BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:America/Montreal
BEGIN:DAYLIGHT
DTSTART:20210314T030000
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
TZNAME:EDT
END:DAYLIGHT
BEGIN:STANDARD
DTSTART:20211107T010000
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11
TZNAME:EST
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20220110T151713Z
UID:9980A2FB-F6CD-4021-B26B-85AB39C9A721
DTSTART;TZID=America/Montreal:20210317T110000
DTEND;TZID=America/Montreal:20210317T120000
DESCRIPTION:As the electronics industry is going through some rapid changes
 \, the new electronics systems need to provide increasingly higher perform
 ance. As a result\, the capability of the components that constitute these
  systems needs to also scale accordingly. One area where pace of innovatio
 n has greatly increased in recent years is semiconductor packaging. Paving
  the way for heterogeneous integration\, these new ‘advanced’ packagin
 g technologies aim to integrate multiple logic\, memory\, and other specia
 lized silicon dies\, potentially using different silicon process technolog
 ies\, and provide unprecedented levels of performance in metrics such as I
 O bandwidth\, bandwidth density\, and power efficiency. This presentation 
 will review some of these new advanced packaging technologies such as fan-
 out wafer/panel level and 2.xD packaging and the key challenges and some s
 olutions for their electrical design and analysis.\n\nSpeaker(s): Dr. Kema
 l Aygun\, \n\nVirtual: https://events.vtools.ieee.org/m/266199
LOCATION:Virtual: https://events.vtools.ieee.org/m/266199
ORGANIZER:roni.khazaka@mcgill.ca
SEQUENCE:1
SUMMARY:Trends and Challenges for Electrical Design and Analysis Using Adva
 nced Packaging
URL;VALUE=URI:https://events.vtools.ieee.org/m/266199
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;As the electronics industry is going throu
 gh some rapid changes\, the new electronics systems need to provide increa
 singly higher performance. As a result\, the capability of the components 
 that constitute these systems needs to also scale accordingly. One area wh
 ere pace of innovation has greatly increased in recent years is semiconduc
 tor packaging. Paving the way for heterogeneous integration\, these new &amp;l
 squo\;advanced&amp;rsquo\; packaging technologies aim to integrate multiple lo
 gic\, memory\, and other specialized silicon dies\, potentially using diff
 erent silicon process technologies\, and provide unprecedented levels of p
 erformance in metrics such as IO bandwidth\, bandwidth density\, and power
  efficiency. This presentation will review some of these new advanced pack
 aging technologies such as fan-out wafer/panel level and 2.xD packaging an
 d the key challenges and some solutions for their electrical design and an
 alysis.&lt;/p&gt;
END:VEVENT
END:VCALENDAR

