BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:US/Eastern BEGIN:DAYLIGHT DTSTART:20200308T030000 TZOFFSETFROM:-0500 TZOFFSETTO:-0400 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:EDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20201101T010000 TZOFFSETFROM:-0400 TZOFFSETTO:-0500 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:EST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20200918T182302Z UID:1251D77D-9FA4-43B8-B19D-2A48CF425953 DTSTART;TZID=US/Eastern:20200811T160000 DTEND;TZID=US/Eastern:20200811T170000 DESCRIPTION:FREE Webinar w/ Q&A and Video Demonstration\n\nThe NE ESDA Chap ter\, in conjunction with IEEE Boston Reliability\, iMAPS New England\, an d Boston SMTA offer this webinar to share a new\, inexpensive method to va lidate EMC/ESD robustness.\n\nSince the introduction of the Field Collapse Event (FCE: Dunnihoo\, Tamminen\, Viheriäkoski 2015) testing improvement s over Charged Board Events (CBE)\, Pragma Design has continued to apply a nd adapt this methodology to other ESD/EOS/EMC domains. While high-voltage referenced CBE is a real and distinct ESD aggressor in manufacturing and in the field\, FCE methods allow functional and powered testing with simil ar real-world pulses while the system under test remains at a safe ground potential. Combining this new method together with fully automated near fi eld scanning equipment to construct E- and H-field information of a system during transient ESD events is described. This inexpensive method provide s an alternative way for system designers to validate and analyze the EMC/ ESD robustness of electronic systems without TLP pulsers\, IEC61000-4-2 gu ns\, or precision inductive current probes.\n\nCo-sponsored by: NE ESDA Ch apter\, iMAPS New England\, and Boston SMTA \n\nSpeaker(s): Jeffrey Dunnih oo\, \n\nAgenda: \n4:00 PM Technical Presentation\, Video Demonstration\, and Q&A\n\n5:00 PM Adjournment\n\nWebinar\, Massachusetts\, United States\ , Virtual: https://events.vtools.ieee.org/m/237298 LOCATION:Webinar\, Massachusetts\, United States\, Virtual: https://events. vtools.ieee.org/m/237298 ORGANIZER:michael.bannan@ieee.org SEQUENCE:6 SUMMARY:Webinar - NEAR FIELD EMC SCANNING METHOD BASED ON AN E-FIELD COLLAP SE URL;VALUE=URI:https://events.vtools.ieee.org/m/237298 X-ALT-DESC:Description: <br /><p align="LEFT">&nbsp\;</p>\n<p><strong><span style="font-size: medium\;">FREE Webinar w/ Q&amp\;A and Video Demonstrat ion </span></strong></p>\n<p>The NE ESDA Chapter\, in conjunction with IEE E Boston Reliability\, iMAPS New England\, and Boston SMTA offer this webi nar to share a new\, inexpensive method to validate EMC/ESD robustness.</p >\n<p>Since the introduction of the Field Collapse Event (FCE: Dunnihoo\, Tamminen\, Viheri&auml\;koski 2015) testing improvements over Charged Boar d Events (CBE)\, Pragma Design has continued to apply and adapt this metho dology to other ESD/EOS/EMC domains. While high-voltage referenced CBE is a real and distinct ESD aggressor in manufacturing and in the field\, FCE methods allow functional and powered testing with similar real-world pulse s while the system under test remains at a safe ground potential. Combinin g this new method together with fully automated near field scanning equipm ent to construct E- and H-field information of a system during transient E SD events is described. This inexpensive method provides an alternative wa y for system designers to validate and analyze the EMC/ESD robustness of e lectronic systems without TLP pulsers\, IEC61000-4-2 guns\, or precision i nductive current probes.</p><br /><br />Agenda: <br /><p><strong>4:00 PM</ strong>&nbsp\;&nbsp\;&nbsp\;Technical Presentation\, Video Demonstration\, &nbsp\;and Q&amp\;A</p>\n<p><strong>5:00 PM</strong>&nbsp\;&nbsp\;&nbsp\;A djournment</p> END:VEVENT END:VCALENDAR