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DTSTART:20210314T030000
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DTSTAMP:20210414T163229Z
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DTSTART;TZID=US/Eastern:20210414T110000
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DESCRIPTION:FREE Webinar\n\nThe space environment presents many natural haz
 ards\, one of which is a harsh radiation environment. Energetic ions from 
 the sun and far-off galaxies affect sensitive microelectronics\, causing a
  multitude of adverse effects. With modern manufacturing techniques that i
 ncrease performance by decreasing feature sizes\, commercially available d
 igital parts such as FPGAs are only becoming softer to particle radiation\
 , reducing reliability. This talk discusses how analysis of this environme
 ntal risk can be done in the system engineering process and introduces in-
 house modeling efforts at Lincoln Laboratory that will better enable futur
 e space program assessments of reliability.\n\nSpeaker(s): Dr. J. Brent Pa
 rham\, \n\nAgenda: \n11:00 AM Technical Presentation\n\n11:45 AM Questions
  and Answers\n\n12:00 PM Adjournment\n\nVirtual: https://events.vtools.iee
 e.org/m/263541
LOCATION:Virtual: https://events.vtools.ieee.org/m/263541
ORGANIZER:michael.bannan@ieee.org
SEQUENCE:2
SUMMARY:Webinar - Space Radiation Effects—Modeling the Environment for Sy
 stems Analysis 
URL;VALUE=URI:https://events.vtools.ieee.org/m/263541
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;strong&gt;&lt;em&gt;FREE Webinar&lt;/em&gt;&lt;/strong&gt;&lt;/p&gt;
 \n&lt;p&gt;The space environment presents many natural hazards\, one of which is
  a harsh radiation environment. Energetic ions from the sun and far-off ga
 laxies affect sensitive microelectronics\, causing a multitude of adverse 
 effects. With modern manufacturing techniques that increase performance by
  decreasing feature sizes\, commercially available digital parts such as F
 PGAs are only becoming softer to particle radiation\, reducing reliability
 . This talk discusses how analysis of this environmental risk can be done 
 in the system engineering process and introduces in-house modeling efforts
  at Lincoln Laboratory that will better enable future space program assess
 ments of reliability.&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;&amp;nbs
 p\;&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;11:00 AM&lt;/strong&gt;&amp;nbsp\;&amp;nbsp\;&amp;nbsp\;Technical Presen
 tation&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;11:45 AM&lt;/strong&gt;&amp;nbsp\;&amp;nbsp\; Questions and Answe
 rs&lt;/p&gt;\n&lt;p&gt;&lt;strong&gt;12:00 PM&lt;/strong&gt;&amp;nbsp\;&amp;nbsp\;&amp;nbsp\;Adjournment&lt;/p&gt;
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