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TZID:Canada/Eastern
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DTSTART:20210314T030000
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DTSTART:20211107T010000
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DTSTAMP:20210929T141348Z
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DTSTART;TZID=Canada/Eastern:20210331T180000
DTEND;TZID=Canada/Eastern:20210331T193000
DESCRIPTION:Current microwave and high frequency instrumentation perform ma
 ny tasks behind the scenes\, even more so in the mm-wave and high modulati
 on rate regimes\, and it is easy to lose track of how the equipment\, the 
 processing algorithms\, the setup\, and the signals are interacting. By ex
 ploring the measurement mechanics within some common instruments under pra
 ctical conditions\, it may be easier to understand where sensitivities or 
 anomalies might increase and how to mitigate them. Through a study of exam
 ple architectures and measurements\, including those in the 100+ GHz range
  and those with wide modulation bandwidths where linearity\, dynamic range
  and other physical metrics are stressed even more\, mechanisms and ideas 
 for better measurements will be explored.\n\nSpeaker(s): Jon Martens (M’
 91 – S’10)  BSEE\, MSEE\,  Ph.D. \, \n\nMontreal\, Quebec\, Canada\, V
 irtual: https://events.vtools.ieee.org/m/265642
LOCATION:Montreal\, Quebec\, Canada\, Virtual: https://events.vtools.ieee.o
 rg/m/265642
ORGANIZER:djerafi@emt.inrs.ca
SEQUENCE:3
SUMMARY:WHAT IS MY MEASUREMENT EQUIPMENT ACTUALLY DOING? IMPLICATIONS FOR 5
 G
URL;VALUE=URI:https://events.vtools.ieee.org/m/265642
X-ALT-DESC:Description: <br /><p>Current microwave and high frequency instr
 umentation perform many tasks behind the scenes\, even more so in the mm-w
 ave and high modulation rate regimes\, and it is easy to lose track of how
  the equipment\, the processing algorithms\, the setup\, and the signals a
 re interacting.&nbsp\; By exploring the measurement mechanics within some 
 common instruments under practical conditions\, it may be easier to unders
 tand where sensitivities or anomalies might increase and how to mitigate t
 hem.&nbsp\;&nbsp\; Through a study of example architectures and measuremen
 ts\, including those in the 100+ GHz range and those with wide modulation 
 bandwidths where linearity\, dynamic range and other physical metrics are 
 stressed even more\, mechanisms and ideas for better measurements will be 
 explored.</p>
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