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DTSTAMP:20200811T170945Z
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DTSTART;TZID=America/Los_Angeles:20200811T090000
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DESCRIPTION:Dr. Jon Martens\n\nCurrent microwave and high frequency instrum
 entation perform many tasks behind the scenes\, even more so in the mm-wav
 e and high modulation rate regimes\, and it is easy to lose track of how t
 he equipment\, the processing algorithms\, the setup and the signals are i
 nteracting. By exploring the measurement mechanics within some common inst
 ruments under practical conditions\, it may be easier to understand where 
 sensitivities or anomalies might increase and how to mitigate them. Throug
 h a study of example architectures and measurements\, including those in t
 he 100+ GHz range and those with wide modulation bandwidths where linearit
 y\, dynamic range and other physical metrics are stressed even more\, mech
 anisms and ideas for better measurements will be explored.\n\nCo-sponsored
  by: MTT-S AdCom MGA Committee\n\nSpeaker(s): Jon Martens\, \n\nAgenda: \n
 Virtual DML Presentation\n\nPresentation is August 11th\, actual time is n
 ot announced yet.\n\nRegistration Link will be provided on this webpage pr
 ior to the event: https://mtt.org/mtt-s-webinars-2020/\n\nMTT-S members wi
 ll receive an email from Naylor with a "Register now!" link. MTT-S hired N
 aylor Association Solutions to sell advertisements for Microwave Magazine\
 , MTT-S Newsletter\, MTT-S Webinars and other publications and events of t
 he Microwave Theory and Techniques Society.\n\nSherman Oaks\, California\,
  United States
LOCATION:Sherman Oaks\, California\, United States
ORGANIZER:j.c.weiler@ieee.org
SEQUENCE:5
SUMMARY:What is my Measurement Equipment Actually Doing? Implications for 5
 G
URL;VALUE=URI:https://events.vtools.ieee.org/m/235400
X-ALT-DESC:Description: <br /><p>&nbsp\;Dr. Jon Martens</p>\n<p>Current mic
 rowave and high frequency instrumentation perform many tasks behind the sc
 enes\, even more so in the mm-wave and high modulation rate regimes\, and 
 it is easy to lose track of how the equipment\, the processing algorithms\
 , the setup and the signals are interacting.&nbsp\; By exploring the measu
 rement mechanics within some common instruments under practical conditions
 \, it may be easier to understand where sensitivities or anomalies might i
 ncrease and how to mitigate them.&nbsp\;&nbsp\; Through a study of example
  architectures and measurements\, including those in the 100+ GHz range an
 d those with wide modulation bandwidths where linearity\, dynamic range an
 d other physical metrics are stressed even more\, mechanisms and ideas for
  better measurements will be explored.</p><br /><br />Agenda: <br /><p>Vir
 tual DML Presentation</p>\n<p>Presentation is August 11th\, actual time is
  not announced yet.</p>\n<p>Registration Link will be provided on this web
 page prior to the event:&nbsp\;&nbsp\;<a href="https://mtt.org/mtt-s-webin
 ars-2020/">https://mtt.org/mtt-s-webinars-2020/</a>&nbsp\;</p>\n<p>MTT-S m
 embers will receive an email from Naylor with a "Register now!" link.&nbsp
 \; MTT-S hired Naylor Association Solutions to sell advertisements for Mic
 rowave Magazine\, MTT-S Newsletter\, MTT-S Webinars and other publications
  and events of the Microwave Theory and Techniques Society.</p>
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