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DTSTART:20210314T030000
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DTSTAMP:20210401T205550Z
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DTSTART;TZID=America/New_York:20210331T180000
DTEND;TZID=America/New_York:20210331T193000
DESCRIPTION:Current microwave and high frequency instrumentation perform ma
 ny tasks behind the scenes\, even more so in the mm-wave and high modulati
 on rate regimes\, and it is easy to lose track of how the equipment\, the 
 processing algorithms\, the setup and the signals are interacting. By expl
 oring the measurement mechanics within some common instruments under pract
 ical conditions\, it may be easier to understand where sensitivities or an
 omalies might increase and how to mitigate them. Through a study of exampl
 e architectures and measurements\, including those in the 100+ GHz range a
 nd those with wide modulation bandwidths where linearity\, dynamic range a
 nd other physical metrics are stressed even more\, mechanisms and ideas fo
 r better measurements will be explored.\n\nCo-sponsored by: METSAC\n\nSpea
 ker(s): Jon Martens\, \n\nVirtual: https://events.vtools.ieee.org/m/266293
LOCATION:Virtual: https://events.vtools.ieee.org/m/266293
ORGANIZER:anjali.agarwal@caci.com
SEQUENCE:6
SUMMARY:What is My Measurement Equipment Actually Doing? Implications for 5
 G
URL;VALUE=URI:https://events.vtools.ieee.org/m/266293
X-ALT-DESC:Description: <br /><p align="justify">Current microwave and high
  frequency instrumentation perform many tasks behind the scenes\, even mor
 e so in the mm-wave and high modulation rate regimes\, and it is easy to l
 ose track of how the equipment\, the processing algorithms\, the setup and
  the signals are interacting.&nbsp\; By exploring the measurement mechanic
 s within some common instruments under practical conditions\, it may be ea
 sier to understand where sensitivities or anomalies might increase and how
  to mitigate them.&nbsp\;&nbsp\; Through a study of example architectures 
 and measurements\, including those in the 100+ GHz range and those with wi
 de modulation bandwidths where linearity\, dynamic range and other physica
 l metrics are stressed even more\, mechanisms and ideas for better measure
 ments will be explored.</p>
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