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DTSTART:20210314T030000
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DTSTART:20201101T010000
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DTSTAMP:20220324T153228Z
UID:7F25FA93-413A-4042-A9EA-215B350173F2
DTSTART;TZID=US/Eastern:20210310T180000
DTEND;TZID=US/Eastern:20210310T190000
DESCRIPTION:Webinar hosted by The NE ESDA Chapter\, IEEE Boston Reliability
  and iMAPS New England\n\nJoin us for this highly interactive webinar and 
 learn about the complexity\, customization and attention to detail require
 d to successfully develop fixtures for ESD sensitive applications includin
 g Class 0 devices.\n\nFixture design considerations will be presented incl
 uding material selection\, ESD event detection\, isolated conductors\, and
  limitations of ionization.\n\nManufacturing applications will cover opera
 tions such as in-circuit test\, ESD damage during a board connector press 
 operation\, cable discharges at test sets\, automated test heads\, and bur
 n-in.\n\nOne of the Class 0 Case documents 22% failures rates with a good 
 S20.20 program in place. The corrective action required modification to a 
 test fixture and the addition of a special operating procedure.\n\nA parti
 cularly interesting Class 0 case study will be presented on the installati
 on of CCDs at the Gemini Observatory in Hawaii. These CCDs cost $175\,000 
 each which did not have any input protection and a 10 V CDM sensitivity.\n
 \nCo-sponsored by: IEEE Boston Reliability Chapter\, NE ESDA and iMAPS-NE\
 n\nSpeaker(s): Ted Dangelmayer\, \n\nVirtual: https://events.vtools.ieee.o
 rg/m/263216
LOCATION:Virtual: https://events.vtools.ieee.org/m/263216
ORGANIZER:rdelacru@ieee.org
SEQUENCE:15
SUMMARY:.
URL;VALUE=URI:https://events.vtools.ieee.org/m/263216
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&lt;span style=&quot;font-size: 14
 pt\;&quot;&gt;Webinar hosted by The NE ESDA Chapter\, IEEE Boston Reliability and 
 iMAPS New England&lt;/span&gt;&lt;/p&gt;\n&lt;p&gt;&lt;span style=&quot;font-size: 14pt\;&quot;&gt;Join us f
 or this highly interactive webinar and learn about the complexity\, custom
 ization and attention to detail required to successfully develop fixtures 
 for ESD sensitive applications including Class 0 devices.&lt;/span&gt;&lt;/p&gt;\n&lt;p&gt;&lt;
 span style=&quot;font-size: 14pt\;&quot;&gt;Fixture design considerations will be prese
 nted including material selection\, ESD event detection\, isolated conduct
 ors\, and limitations of ionization.&amp;nbsp\;&amp;nbsp\;&amp;nbsp\; &lt;/span&gt;&lt;/p&gt;\n&lt;p&gt;
 &lt;span style=&quot;font-size: 14pt\;&quot;&gt;Manufacturing applications will cover oper
 ations such as in-circuit test\, ESD damage during a board connector press
  operation\, cable discharges at test sets\, automated test heads\, and bu
 rn-in.&lt;/span&gt;&lt;/p&gt;\n&lt;p&gt;&lt;span style=&quot;font-size: 14pt\;&quot;&gt;One of the Class 0 C
 ase documents 22% failures rates with a good S20.20 program in place.&amp;nbsp
 \; The corrective action required modification to a test fixture and the a
 ddition of a special operating procedure.&amp;nbsp\;&amp;nbsp\; &lt;/span&gt;&lt;/p&gt;\n&lt;p&gt;&lt;s
 pan style=&quot;font-size: 14pt\;&quot;&gt;A particularly interesting Class 0 case stud
 y will be presented on the installation of CCDs at the Gemini Observatory 
 in Hawaii. These CCDs cost $175\,000 each which did not have any input pro
 tection and a 10 V CDM sensitivity.&lt;/span&gt;&lt;/p&gt;
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