BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:Canada/Eastern
BEGIN:DAYLIGHT
DTSTART:20200308T030000
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
TZNAME:EDT
END:DAYLIGHT
BEGIN:STANDARD
DTSTART:20201101T010000
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11
TZNAME:EST
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20210201T033625Z
UID:134BDDF2-DF49-4ED5-97C1-978E31F913E0
DTSTART;TZID=Canada/Eastern:20200610T143000
DTEND;TZID=Canada/Eastern:20200610T160000
DESCRIPTION:-\n\n-\n\n---  Accelerating 5G Design Innovation Through Simula
 tion -End User Equipment / Base Station-\n\n5G connectivity is the next te
 chnological revolution. This pervasive\, ultrafast compute network will co
 nnect billions of devices with data on-demand. It will drive economic expa
 nsion in many sectors\, spawn new products and services\, and transform ou
 r lives as we know it. Yet\, before 5G can deliver on its promises and qua
 lity of service (QoS) metrics\, wireless systems designers and engineers m
 ust overcome sizable challenges.\n\nAnsys 5G simulation solutions empower 
 these individuals to solve the complexities impeding device\, network and 
 data center design. Ansys 5G simulation solutions provide electromagnetics
 \, semiconductor\, electronics cooling and mechanical analysis tools to ac
 curately simulate 5G radio and related technologies. The multi-solution pl
 atform leverages high-performance computing that can be deployed across th
 e enterprise\, allowing designers and engineering experts to collaborate m
 ore effectively.\n\nThis seminar will highlight the following 5G engineeri
 ng challenges:\n\n· End User Equipment\n\no multi-frequency band antenna 
 integration\n\no modeling of mm-wave array antennas\n\no RFI\, EMI &amp; Desen
 se Mitigation\n\n· Base-Station Antenna Modeling\n\no Full Communication 
 Analysis in Electrically Large &amp; Complex Environment\n\no RFI\, Data Cover
 age &amp; ElectroThermal Reliability\n\nPlease use the link in the registratio
 n section to sign up for the event.\n\nTo join event use the following [li
 nk.](https://ansys.webex.com/webappng/sites/ansys/meeting/info/4dca9f58740
 94676841d259ebae7022b?siteurl=ansys&amp;MTID=m9f1ef753069988c46c6082218ec821bc
 )\n\nCo-sponsored by: ANSYS Inc.\n\nSpeaker(s): Laila Salman \, \n\nWebEx 
 Webinar \, Ottawa\, Ontario\, Canada
LOCATION:WebEx Webinar \, Ottawa\, Ontario\, Canada
ORGANIZER:marwen.benrejeb@ieee.org
SEQUENCE:30
SUMMARY:Accelerating 5G Design Innovation Through Simulation
URL;VALUE=URI:https://events.vtools.ieee.org/m/231928
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;sp
 an style=&quot;font-size: 12pt\; color: #ffffff\;&quot;&gt;&lt;span class=&quot;m_-366764601891
 485765normaltextrun&quot;&gt;&lt;strong&gt;-&lt;/strong&gt;&lt;/span&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-36
 6764601891485765paragraph&quot;&gt;&lt;span style=&quot;font-size: 12pt\; color: #ffffff\;
 &quot;&gt;&lt;span class=&quot;m_-366764601891485765normaltextrun&quot;&gt;&lt;strong&gt;-&lt;/strong&gt;&lt;/spa
 n&gt;&lt;/span&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;span style=&quot;font
 -size: 12pt\; color: #ffffff\;&quot;&gt;&lt;span class=&quot;m_-366764601891485765normalte
 xtrun&quot;&gt;&lt;strong&gt;--&lt;/strong&gt;&lt;/span&gt;&lt;/span&gt;&lt;span style=&quot;font-size: 12pt\;&quot;&gt;&lt;s
 pan class=&quot;m_-366764601891485765normaltextrun&quot;&gt;&lt;strong&gt;&lt;span style=&quot;color:
  #ffffff\;&quot;&gt;-&amp;nbsp\;&lt;/span&gt;&amp;nbsp\; &amp;nbsp\; &amp;nbsp\; &amp;nbsp\; &amp;nbsp\; &amp;nbsp\;
  &amp;nbsp\;Accelerating 5G Design Innovation Through Simulation&amp;nbsp\;-End Us
 er Equipment / Base Station-&lt;/strong&gt;&lt;/span&gt;&lt;span class=&quot;m_-36676460189148
 5765eop&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;/span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-36676460189
 1485765paragraph&quot;&gt;&lt;span class=&quot;m_-366764601891485765normaltextrun&quot;&gt;5G conn
 ectivity is the next technological revolution. This pervasive\, ultrafast 
 compute network will connect billions of devices with data on-demand. It w
 ill drive economic expansion in many sectors\, spawn new products and serv
 ices\, and transform our lives as we know it.&amp;nbsp\;Yet\, before 5G can de
 liver on its promises and quality of service (QoS) metrics\, wireless syst
 ems designers and engineers must overcome sizable challenges.&amp;nbsp\;&lt;/span
 &gt;&lt;span class=&quot;m_-366764601891485765eop&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n
 &lt;p class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;span class=&quot;m_-3667646018914857
 65normaltextrun&quot;&gt;Ansys 5G simulation solutions empower these individuals t
 o solve the complexities impeding device\, network and data center design.
 &amp;nbsp\;Ansys 5G simulation solutions provide electromagnetics\, semiconduc
 tor\, electronics cooling and mechanical analysis tools to accurately simu
 late 5G radio and related technologies. The multi-solution platform levera
 ges high-performance computing that can be deployed across the enterprise\
 , allowing designers and engineering experts to collaborate more effective
 ly.&lt;/span&gt;&lt;span class=&quot;m_-366764601891485765eop&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;
 /u&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;span class=&quot;m_-3667646
 01891485765normaltextrun&quot;&gt;This seminar will highlight the following 5G eng
 ineering challenges:&lt;/span&gt;&lt;span class=&quot;m_-366764601891485765eop&quot;&gt;&amp;nbsp\;&lt;
 /span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;u&gt;&lt;/u
 &gt;&amp;middot\;&amp;nbsp\;&amp;nbsp\;&lt;span class=&quot;m_-366764601891485765normaltextrun&quot;&gt;E
 nd User Equipment&amp;nbsp\;&lt;/span&gt;&lt;span class=&quot;m_-366764601891485765eop&quot;&gt;&amp;nbs
 p\;&lt;/span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;u
 &gt;&lt;/u&gt;&amp;nbsp\; &amp;nbsp\; o&amp;nbsp\;&amp;nbsp\;&lt;span class=&quot;m_-366764601891485765norm
 altextrun&quot;&gt;multi-frequency band antenna integration&lt;/span&gt;&lt;span class=&quot;m_-
 366764601891485765eop&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-3667
 64601891485765paragraph&quot;&gt;&lt;u&gt;&lt;/u&gt;&amp;nbsp\; &amp;nbsp\; o&amp;nbsp\;&amp;nbsp\;&amp;nbsp\;&lt;u&gt;&lt;
 /u&gt;&lt;span class=&quot;m_-366764601891485765normaltextrun&quot;&gt;modeling of mm-wave ar
 ray antennas&amp;nbsp\;&lt;/span&gt;&lt;span class=&quot;m_-366764601891485765eop&quot;&gt;&amp;nbsp\;&lt;/
 span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;u&gt;&lt;/u&gt;
 &amp;nbsp\; &amp;nbsp\; o&amp;nbsp\;&amp;nbsp\;&amp;nbsp\;&lt;u&gt;&lt;/u&gt;&lt;span class=&quot;m_-3667646018914
 85765normaltextrun&quot;&gt;RFI\, EMI &amp;amp\; Desense Mitigation&lt;/span&gt;&lt;span class=
 &quot;m_-366764601891485765eop&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-
 366764601891485765paragraph&quot;&gt;&lt;u&gt;&lt;/u&gt;&amp;middot\;&amp;nbsp\;&amp;nbsp\;&lt;span class=&quot;m_
 -366764601891485765normaltextrun&quot;&gt;Base-Station Antenna Modeling&lt;/span&gt;&lt;spa
 n class=&quot;m_-366764601891485765eop&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n&lt;p cl
 ass=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;u&gt;&lt;/u&gt;&amp;nbsp\; &amp;nbsp\; o &amp;nbsp\;&lt;span
  class=&quot;m_-366764601891485765normaltextrun&quot;&gt;Full Communication Analysis in
  Electrically Large &amp;amp\; Complex Environment&lt;/span&gt;&lt;span class=&quot;m_-36676
 4601891485765eop&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-366764601
 891485765paragraph&quot;&gt;&lt;u&gt;&lt;/u&gt;&amp;nbsp\; &amp;nbsp\; o &amp;nbsp\;&lt;span class=&quot;m_-366764
 601891485765normaltextrun&quot;&gt;RFI\, Data Coverage &amp;amp\;&amp;nbsp\;ElectroThermal
 &amp;nbsp\;Reliability&lt;/span&gt;&lt;span class=&quot;m_-366764601891485765eop&quot;&gt;&amp;nbsp\;&lt;/s
 pan&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;span cl
 ass=&quot;m_-366764601891485765eop&quot;&gt;&amp;nbsp\;&lt;/span&gt;&lt;u&gt;&lt;/u&gt;&lt;u&gt;&lt;/u&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p
  class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;span class=&quot;m_-366764601891485765
 normaltextrun&quot;&gt;Please use the link in the registration section to &lt;span st
 yle=&quot;text-decoration: underline\;&quot;&gt;sign up&lt;/span&gt;&amp;nbsp\;for the event.&lt;/sp
 an&gt;&lt;/p&gt;\n&lt;p class=&quot;m_-366764601891485765paragraph&quot;&gt;&lt;strong&gt;&lt;span style=&quot;te
 xt-decoration: underline\;&quot;&gt;&lt;span class=&quot;m_-366764601891485765normaltextru
 n&quot;&gt;To join event use the following &lt;a href=&quot;https://ansys.webex.com/webapp
 ng/sites/ansys/meeting/info/4dca9f5874094676841d259ebae7022b?siteurl=ansys
 &amp;amp\;MTID=m9f1ef753069988c46c6082218ec821bc&quot;&gt;link.&lt;/a&gt;&lt;/span&gt;&lt;/span&gt;&lt;/str
 ong&gt;&lt;/p&gt;
END:VEVENT
END:VCALENDAR

