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PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
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TZID:US/Eastern
BEGIN:DAYLIGHT
DTSTART:20210314T030000
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DTSTART:20201101T010000
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BEGIN:VEVENT
DTSTAMP:20210224T183711Z
UID:01539A97-A3E3-449B-9579-D68E3E3D7F1D
DTSTART;TZID=US/Eastern:20210224T110000
DTEND;TZID=US/Eastern:20210224T120000
DESCRIPTION:FREE Webinar\n\nJMP has a comprehensive suite of tools for reli
 ability data analysis and reliability engineering\, to address problems fr
 om time-to-failure distribution analysis\, warranty forecast\, accelerated
  life test data analysis\, to degradation data analysis\, recurrent events
  data analysis\, reliability growth\, and all the way to system reliabilit
 y analysis using reliability block diagram and system maintenance simulati
 on.\n\nThe presenter will start with two live demonstrations. One illustra
 tes the capability of warranty forecast in the Reliability Forecast platfo
 rm. The other one illustrates the Bayesian modeling capability of analyzin
 g accelerated life test data. The demonstrations also serve as an introduc
 tion to JMP in general. After the demonstration\, the presenter will go th
 rough additional examples or use cases that highlight some of the distinct
 ive capabilities of JMP reliability platforms.\n\nSpeaker(s): Dr. Peng Liu
 \, \n\nAgenda: \n11:00 AM Technical Presentation\n\n11:45 AM Questions and
  Answers\n\n12:00 PM Adjournment\n\nVirtual: https://events.vtools.ieee.or
 g/m/260847
LOCATION:Virtual: https://events.vtools.ieee.org/m/260847
ORGANIZER:michael.bannan@ieee.org
SEQUENCE:9
SUMMARY:Webinar - JMP Reliability Platforms – A Zoom In then Zoom Out Int
 roduction
URL;VALUE=URI:https://events.vtools.ieee.org/m/260847
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;strong&gt;&lt;em&gt;FREE Webinar&lt;/em&gt;&lt;/strong&gt;&lt;/p&gt;
 \n&lt;p&gt;JMP has a comprehensive suite of tools for reliability data analysis 
 and reliability engineering\, to address problems from time-to-failure dis
 tribution analysis\, warranty forecast\, accelerated life test data analys
 is\, to degradation data analysis\, recurrent events data analysis\, relia
 bility growth\, and all the way to system reliability analysis using relia
 bility block diagram and system maintenance simulation.&lt;/p&gt;\n&lt;p&gt;The presen
 ter will start with two live demonstrations. One illustrates the capabilit
 y of warranty forecast in the Reliability Forecast platform. The other one
  illustrates the Bayesian modeling capability of analyzing accelerated lif
 e test data. The demonstrations also serve as an introduction to JMP in ge
 neral. After the demonstration\, the presenter will go through additional 
 examples or use cases that highlight some of the distinctive capabilities 
 of JMP reliability platforms.&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /
 &gt;&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;11:00 AM&lt;/strong&gt;&amp;nbsp\;&amp;nbsp\;&amp;nbsp\;Technica
 l Presentation&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;11:45 AM&lt;/strong&gt;&amp;nbsp\;&amp;nbsp\; Questions a
 nd Answers&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;12:00 PM&lt;/strong&gt;&amp;nbsp\;&amp;nbsp\;&amp;nbsp\;Adjournme
 nt&lt;/p&gt;
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