BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/Los_Angeles BEGIN:DAYLIGHT DTSTART:20210314T030000 TZOFFSETFROM:-0800 TZOFFSETTO:-0700 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:PDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20211107T010000 TZOFFSETFROM:-0700 TZOFFSETTO:-0800 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:PST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20210516T224757Z UID:FD331F4B-E6F2-4A81-BD4F-E75F2B0DD4F0 DTSTART;TZID=America/Los_Angeles:20210513T190000 DTEND;TZID=America/Los_Angeles:20210513T200000 DESCRIPTION:"Fault Tolerant Smart Power Drivers with Biasing Schemes and Di agnostics for Smart Automotive Systems"\n\nDr. –Ing Sri Navaneeth Easwar an\, Texas Instruments\n\nEvent Organized By:\n\n[Circuits and Systems Soc iety (CASS)](http://sites.ieee.org/scv-cas/) of the [IEEE Santa Clara Vall ey Section](http://sites.ieee.org/scv/)\n\nREGISTRATION LINK: [here](https ://www.eventbrite.com/e/fault-tolerant-smart-power-drivers-for-smart-autom otive-systems-tickets-150381054783)\n\nPROGRAM:\n\n6:55 - 7:00 PM Intro 7: 00 - 7:50 PM Lecture7:50 - 8:00 PM Q&A/Adjourn\n\nAbstract:\n\nThe electro nic components are increasing in automotive applications replacing earlier mechanical and hydraulics solutions. With proper protection and diagnosti cs\, we can ensure that these electronic components (power semiconductors/ transistors) perform the expected function and achieve fail silent (fault tolerant) operation by sensing the fault and adapting its behavior. They a lso incorporate advanced and robust diagnostic circuits that provideinform ation apriori for safety to the drivers/passengers in the cars about the l oad conditions\, faults etc. Such components are referred to as the Smart Power Circuits. Their designs are not much different from the conventional analog circuits used in consumer electronics topology wise. However\, the y have to handle a wide range of input voltage (5V to 40V) and wide range of currents (30mA to 4A). There are additional system requirements and des ign implementation challenges that have to be considered when defining and implementing such circuits. This seminar/tutorial introduces the State-of -the-Art requirements of automotive ICs\, design techniques\, R-L-C type o f loads\, thermal simulations\, reliability and explains the various Gate Drivers like the high side driver\, low side driver configurable high side /low side drivers. Power supply sequencing\, level shifters\, charge pump\ , voltage-current selector circuits will be presented. High voltage\, nega tive voltage tolerant switches for diagnostics and impact of on chip paras itic bipolar transistors in automotive applications are discussed.\n\nBio: \n\nDr. –Ing Sri Navaneeth Easwaran\, Senior Member IEEE\, received his Bachelor's (1998\, Bharathidasan University)\, Master's (2006\, University Twente) degrees in Electrical Engineering and Dr. –Ing. degree from Uni versity of ErlangenNuremberg in 2017. He worked at SPIC Electronics\, STMi croelectronics\, Philips Semiconductors between 1998 and 2006. From 2006 h e is with Texas Instruments (TI) where he was the design lead for airbag s quib driver ICs. He has also designed high voltage and -40V tolerant circu its for automotive ICs. He is an IET Fellow (since Feb 2021) and a TI Seni or Member Technical Staff. He has 20+ granted patents and 15 publications. He has offered tutorials on Automotive design at IEEE Conferences.\n\nZoo m Broadcast:\n\nAmit Jha is inviting you to a scheduled Zoom meeting.\n\nT opic: Amit Jha's Zoom Meeting\n\nTime: May 13\, 2021 07:00 PM Pacific Time (US and Canada)\n\nJoin Zoom Meeting\n\nhttps://us02web.zoom.us/j/8909058 9374?pwd=bG5uT2FuWGc1Q3lOVXJMUUZ2QnJGdz09\n\nMeeting ID: 890 9058 9374\n\n Passcode: 315340\n\nOne tap mobile\n\n+12532158782\,\,89090589374#\,\,\,\, *315340# US (Tacoma)\n\n+13462487799\,\,89090589374#\,\,\,\,*315340# US (H ouston)\n\nDial by your location\n\n+1 253 215 8782 US (Tacoma)\n\n+1 346 248 7799 US (Houston)\n\n+1 669 900 6833 US (San Jose)\n\n+1 312 626 6799 US (Chicago)\n\n+1 929 436 2866 US (New York)\n\n+1 301 715 8592 US (Washi ngton DC)\n\nMeeting ID: 890 9058 9374\n\nPasscode: 315340\n\nFind your lo cal number: https://us02web.zoom.us/u/keiRzTDt6Q\n\nAdmission Fee:\n\nAll admissions free. Suggested donations:\n\nNon-IEEE: $5\, Students (non-IEEE ): $3\, IEEE Members (not members of CASS or SSCS): $3\n\nSpeaker(s): Dr. Sri Navaneeth Easwaran\, \n\nAgenda: \n"Fault Tolerant Smart Power Drivers with Biasing Schemes and Diagnostics for Smart Automotive Systems"\n\nDr. –Ing Sri Navaneeth Easwaran\, Texas Instruments\n\nEvent Organized By:\ n\n[Circuits and Systems Society (CASS)](http://sites.ieee.org/scv-cas/) o f the [IEEE Santa Clara Valley Section](http://sites.ieee.org/scv/)\n\nPRO GRAM:\n\n6:55 - 7:00 PM Intro 7:00 - 7:50 PM Lecture7:50 - 8:00 PM Q&A/Adj ourn\n\nAbstract:\n\nThe electronic components are increasing in automotiv e applications replacing earlier mechanical and hydraulics solutions. With proper protection and diagnostics\, we can ensure that these electronic c omponents (power semiconductors/transistors) perform the expected function and achieve fail silent (fault tolerant) operation by sensing the fault a nd adapting its behavior. They also incorporate advanced and robust diagno stic circuits that provideinformation apriori for safety to the drivers/pa ssengers in the cars about the load conditions\, faults etc. Such componen ts are referred to as the Smart Power Circuits. Their designs are not much different from the conventional analog circuits used in consumer electron ics topology wise. However\, they have to handle a wide range of input vol tage (5V to 40V) and wide range of currents (30mA to 4A). There are additi onal system requirements and design implementation challenges that have to be considered when defining and implementing such circuits. This seminar/ tutorial introduces the State-of-the-Art requirements of automotive ICs\, design techniques\, R-L-C type of loads\, thermal simulations\, reliabilit y and explains the various Gate Drivers like the high side driver\, low si de driver configurable high side/low side drivers. Power supply sequencing \, level shifters\, charge pump\, voltage-current selector circuits will b e presented. High voltage\, negative voltage tolerant switches for diagnos tics and impact of on chip parasitic bipolar transistors in automotive app lications are discussed.\n\nBio:\n\nDr. –Ing Sri Navaneeth Easwaran\, Se nior Member IEEE\, received his Bachelor's (1998\, Bharathidasan Universit y)\, Master's (2006\, University Twente) degrees in Electrical Engineering and Dr. –Ing. degree from University of ErlangenNuremberg in 2017. He w orked at SPIC Electronics\, STMicroelectronics\, Philips Semiconductors be tween 1998 and 2006. From 2006 he is with Texas Instruments (TI) where he was the design lead for airbag squib driver ICs. He has also designed high voltage and -40V tolerant circuits for automotive ICs. He is an IET Fello w (since Feb 2021) and a TI Senior Member Technical Staff. He has 20+ gran ted patents and 15 publications. He has offered tutorials on Automotive de sign at IEEE Conferences.\n\nZoom Broadcast:\n\nAmit Jha is inviting you t o a scheduled Zoom meeting.\n\nTopic: Amit Jha's Zoom Meeting\n\nTime: May 13\, 2021 07:00 PM Pacific Time (US and Canada)\n\nJoin Zoom Meeting\n\nh ttps://us02web.zoom.us/j/89090589374?pwd=bG5uT2FuWGc1Q3lOVXJMUUZ2QnJGdz09\ n\nMeeting ID: 890 9058 9374\n\nPasscode: 315340\n\nOne tap mobile\n\n+125 32158782\,\,89090589374#\,\,\,\,*315340# US (Tacoma)\n\n+13462487799\,\,89 090589374#\,\,\,\,*315340# US (Houston)\n\nDial by your location\n\n+1 253 215 8782 US (Tacoma)\n\n+1 346 248 7799 US (Houston)\n\n+1 669 900 6833 U S (San Jose)\n\n+1 312 626 6799 US (Chicago)\n\n+1 929 436 2866 US (New Yo rk)\n\n+1 301 715 8592 US (Washington DC)\n\nMeeting ID: 890 9058 9374\n\n Passcode: 315340\n\nFind your local number: https://us02web.zoom.us/u/keiR zTDt6Q\n\nAdmission Fee:\n\nAll admissions free. Suggested donations:\n\nN on-IEEE: $5\, Students (non-IEEE): $3\, IEEE Members (not members of CASS or SSCS): $3\n\nSanta Clara\, California\, United States\, Virtual: https: //events.vtools.ieee.org/m/269768 LOCATION:Santa Clara\, California\, United States\, Virtual: https://events .vtools.ieee.org/m/269768 ORGANIZER:ieee.scv.cas@gmail.com SEQUENCE:2 SUMMARY:CASS-SCV Online Lecture: "Fault Tolerant Smart Power Drivers with B iasing Schemes and Diagnostics for Smart Automotive Systems\," by Dr. Sri Navaneeth Easwaran on May 13th URL;VALUE=URI:https://events.vtools.ieee.org/m/269768 X-ALT-DESC:Description: <br /><h2>"Fault Tolerant Smart Power Drivers with Biasing Schemes and Diagnostics for Smart Automotive Systems"</h2>\n<p>&nb sp\;</p>\n<h3>Dr. &ndash\;Ing Sri Navaneeth Easwaran\,&nbsp\;Texas Instrum ents</h3>\n<h3>Event Organized By:</h3>\n<p><a href="http://sites.ieee.org /scv-cas/" target="_blank" rel="nofollow noopener noreferrer">Circuits and Systems Society (CASS)</a>&nbsp\;of the&nbsp\;<a href="http://sites.ieee. org/scv/" target="_blank" rel="nofollow noopener noreferrer">IEEE Santa Cl ara Valley Section</a></p>\n<h3>&nbsp\;</h3>\n<h2>REGISTRATION LINK: <a hr ef="https://www.eventbrite.com/e/fault-tolerant-smart-power-drivers-for-sm art-automotive-systems-tickets-150381054783">here</a></h2>\n<h2>PROGRAM:</ h2>\n<p>6:55 - 7:00 PM&nbsp\;Intro 7:00 - 7:50 PM&nbsp\;Lecture7:50 - 8:00 PM Q&amp\;A/Adjourn</p>\n<p>&nbsp\;</p>\n<h2>Abstract:</h2>\n<p>The elect ronic components are increasing in automotive applications replacing earli er mechanical and hydraulics solutions. With proper protection and diagnos tics\, we can ensure that these electronic components (power semiconductor s/transistors) perform the expected function and achieve fail silent (faul t tolerant) operation by sensing the fault and adapting its behavior. They also incorporate advanced and robust diagnostic circuits that provideinfo rmation apriori for safety to the drivers/passengers in the cars about the load conditions\, faults etc. Such components are referred to as the Smar t Power Circuits. Their designs are not much different from the convention al analog circuits used in consumer electronics topology wise. However\, t hey have to handle a wide range of input voltage (5V to 40V) and wide rang e of currents (30mA to 4A). There are additional system requirements and d esign implementation challenges that have to be considered when defining a nd implementing such circuits. This seminar/tutorial introduces the State- of-the-Art requirements of automotive ICs\, design techniques\, R-L-C type of loads\, thermal simulations\, reliability and explains the various Gat e Drivers like the high side driver\, low side driver configurable high si de/low side drivers. Power supply sequencing\, level shifters\, charge pum p\, voltage-current selector circuits will be presented. High voltage\, ne gative voltage tolerant switches for diagnostics and impact of on chip par asitic bipolar transistors in automotive applications are discussed.</p>\n <h2>Bio:</h2>\n<p>Dr. &ndash\;Ing Sri Navaneeth Easwaran\, Senior Member I EEE\, received his Bachelor's (1998\, Bharathidasan University)\, Master's (2006\, University Twente) degrees in Electrical Engineering and Dr. &nda sh\;Ing. degree from University of ErlangenNuremberg in 2017. He worked at SPIC Electronics\, STMicroelectronics\, Philips Semiconductors between 19 98 and 2006. From 2006 he is with Texas Instruments (TI) where he was the design lead for airbag squib driver ICs. He has also designed high voltage and -40V tolerant circuits for automotive ICs. He is an IET Fellow (since Feb 2021) and a TI Senior Member Technical Staff. He has 20+ granted pate nts and 15 publications. He has offered tutorials on Automotive design at IEEE Conferences.</p>\n<h2>Zoom Broadcast:</h2>\n<p>Amit Jha is inviting y ou to a scheduled Zoom meeting.</p>\n<p>&nbsp\;</p>\n<p>Topic: Amit Jha's Zoom Meeting</p>\n<p>Time: May 13\, 2021 07:00 PM Pacific Time (US and Can ada)</p>\n<p>&nbsp\;</p>\n<p>Join Zoom Meeting</p>\n<p>https://us02web.zoo m.us/j/89090589374?pwd=bG5uT2FuWGc1Q3lOVXJMUUZ2QnJGdz09</p>\n<p>&nbsp\;</p >\n<p>Meeting ID: 890 9058 9374</p>\n<p>Passcode: 315340</p>\n<p>One tap m obile</p>\n<p>+12532158782\,\,89090589374#\,\,\,\,*315340# US (Tacoma)</p> \n<p>+13462487799\,\,89090589374#\,\,\,\,*315340# US (Houston)</p>\n<p>&nb sp\;</p>\n<p>Dial by your location</p>\n<p>+1 253 215 8782 US (Tacoma)</p> \n<p>+1 346 248 7799 US (Houston)</p>\n<p>+1 669 900 6833 US (San Jose)</p >\n<p>+1 312 626 6799 US (Chicago)</p>\n<p>+1 929 436 2866 US (New York)</ p>\n<p>+1 301 715 8592 US (Washington DC)</p>\n<p>Meeting ID: 890 9058 937 4</p>\n<p>Passcode: 315340</p>\n<p>Find your local number: https://us02web .zoom.us/u/keiRzTDt6Q</p>\n<p>&nbsp\;</p>\n<h2>Admission Fee:</h2>\n<p>All admissions free. Suggested donations:</p>\n<p>Non-IEEE:&nbsp\; $5\,&nbsp\ ;Students (non-IEEE): $3\,&nbsp\;IEEE Members (not members of CASS or SSCS ): $3</p><br /><br />Agenda: <br /><h2>"Fault Tolerant Smart Power Drivers with Biasing Schemes and Diagnostics for Smart Automotive Systems"</h2>\n <p>&nbsp\;</p>\n<h3>Dr. &ndash\;Ing Sri Navaneeth Easwaran\,&nbsp\;Texas I nstruments</h3>\n<h3>Event Organized By:</h3>\n<p><a href="http://sites.ie ee.org/scv-cas/" target="_blank" rel="nofollow noopener noreferrer">Circui ts and Systems Society (CASS)</a>&nbsp\;of the&nbsp\;<a href="http://sites .ieee.org/scv/" target="_blank" rel="nofollow noopener noreferrer">IEEE Sa nta Clara Valley Section</a></p>\n<h3>&nbsp\;</h3>\n<h2>PROGRAM:</h2>\n<p> 6:55 - 7:00 PM&nbsp\;Intro 7:00 - 7:50 PM&nbsp\;Lecture7:50 - 8:00 PM Q&am p\;A/Adjourn</p>\n<p>&nbsp\;</p>\n<h2>Abstract:</h2>\n<p>The electronic co mponents are increasing in automotive applications replacing earlier mecha nical and hydraulics solutions. With proper protection and diagnostics\, w e can ensure that these electronic components (power semiconductors/transi stors) perform the expected function and achieve fail silent (fault tolera nt) operation by sensing the fault and adapting its behavior. They also in corporate advanced and robust diagnostic circuits that provideinformation apriori for safety to the drivers/passengers in the cars about the load co nditions\, faults etc. Such components are referred to as the Smart Power Circuits. Their designs are not much different from the conventional analo g circuits used in consumer electronics topology wise. However\, they have to handle a wide range of input voltage (5V to 40V) and wide range of cur rents (30mA to 4A). There are additional system requirements and design im plementation challenges that have to be considered when defining and imple menting such circuits. This seminar/tutorial introduces the State-of-the-A rt requirements of automotive ICs\, design techniques\, R-L-C type of load s\, thermal simulations\, reliability and explains the various Gate Driver s like the high side driver\, low side driver configurable high side/low s ide drivers. Power supply sequencing\, level shifters\, charge pump\, volt age-current selector circuits will be presented. High voltage\, negative v oltage tolerant switches for diagnostics and impact of on chip parasitic b ipolar transistors in automotive applications are discussed.</p>\n<h2>Bio: </h2>\n<p>Dr. &ndash\;Ing Sri Navaneeth Easwaran\, Senior Member IEEE\, re ceived his Bachelor's (1998\, Bharathidasan University)\, Master's (2006\, University Twente) degrees in Electrical Engineering and Dr. &ndash\;Ing. degree from University of ErlangenNuremberg in 2017. He worked at SPIC El ectronics\, STMicroelectronics\, Philips Semiconductors between 1998 and 2 006. From 2006 he is with Texas Instruments (TI) where he was the design l ead for airbag squib driver ICs. He has also designed high voltage and -40 V tolerant circuits for automotive ICs. He is an IET Fellow (since Feb 202 1) and a TI Senior Member Technical Staff. He has 20+ granted patents and 15 publications. He has offered tutorials on Automotive design at IEEE Con ferences.</p>\n<h2>Zoom Broadcast:</h2>\n<p>Amit Jha is inviting you to a scheduled Zoom meeting.</p>\n<p>&nbsp\;</p>\n<p>Topic: Amit Jha's Zoom Mee ting</p>\n<p>Time: May 13\, 2021 07:00 PM Pacific Time (US and Canada)</p> \n<p>&nbsp\;</p>\n<p>Join Zoom Meeting</p>\n<p>https://us02web.zoom.us/j/8 9090589374?pwd=bG5uT2FuWGc1Q3lOVXJMUUZ2QnJGdz09</p>\n<p>&nbsp\;</p>\n<p>Me eting ID: 890 9058 9374</p>\n<p>Passcode: 315340</p>\n<p>One tap mobile</p >\n<p>+12532158782\,\,89090589374#\,\,\,\,*315340# US (Tacoma)</p>\n<p>+13 462487799\,\,89090589374#\,\,\,\,*315340# US (Houston)</p>\n<p>&nbsp\;</p> \n<p>Dial by your location</p>\n<p>+1 253 215 8782 US (Tacoma)</p>\n<p>+1 346 248 7799 US (Houston)</p>\n<p>+1 669 900 6833 US (San Jose)</p>\n<p>+1 312 626 6799 US (Chicago)</p>\n<p>+1 929 436 2866 US (New York)</p>\n<p>+ 1 301 715 8592 US (Washington DC)</p>\n<p>Meeting ID: 890 9058 9374</p>\n< p>Passcode: 315340</p>\n<p>Find your local number: https://us02web.zoom.us /u/keiRzTDt6Q</p>\n<p>&nbsp\;</p>\n<h2>Admission Fee:</h2>\n<p>All admissi ons free. Suggested donations:</p>\n<p>Non-IEEE:&nbsp\; $5\,&nbsp\;Student s (non-IEEE): $3\,&nbsp\;IEEE Members (not members of CASS or SSCS): $3</p > END:VEVENT END:VCALENDAR