;/p&gt;\n&lt;p&gt;Four
  hours of instruction will be provided.&amp;nbsp\; If desired\, IEEE Continuin
 g Education Units (0.4 CEUs) will be offered for this course - a small fee
  of $45 will be required for processing.&lt;/p&gt;\n&lt;p&gt;Please pay attention to t
 he &amp;ldquo\;Registration Fee&amp;rdquo\; and choose the appropriate choice eith
 er with or without CEUs.&lt;/p&gt;
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