BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:US/Eastern BEGIN:DAYLIGHT DTSTART:20200308T030000 TZOFFSETFROM:-0500 TZOFFSETTO:-0400 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:EDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20201101T010000 TZOFFSETFROM:-0400 TZOFFSETTO:-0500 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:EST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20210120T214929Z UID:E779FAA2-AC8B-433B-8060-34737A43D327 DTSTART;TZID=US/Eastern:20201008T183000 DTEND;TZID=US/Eastern:20201008T203000 DESCRIPTION:IEEEBuffalo Section joint with the Microwave Theory and Techniq ues and Antennas and Propagation Societies invite you to attend a virtual presentation:\n\nTopic: WHAT IS MY MEASUREMENT EQUIPMENT ACTUALLY DOING? I MPLICATIONS FOR 5G.\n\nCurrent microwave and high frequency instrumentatio n perform many tasks behind the scenes\, even more so in the mm-wave and h igh modulation rate regimes\, and it is easy to lose track of how the equi pment\, the processing algorithms\, the setup and the signals are interact ing. By exploring the measurement mechanics within some common instruments under practical conditions\, it may be easier to understand where sensiti vities or anomalies might increase and how to mitigate them. Through a stu dy of example architectures and measurements\, including those in the 100+ GHz range and those with wide modulation bandwidths where linearity\, dyn amic range and other physical metrics are stressed even more\, mechanisms and ideas for better measurements will be explored.\n\nSpeaker is Jon Mart ens\n\nJon Martens (M’91 – S’10) received the BSEE\, MSEE and Ph.D. in Electrical Engineering from the University of Wisconsin in 1986\, 1988 and 1990\, respectively. Since 1995\, he has been with Anritsu where he is currently an Engineering Fellow. His research interests include measureme nt system architectures\, millimeter-wave circuit and system design\, and a wide range of microwave measurement processes to include materials analy sis\, nonlinear and quasi-linear characterization\, optical interactions a nd calibration. He is the inventor or co-inventor on over 17 patents\, has (co-)authored several book chapters and over 50 technical publications. D r. Martens is a past chair of the MTT measurements technical subcommittee and is a past president of the measurements society ARFTG and is still act ive in both. He is a member of the technical program subcommittees for the International Microwave Symposium and ARFTG and is a former associate edi tor for the Transactions on Microwave Theory and Techniques.\n\nPlease joi n us via WebEx\n\nThursday\, October 8\, 2020 6:30 pm\, Eastern Daylight T ime (New York\, GMT-04:00)\n\nEvent number (access code): 130 730 5865\n\n Thursday\, October 8\, 2020 6:30 pm\, Eastern Daylight Time (New York\, GM T-04:00)\n\nEvent address for attendees: https://ieeemeetings.webex.com/ie eemeetings/onstage/g.php?MTID=ec43a039df4d6327cb0e3478b7cab38bf\n\nAudio c onference information\n+1-415-655-0002 United States Toll\n1-855-282-6330 United States Toll Free\n[Global call-in numbers](https://ieeemeetings.web ex.com/ieeemeetings/globalcallin.php?MTID=ea944d77f6a2ed844edfc918ae9349d3 b) | [Toll-free dialing restrictions](https://www.webex.com/pdf/tollfree_r estrictions.pdf)\n\nJoin from a video system or application\nDial 13073058 65@ieeemeetings.webex.com\nYou can also dial 173.243.2.68 and enter your m eeting number.\n\nSpeaker(s): Jon Martens\, \n\nBuffalo\, New York\, Unite d States LOCATION:Buffalo\, New York\, United States ORGANIZER:jmmoskal@ieee.org SEQUENCE:2 SUMMARY:WHAT IS MY MEASUREMENT EQUIPMENT ACTUALLLY DOING? IMPLICATIONS FOR 5G. URL;VALUE=URI:https://events.vtools.ieee.org/m/239634 X-ALT-DESC:Description: <br /><p>IEEEBuffalo Section joint with the Microwa ve Theory and Techniques and Antennas and Propagation Societies invite you to attend a virtual presentation:</p>\n<p>Topic:&nbsp\; WHAT IS&nbsp\; MY MEASUREMENT EQUIPMENT ACTUALLY DOING?&nbsp\; IMPLICATIONS FOR 5G.</p>\n<p >Current microwave and high frequency instrumentation perform many tasks b ehind the scenes\, even more so in the mm-wave and high modulation rate re gimes\, and it is easy to lose track of how the equipment\, the processing algorithms\, the setup and the signals are interacting.&nbsp\; By explori ng the measurement mechanics within some common instruments under practica l conditions\, it may be easier to understand where sensitivities or anoma lies might increase and how to mitigate them.&nbsp\;&nbsp\; Through a stud y of example architectures and measurements\, including those in the 100+ GHz range and those with wide modulation bandwidths where linearity\, dyna mic range and other physical metrics are stressed even more\, mechanisms a nd ideas for better measurements will be explored.</p>\n<p>Speaker is Jon Martens</p>\n<p>Jon Martens (M&rsquo\;91 &ndash\; S&rsquo\;10) received th e BSEE\, MSEE and Ph.D. in Electrical Engineering from the University of W isconsin in 1986\, 1988 and 1990\, respectively. Since 1995\, he has been with Anritsu where he is currently an Engineering Fellow. His research int erests include measurement system architectures\, millimeter-wave circuit and system design\, and a wide range of microwave measurement processes to include materials analysis\, nonlinear and quasi-linear characterization\ , optical interactions and calibration. He is the inventor or co-inventor on over 17 patents\, has (co-)authored several book chapters and over 50 t echnical publications. Dr. Martens is a past chair of the MTT measurements technical subcommittee and is a past president of the measurements societ y ARFTG and is still active in both. He is a member of the technical progr am subcommittees for the International Microwave Symposium and ARFTG and i s a former associate editor for the Transactions on Microwave Theory and T echniques.</p>\n<p><span style="font-size: 14pt\;">Please join us via WebE x</span></p>\n<p>&nbsp\;</p>\n<table style="height: 290px\;" border="0" wi dth="362" cellspacing="0" cellpadding="0">\n<tbody>\n<tr>\n<td style="colo r: #000000\; line-height: 22px\; font-family: Arial\; font-size: 16px\;">& nbsp\;</td>\n</tr>\n<tr style="line-height: 16px\;">\n<td style="min-heigh t: 16px\;">&nbsp\;</td>\n</tr>\n<tr style="color: #666666\; line-height: 2 2px\; font-family: Arial\; font-size: 14px\;">\n<td>Thursday\, October 8\, 2020 6:30 pm\, Eastern Daylight Time (New York\, GMT-04:00)</td>\n</tr>\n <tr style="line-height: 16px\;">\n<td style="min-height: 16px\;">&nbsp\;</ td>\n</tr>\n<tr>\n<td style="color: #666666\; line-height: 22px\; font-fam ily: Arial\; font-size: 14px\;">\n<p>&nbsp\;</p>\n</td>\n</tr>\n<tr>\n<td style="color: #666666\; line-height: 22px\; font-family: Arial\; font-size : 14px\;">&nbsp\;</td>\n</tr>\n<tr style="line-height: 12px\;">\n<td style ="min-height: 12px\;">&nbsp\;</td>\n</tr>\n<tr>\n<td style="color: #ff0000 \; line-height: 22px\; font-family: Arial\; font-size: 16px\;">&nbsp\;</td >\n</tr>\n<tr style="line-height: 20px\;">\n<td>&nbsp\;</td>\n</tr>\n<tr s tyle="line-height: 22px\; font-family: Arial\;">\n<td><span style="color: #000000\; font-family: Arial\; font-size: 12px\; font-weight: bold\;"><spa n style="color: #000000\; font-family: Arial\; font-size: 12px\; font-weig ht: bold\;">&nbsp\;</span></span>\n<table border="0" width="576" cellspaci ng="0" cellpadding="0">\n<tbody>\n<tr>\n<td style="color: #000000\; line-h eight: 22px\; font-family: Arial\; font-size: 16px\;">Event number (access code): 130 730 5865</td>\n</tr>\n<tr style="line-height: 16px\;">\n<td st yle="min-height: 16px\;">&nbsp\;</td>\n</tr>\n<tr style="color: #666666\; line-height: 22px\; font-family: Arial\; font-size: 14px\;">\n<td>Thursday \, October 8\, 2020 6:30 pm\, Eastern Daylight Time (New York\, GMT-04:00) </td>\n</tr>\n<tr style="line-height: 16px\;">\n<td style="min-height: 16p x\;">&nbsp\;</td>\n</tr>\n<tr>\n<td style="color: #666666\; line-height: 2 2px\; font-family: Arial\; font-size: 14px\;">Event address for attendees: &nbsp\;<a style="color: #049fd9\; text-decoration-line: none\;" href="http s://ieeemeetings.webex.com/ieeemeetings/onstage/g.php?MTID=ec43a039df4d632 7cb0e3478b7cab38bf" target="_blank" rel="nofollow noopener">https://ieeeme etings.webex.com/ieeemeetings/onstage/g.php?MTID=ec43a039df4d6327cb0e3478b 7cab38bf</a></td>\n</tr>\n<tr>\n<td style="color: #666666\; line-height: 2 2px\; font-family: Arial\; font-size: 14px\;">&nbsp\;</td>\n</tr>\n<tr sty le="line-height: 12px\;">\n<td style="min-height: 12px\;">&nbsp\;</td>\n</ tr>\n<tr>\n<td style="color: #ff0000\; line-height: 22px\; font-family: Ar ial\; font-size: 16px\;">&nbsp\;</td>\n</tr>\n<tr style="line-height: 20px \;">\n<td>&nbsp\;</td>\n</tr>\n<tr style="line-height: 22px\; font-family: Arial\;">\n<td><span style="color: #000000\; font-family: Arial\; font-si ze: 12px\; font-weight: bold\;">Audio conference information</span></td>\n </tr>\n<tr style="line-height: 22px\; font-family: Arial\;">\n<td><span st yle="color: #333333\; font-family: Arial\; font-size: 14px\;">+1-415-655-0 002&nbsp\;United States Toll</span><br /><span style="color: #333333\; fon t-family: Arial\; font-size: 14px\;">1-855-282-6330&nbsp\;United States To ll Free</span><br /><a style="color: #049fd9\; text-decoration-line: none\ ;" href="https://ieeemeetings.webex.com/ieeemeetings/globalcallin.php?MTID =ea944d77f6a2ed844edfc918ae9349d3b" target="_blank" rel="nofollow noopener ">Global call-in numbers</a>&nbsp\;|&nbsp\;<a style="color: #049fd9\; text -decoration-line: none\;" href="https://www.webex.com/pdf/tollfree_restric tions.pdf" target="_blank" rel="nofollow noopener">Toll-free dialing restr ictions</a></td>\n</tr>\n<tr style="color: #000000\; line-height: 22px\; f ont-family: Arial\; font-size: 12px\; font-weight: bold\;">\n<td><br />Joi n from a video system or application</td>\n</tr>\n<tr style="color: #33333 3\; line-height: 22px\; font-family: Arial\; font-size: 14px\;">\n<td>Dial &nbsp\;<a style="color: #049fd9\;" rel="nofollow">1307305865@ieeemeetings. webex.com</a><br />You can also dial 173.243.2.68 and enter your meeting n umber.</td>\n</tr>\n<tr style="color: #333333\; line-height: 22px\; font-f amily: Arial\; font-size: 14px\;">\n<td>&nbsp\;</td>\n</tr>\n</tbody>\n</t able>\n</td>\n</tr>\n<tr style="line-height: 22px\; font-family: Arial\;"> \n<td><span style="color: #333333\; font-family: Arial\; font-size: 14px\; ">&nbsp\;</span></td>\n</tr>\n<tr style="color: #000000\; line-height: 22p x\; font-family: Arial\; font-size: 12px\; font-weight: bold\;">\n<td>&nbs p\;</td>\n</tr>\n<tr style="color: #333333\; line-height: 22px\; font-fami ly: Arial\; font-size: 14px\;">\n<td>&nbsp\;</td>\n</tr>\n<tr style="color : #333333\; line-height: 22px\; font-family: Arial\; font-size: 14px\;">\n <td>&nbsp\;</td>\n</tr>\n</tbody>\n</table>\n<p>&nbsp\;</p> END:VEVENT END:VCALENDAR