BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/Chicago BEGIN:DAYLIGHT DTSTART:20200308T030000 TZOFFSETFROM:-0600 TZOFFSETTO:-0500 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:CDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20201101T010000 TZOFFSETFROM:-0500 TZOFFSETTO:-0600 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:CST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20201027T155843Z UID:19B79422-2181-4B1D-82FE-12FCFED6854B DTSTART;TZID=America/Chicago:20201021T110000 DTEND;TZID=America/Chicago:20201021T123000 DESCRIPTION:The Rocky Mountain\, Twin Cities\, Central Texas\, Santa Clara Valley\, Phoenix\, San Diego\, SE Michigan\, Sweden\, and Italy EMC Chapte rs\, together with ANSI C63® and IEEE VTS Chicago Chapter\, Announce a LI VE Webinar:\n\nThe Emerging Implications of Wireless Coexistence on Today ’s Modern Vehicles\n\nThere will be 2 speakers:\n\n1. An Overview of Wir eless Coexistence Measurements and Challenges: Why Can’t We All Get Alon g?\n\nBy Jason Coder\, Shared Spectrum Metrology Group Leader\, National I nstitute of Standards and Technology (NIST)\, Boulder\, Colorado\n\n2. Wir eless Coexistence Implications on Automotive Test and Measurement Applicat ions\n\nBy Garth D’Abreu\, Director\, Automotive Solutions at ETS-Lindgr en\, Cedar Park\, Texas\n\nThe webinar will be hosted and moderated by Dan iel D. Hoolihan\, President of Hoolihan EMC Consulting\n\nPlease register for this webinar in the External link registration section of this event p age.\n\nIf you have any questions\, please contact Janet O’Neil\, ETS-Li ndgren\, cell (425) 443-8106\, email j.n.oneil@ieee.org\n\nCo-sponsored by : IEEE EMC Society\n\nSpeaker(s): Jason Coder\, \n\nAgenda: \n9:00 am PDT (11:00 AM CDT)\n\nWelcome and Announcements – Dan Hoolihan\, Chair\, ANS I ASC C63®\n\n9:05 am\n\nAn Overview of Wireless Coexistence Measurements and Challenges: Why Can’t We All Get Along? by Jason Coder\, Shared Spe ctrum Metrology Group Leader\, National Institute of Standards and Technol ogy (NIST)\, Boulder\, Colorado\n\n9:35 am\n\nWireless Coexistence Implica tions on Automotive Test and Measurement Applications\, by Garth D’Abreu \, Director\, Automotive Solutions at ETS-Lindgren\, Cedar Park\, Texas\n\ n10:05 am\n\nQ&A with the speakers\, moderated by Dan Hoolihan\n\nDaniel D . Hoolihan is currently President of Hoolihan EMC Consulting. His 50 years of experience in the EMC engineering profession began at Control Data Cor poration. Since January 2020\, he has been consulting in EMC engineering. He is presently Chair of the ANSI Accredited Standards Committee C63® on EMC. Mr. Hoolihan has been a member of the IEEE since 1983 and is currentl y a Life Senior Member. From 1998-1999 he was President of the IEEE EMC So ciety and has served on its Board of Directors for many years since 1987. He has held numerous leadership positions within the EMC Society and curre ntly serves as Chair of the History Committee. Mr. Hoolihan received his M S degree in Physics from Louisiana State University in 1969 and his MBA fr om the University of Minnesota in 1975.\n\n(See presentation abstracts and speaker bios below.)\n\n10:30 am\n\nWrap Up/Final Comments\n\nVirtual: ht tps://events.vtools.ieee.org/m/242544 LOCATION:Virtual: https://events.vtools.ieee.org/m/242544 ORGANIZER:alvin.chin@ieee.org SEQUENCE:4 SUMMARY:IEEE VTS Chicago and EMC: The Emerging Implications of Wireless Coe xistence on Today’s Modern Vehicles URL;VALUE=URI:https://events.vtools.ieee.org/m/242544 X-ALT-DESC:Description: <br /><p><strong>The Rocky Mountain\, Twin Cities\, Central Texas\, Santa Clara Valley\, Phoenix\, San Diego\, SE Michigan\, Sweden\, and Italy EMC Chapters\, together with ANSI C63&reg\; and IEEE VT S Chicago Chapter\, Announce a LIVE Webinar:</strong></p>\n<p><strong><em> The Emerging Implications of Wireless Coexistence on Today&rsquo\;s Modern Vehicles</em></strong></p>\n<p><strong>There will be 2 speakers:</strong> </p>\n<p><strong>1. An Overview of Wireless Coexistence Measurements and C hallenges: Why Can&rsquo\;t We All Get Along? </strong></p>\n<p><em>By Jas on Coder\, Shared Spectrum Metrology Group Leader\, National Institute of Standards and&nbsp\;</em><em>Technology (NIST)\, Boulder\, Colorado</em></ p>\n<p><strong>2. Wireless Coexistence Implications on Automotive Test and Measurement Applications</strong></p>\n<p><em>By Garth D&rsquo\;Abreu\, < /em><em>Director\, Automotive Solutions at ETS-Lindgren\, Cedar Park\, Tex as</em></p>\n<p><em>The webinar will be hosted and moderated by&nbsp\;Dani el D. Hoolihan\, President of&nbsp\;Hoolihan EMC Consulting</em></p>\n<p>< em>Please register for this webinar in the External link registration sect ion of this event page.&nbsp\;</em></p>\n<p><em>If you have any questions\ , please contact&nbsp\;Janet O&rsquo\;Neil\, ETS-Lindgren\, cell (425) 443 -8106\, email j.n.oneil@ieee.org</em></p><br /><br />Agenda: <br /><p>9:00 am PDT (11:00 AM CDT)</p>\n<p>Welcome and Announcements &ndash\; Dan Hool ihan\, Chair\, ANSI ASC C63&reg\;</p>\n<p>9:05 am&nbsp\;&nbsp\;&nbsp\;&nbs p\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;& nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;</p>\n<p><st rong>An Overview of Wireless Coexistence Measurements and Challenges: </st rong><strong>Why Can&rsquo\;t We All Get Along?</strong> <em>by Jason Code r\, Shared Spectrum Metrology Group Leader\, National Institute of Standar ds and Technology (NIST)\, Boulder\, Colorado</em></p>\n<p>9:35 am&nbsp\;& nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp \;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&n bsp\;</p>\n<p><strong>Wireless Coexistence Implications on Automotive Test and Measurement </strong><strong>Applications</strong>\, <em>by Garth D&r squo\;Abreu\, Director\, Automotive Solutions at ETS-Lindgren\, Cedar Park \, Texas</em></p>\n<p>10:05 am &nbsp\; &nbsp\; &nbsp\; &nbsp\; &nbsp\; &nb sp\; &nbsp\;</p>\n<p>Q&amp\;A with the speakers\, moderated by Dan Hooliha n</p>\n<p><strong>Daniel D. Hoolihan</strong> is currently President of Ho olihan EMC Consulting.&nbsp\; His 50 years of experience in the EMC engine ering profession began at Control Data Corporation. &nbsp\;Since January 2 020\, he has been consulting in EMC engineering.&nbsp\; &nbsp\;He is prese ntly Chair of the ANSI Accredited Standards Committee C63&reg\; on EMC.&nb sp\; Mr. Hoolihan has been a member of the IEEE since 1983 and is currentl y a Life Senior Member.&nbsp\; From 1998-1999 he was President of the IEEE EMC Society and has served on its Board of Directors for many years since 1987.&nbsp\; He has held numerous leadership positions within the EMC Soc iety and currently serves as Chair of the History Committee.&nbsp\; Mr. Ho olihan received his MS degree in Physics from Louisiana State University i n 1969 and his MBA from the University of Minnesota in 1975.</p>\n<p><stro ng><em><u>(See presentation abstracts and speaker bios below.)</u></em></s trong></p>\n<p>10:30 am<strong>&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;& nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp \;&nbsp\;&nbsp\;&nbsp\;&nbsp\; </strong></p>\n<p>Wrap Up/Final Comments</p > END:VEVENT END:VCALENDAR