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PRODID:IEEE vTools.Events//EN
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TZID:Europe/Zurich
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DTSTART:20200329T030000
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DTSTART:20201025T020000
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BEGIN:VEVENT
DTSTAMP:20210120T094252Z
UID:0CF7D616-9C20-4281-A2AA-7E84BA619CFD
DTSTART;TZID=Europe/Zurich:20201004T093500
DTEND;TZID=Europe/Zurich:20201008T143000
DESCRIPTION:This international symposium will continue its history of focus
 ing on the latest research developments and future directions in failure a
 nalysis\, quality and reliability of materials\, devices and circuits for 
 micro-\, opto-\, power and space electronics. It historically provides an 
 unprecedented European forum to develop all aspects of reliability\, inclu
 ding management and advanced analysis techniques for present- and emerging
  semiconductor applications. All aspects related to specification\, techno
 logy and manufacturing\, testing\, control and analysis are addressed in E
 SREF.\n\nVirtual: https://events.vtools.ieee.org/m/257708
LOCATION:Virtual: https://events.vtools.ieee.org/m/257708
ORGANIZER:ciappa@iis.ee.ethz.ch
SEQUENCE:0
SUMMARY:Power Device Reliability Session at the 31st European Symposium on 
 Reliability of Electron Devices\, Failure Physics and Analysis (ESREF)
URL;VALUE=URI:https://events.vtools.ieee.org/m/257708
X-ALT-DESC:Description: <br /><p>This international symposium will continue
  its history of focusing on the latest research developments and future di
 rections in failure analysis\, quality and reliability of materials\, devi
 ces and circuits for micro-\, opto-\, power and space electronics. It hist
 orically provides an unprecedented European forum to develop all aspects o
 f reliability\, including management and advanced analysis techniques for 
 present- and emerging semiconductor applications. All aspects related to s
 pecification\, technology and manufacturing\, testing\, control and analys
 is are addressed in ESREF.</p>
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