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DTSTART:20190310T030000
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BEGIN:VEVENT
DTSTAMP:20191231T073120Z
UID:6A3BA955-7754-492E-AB2F-46BDA63314E9
DTSTART;TZID=US/Mountain:20190208T110000
DTEND;TZID=US/Mountain:20190208T121500
DESCRIPTION:New generations of electronic and photonic devices are emerging
  that leverage the novel properties of low-dimensional and nanoscale mater
 ials. However\, the successful application of such systems will require a 
 detailed understanding of the interplay between the nanoscale structure an
 d the associated electronic and optical properties. Scanning microwave mic
 roscopy (SMM) provides a powerful tool to study nanoscale electronic and m
 agnetic properties in situ and non-destructively by directly probing local
  permittivity\, conductivity and permeability variations with nanometer sp
 atial resolution. In the talk we will discuss our work studying variations
  in properties in low-dimensional and thin film materials.\n\nCo-sponsored
  by: UCCS\n\nSpeaker(s): Pavel Kabos\, \n\nRoom: A204\, Bldg: Osborne\, 14
 20 Austin Bluffs Parkway\, Colorado Springs\, Colorado\, United States\, 8
 0918
LOCATION:Room: A204\, Bldg: Osborne\, 1420 Austin Bluffs Parkway\, Colorado
  Springs\, Colorado\, United States\, 80918
ORGANIZER:zcelinsk@uccs.edu
SEQUENCE:0
SUMMARY:Microwave Microscopy of Micro/Nanoscale Material Properties
URL;VALUE=URI:https://events.vtools.ieee.org/m/216660
X-ALT-DESC:Description: <br /><p><span style="font-size: 12.0pt\;">New gene
 rations of electronic and photonic devices are emerging that leverage the 
 novel properties of low-dimensional and nanoscale materials. However\, the
  successful application of such systems will require a detailed understand
 ing of the interplay between the nanoscale structure and the associated el
 ectronic and optical properties. Scanning microwave microscopy (SMM) provi
 des a powerful tool to study nanoscale electronic and magnetic properties 
 in situ and non-destructively by directly probing local permittivity\, con
 ductivity and permeability variations with nanometer spatial resolution. I
 n the talk we will discuss our work studying variations in properties in l
 ow-dimensional and thin film materials.</span></p>\n<p><span style="font-s
 ize: 12.0pt\;">&nbsp\;</span></p>
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