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DTSTART:20210314T030000
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DTSTART:20201101T010000
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DTSTAMP:20210317T005000Z
UID:E0CBD02D-D3DF-4433-88DB-0EB97FA0C8F2
DTSTART;TZID=US/Eastern:20210310T180000
DTEND;TZID=US/Eastern:20210310T190000
DESCRIPTION:FREE Webinar\n\nJoin us for this highly interactive webinar and
  learn about the complexity\, customization and attention to detail requir
 ed to successfully develop fixtures for ESD sensitive applications includi
 ng Class 0 devices.\n\nFixture design considerations will be presented inc
 luding material selection\, ESD event detection\, isolated conductors\, an
 d limitations of ionization.\n\nManufacturing applications will cover oper
 ations such as in-circuit test\, ESD damage during a board connector press
  operation\, cable discharges at test sets\, automated test heads\, and bu
 rn-in.\n\nOne of the Class 0 Case documents 22% failures rates with a good
  S20.20 program in place. The corrective action required modification to a
  test fixture and the addition of a special operating procedure.\n\nA part
 icularly interesting Class 0 case study will be presented on the installat
 ion of CCDs at the Gemini Observatory in Hawaii. These CCDs cost $175\,000
  each which did not have any input protection and a 10 V CDM sensitivity.\
 n\nRegistration is open through 09 March 2021 05:00 PM\n\nCo-sponsored by:
  NE ESDA Chapter and iMAPS New England\n\nSpeaker(s): Ted Dangelmayer\, \n
 \nAgenda: \n6:00 PM Technical Presentation\n\n7:00 PM Adjournment\n\nVirtu
 al: https://events.vtools.ieee.org/m/263440
LOCATION:Virtual: https://events.vtools.ieee.org/m/263440
ORGANIZER:michael.bannan@ieee.org
SEQUENCE:6
SUMMARY:Webinar - ESD Fixture Design Considerations and Case Studies
URL;VALUE=URI:https://events.vtools.ieee.org/m/263440
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;strong&gt;&lt;em&gt;FREE Webinar&lt;/em&gt;&lt;/strong&gt;&lt;/p&gt;
 \n&lt;p&gt;Join us for this highly interactive webinar and learn about the compl
 exity\, customization and attention to detail required to successfully dev
 elop fixtures for ESD sensitive applications including Class 0 devices.&lt;/p
 &gt;\n&lt;p&gt;Fixture design considerations will be presented including material s
 election\, ESD event detection\, isolated conductors\, and limitations of 
 ionization.&lt;/p&gt;\n&lt;p&gt;Manufacturing applications will cover operations such 
 as in-circuit test\, ESD damage during a board connector press operation\,
  cable discharges at test sets\, automated test heads\, and burn-in.&lt;/p&gt;\n
 &lt;p&gt;One of the Class 0 Case documents 22% failures rates with a good S20.20
  program in place. The corrective action required modification to a test f
 ixture and the addition of a special operating procedure.&lt;/p&gt;\n&lt;p&gt;A partic
 ularly interesting Class 0 case study will be presented on the installatio
 n of CCDs at the Gemini Observatory in Hawaii. These CCDs cost $175\,000 e
 ach which did not have any input protection and a 10 V CDM sensitivity.&lt;/p
 &gt;\n&lt;p&gt;&lt;strong&gt;Registration is open through 09 March 2021 05:00 PM&lt;/strong&gt;
 &lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;6:00 PM&lt;/strong&gt;&amp;
 nbsp\;&amp;nbsp\;&amp;nbsp\;Technical Presentation&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;7:00 PM&lt;/strong
 &gt;&amp;nbsp\;&amp;nbsp\;&amp;nbsp\;Adjournment&lt;/p&gt;
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