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DTSTART:20210314T030000
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DTSTAMP:20210713T031005Z
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DTSTART;TZID=US/Pacific:20210630T183000
DTEND;TZID=US/Pacific:20210630T200000
DESCRIPTION:On June 30th the AP/MTT and ED/CAS Chapters of the IEEE Foothil
 l Section are hosting the Distinguished Microwave Lecture:\n\nWhat is My M
 easurement Equipment Actually Doing? Implications for 5G\n\nPresented by D
 r. Jon Martens\, Engineering Fellow at Anritsu.\n\nAs broadband microwave 
 measurements become more prevalent in the 100+ GHz range\, the limitations
  and challenges related to nonlinearities\, dynamic range\, calibration\, 
 and processing algorithms become topics that uW and mmW engineers must bet
 ter understand. This presentation shall discuss many of the "under the hoo
 d" tasks taking place in microwave instrumentation\, giving insights and u
 nderstanding into measurement sensitivities and potential anomalies.\n\nPl
 ease join us for this revealing and informative presentation.\n\nCo-sponso
 red by: IEEE Foothill Section\n\nSpeaker(s): Dr. Jon Martens\, \n\nAgenda:
  \n6:30-7:00PM : Networking and Introductions\n\n7:00-7:45PM : Technical P
 resentation by Dr. Jon Martens\n\n7:45-8:00PM : Questions and Closing Rema
 rks\n\nOntario\, California\, United States\, 91764\, Virtual: https://eve
 nts.vtools.ieee.org/m/272059
LOCATION:Ontario\, California\, United States\, 91764\, Virtual: https://ev
 ents.vtools.ieee.org/m/272059
ORGANIZER:wedge@ieee.org
SEQUENCE:13
SUMMARY:Inside Microwave Measurements with Dr. Jon Martens 
URL;VALUE=URI:https://events.vtools.ieee.org/m/272059
X-ALT-DESC:Description: <br /><p>On June 30th the AP/MTT and ED/CAS Chapter
 s of the IEEE Foothill Section are hosting the Distinguished Microwave Lec
 ture:</p>\n<p><span style="font-size: 14pt\;"><strong>What is My Measureme
 nt Equipment Actually Doing? </strong></span><span style="font-size: 14pt\
 ;"><strong>Implications for 5G</strong></span></p>\n<p><span style="font-s
 ize: 12pt\;">Presented by <strong>Dr. Jon Martens</strong>\, Engineering F
 ellow at Anritsu.</span></p>\n<p><span style="font-size: 12pt\;">As broadb
 and microwave measurements become more prevalent in the 100+ GHz range\, t
 he limitations and challenges related to nonlinearities\, dynamic range\, 
 calibration\, and processing algorithms become topics that uW and mmW engi
 neers must better understand. This presentation shall discuss many of the 
 "under the hood" tasks taking place in microwave instrumentation\, giving 
 insights and understanding into measurement sensitivities and potential an
 omalies.</span></p>\n<p><span style="font-size: 12pt\;">Please join us for
  this revealing and informative presentation.</span></p><br /><br />Agenda
 : <br /><p>6:30-7:00PM : Networking and Introductions</p>\n<p>7:00-7:45PM 
 : Technical Presentation by Dr. Jon Martens</p>\n<p>7:45-8:00PM : Question
 s and Closing Remarks</p>
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