BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/Argentina/Buenos_Aires BEGIN:DAYLIGHT DTSTART:20380119T001407 TZOFFSETFROM:-0300 TZOFFSETTO:-0300 RRULE:FREQ=YEARLY;BYDAY=3TU;BYMONTH=1 TZNAME:-03 END:DAYLIGHT BEGIN:STANDARD DTSTART:20090314T230000 TZOFFSETFROM:-0200 TZOFFSETTO:-0300 RRULE:FREQ=YEARLY;BYDAY=2SA;BYMONTH=3 TZNAME:-03 END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20220315T232406Z UID:BACA9441-F33E-4540-BCD3-290BA8139CB0 DTSTART;TZID=America/Argentina/Buenos_Aires:20210804T090000 DTEND;TZID=America/Argentina/Buenos_Aires:20210804T103000 DESCRIPTION:Jornada de la IEEE Instrumentation & Measurement Society (IMS)\ n\nEn el marco de la iniciativa en curso para establecer un Capitulo de la IEEE Instrumentation & Measurement Society (IMS) en la Sección Argentina \, invitamos a participar de la Jornada Técnica que se realizará el pró ximo miércoles 04 de agosto de 2021\, de 09:00 a 10:30 AM ARG (GMT-3)\, c on el siguiente programa.\n\n9:00 - 9:10 --- Bienvenida por parte de la Se cción Argentina\n9:10 - 9:25 --- H. Laiz - Relevance of metrology in qual ity and innovation and specific needs in Argentina\n\n9:25 - 9:45 --- S. B aglio - Presentation of the IEEE I&M Society\n\n9:45 - 10:30 --- D. Watzen ig - Technical lecture: State-of-play of autonomous vehicles along with a closer look to perception and multi-sensor fusion.\n• A basic introducti on to the sense-plan-act challenges of autonomous vehicles\n• Introducti on to the most common state-of-the-art sensors used in autonomous driving (radar\, camera\, lidar\, GPS\, odometry\, vehicle-2-x) in terms of benefi ts and disadvantages along with mathematical models of these sensors\n• Overview of different sensor data fusion taxonomies as well as different w ays to model the environment (dynamic object tracking vs. occupancy grid) in the Bayesian framework including uncertainty quantification\n• Exploi ting potential problems of sensor data fusion\, e.g. data association\, ou tlier treatment\, anomalies\, bias\, correlation\, or out-of-sequence meas urements\n• Propagation of uncertainties from object recognition to deci sion making based on selected examples\, e.g. the real-time vehicle pose e stimation based on uncertain measurements of different sources (GPS\, odom etry\, lidar) including the discussion of fault detection and localization (sensor drift\, breakdown\, outliers etc.)\n\nSobre los expositores:\n\nS alvatore Baglio\n\nIEEE Fellow\, Presidente de la IEEE Instrumentation & M easurement Society.\n\nProfesor y Rector de Investigación Científica\, U niversidad de Catania\, Sicilia - Italia.\nPresidente del Bio-nanotech Res earch and Innovation Tower\, Universidad de Catania.\nResponsable del MINT Lab (MIcro and Nano Transducers Lab).\nDepartamento di Ingeniería Eléctr ica\, Electrónica e Informática.\nUniversidad de Catania.\nhttps://ieee- ims.org/position/president\n\nDaniel Watzenig\nDistinguished Lecturer IEEE I&M Society.\n\nProfesor de Conducción Autónoma.\nInstituto de Automaci ón y Control.\nUniversidad Tecnológica de Graz.\nAustria.\n\nhttps://iee e-ims.org/contact/daniel-watzenig\n\nHéctor Laiz\nMiembro I&M en Argentin a desde 1991.\nGerente de Metrología y Calidad.\nInstituto Nacional de Te cnología Industrial (INTI).\nIntegrante del Consejo Directivo del Institu to Nacional de Normalización y Certificación (IRAM).\nSecretario Académ ico del Instituto de Calidad Industrial (INCALIN\, INTI-UNSAM).\nMiembro d el CIPM (International Committee for Weights and Measurements).\nEx presid ente del Sistema Interamericano de Metrología (SIM).\nhttps://www.linkedi n.com/in/hector-laiz-62367921/\n\n* * *\n(Este evento contó con 30 asiste ntes\, 8 miembros IEEE y 22 externos)\n\nAgenda: \nMiércoles 04 de agosto de 2021 - 09:00 a 10:30 AM ARG (GMT-3)\nInscripción\nLa asistencia a est e evento es libre y gratuita\, con inscripción previa a través de "Regis tration" (botón "Register Now") en este aviso\n[https://events.vtools.iee e.org/m/278525](https://events.vtools.ieee.org/tego_/event/manage/278525)\ nLas disertaciones de S. Baglio y D. Watzenig serán en idioma Inglés.\n* * * * *\n\nVirtual: https://events.vtools.ieee.org/m/278525 LOCATION:Virtual: https://events.vtools.ieee.org/m/278525 ORGANIZER:info@ieee.org.ar SEQUENCE:11 SUMMARY:IEEE AR - Jornada IMS - Technical Lecture "State-of-play of autonom ous vehicles" URL;VALUE=URI:https://events.vtools.ieee.org/m/278525 X-ALT-DESC:Description: <br /><div><span style="font-family: verdana\, gene va\, sans-serif\; font-size: 12pt\;"><strong>Jornada de la IEEE Instrument ation &amp\; Measurement Society (IMS)</strong></span></div>\n<div>&nbsp\; </div>\n<div><span style="font-family: verdana\, geneva\, sans-serif\; fon t-size: 12pt\;">En el marco de la iniciativa en curso para establecer un C apitulo de la <strong>IEEE Instrumentation &amp\; Measurement Society (IMS )</strong> en la Secci&oacute\;n Argentina\, invitamos a participar de la <strong>Jornada T&eacute\;cnica</strong> que se realizar&aacute\; el pr&oa cute\;ximo <strong>mi&eacute\;rcoles 04 de agosto de 2021\, de 09:00 a 10: 30 AM ARG</strong> (GMT-3)\, con el siguiente programa.</span></div>\n<div >&nbsp\;</div>\n<div>\n<div><span style="font-size: 12pt\; font-family: ve rdana\, geneva\, sans-serif\;">9:00 - 9:10 --- Bienvenida por parte de la Secci&oacute\;n Argentina </span></div>\n<div><span style="font-size: 12pt \; font-family: verdana\, geneva\, sans-serif\;">9:10 - 9:25 --- H. Laiz - Relevance of metrology in quality and innovation and specific needs in Ar gentina<br /></span></div>\n<div><span style="font-size: 12pt\; font-famil y: verdana\, geneva\, sans-serif\;">9:25 - 9:45 --- S. Baglio - Presentati on of the IEEE I&amp\;M Society<br /></span></div>\n<div><span style="font -size: 12pt\; font-family: verdana\, geneva\, sans-serif\;">9:45 - 10:30 - -- <strong>D. Watzenig - Technical lecture: State-of-play of autonomous ve hicles along with a closer look to perception and multi-sensor fusion.&nbs p\;</strong></span></div>\n<div><span style="font-size: 12pt\; font-family : verdana\, geneva\, sans-serif\;">&bull\; &nbsp\; &nbsp\;A basic introduc tion to the sense-plan-act challenges of autonomous vehicles&nbsp\;<br />& bull\; &nbsp\; &nbsp\;Introduction to the most common state-of-the-art sen sors used in autonomous driving (radar\, camera\, lidar\, GPS\, odometry\, vehicle-2-x) in terms of benefits and disadvantages along with mathematic al models of these sensors</span></div>\n<div><span style="font-size: 12pt \; font-family: verdana\, geneva\, sans-serif\;">&bull\; &nbsp\; &nbsp\;</ span><span style="font-size: 12pt\; font-family: verdana\, geneva\, sans-s erif\;">Overview of different sensor data fusion taxonomies as well as dif ferent ways to model the environment (dynamic object tracking vs. occupanc y grid) in the Bayesian framework including uncertainty quantification</sp an><span style="font-size: 12pt\; font-family: verdana\, geneva\, sans-ser if\;"><br />&bull\; &nbsp\; &nbsp\;Exploiting potential problems of sensor data fusion\, e.g. data association\, outlier treatment\, anomalies\, bia s\, correlation\, or out-of-sequence measurements&nbsp\;<br />&bull\; &nbs p\; &nbsp\;Propagation of uncertainties from object recognition to decisio n making based on selected examples\, e.g. the real-time vehicle pose esti mation based on uncertain measurements of different sources (GPS\, odometr y\, lidar) including the discussion of fault detection and localization (s ensor drift\, breakdown\, outliers etc.)&nbsp\;</span></div>\n<div>&nbsp\; </div>\n<div><span style="font-size: 12pt\;"><strong><span style="font-fam ily: verdana\, geneva\, sans-serif\;">Sobre los expositores:</span></stron g></span></div>\n<div><span style="font-size: 12pt\; font-family: verdana\ , geneva\, sans-serif\;">&nbsp\;</span></div>\n<div><span style="font-size : 12pt\; font-family: verdana\, geneva\, sans-serif\;"><strong>Salvatore B aglio</strong> <br /></span></div>\n<div><span style="font-family: verdana \, geneva\, sans-serif\; font-size: 12pt\;">IEEE Fellow\, Presidente de la IEEE Instrumentation &amp\;&nbsp\;Measurement Society.<br /></span></div> \n<div><span style="font-family: verdana\, geneva\, sans-serif\; font-size : 12pt\;">Profesor y Rector de Investigaci&oacute\;n Cient&iacute\;fica\,& nbsp\;Universidad de Catania\, Sicilia - Italia.</span></div>\n<div><span style="font-size: 12pt\; font-family: verdana\, geneva\, sans-serif\;">Pre sidente del Bio-nanotech Research and&nbsp\;Innovation Tower\, Universidad de Catania.</span></div>\n<div><span style="font-family: verdana\, geneva \, sans-serif\; font-size: 12pt\;">Responsable del MINTLab (MIcro and Nano Transducers Lab).<br />Departamento di Ingenier&iacute\;a El&eacute\;ctri ca\, Electr&oacute\;nica e Inform&aacute\;tica.<br />Universidad de Catani a.</span></div>\n<div><span style="font-size: 12pt\; font-family: verdana\ , geneva\, sans-serif\;"><a href="https://ieee-ims.org/position/president" target="_blank" rel="noopener">https://ieee-ims.org/position/president</a ></span></div>\n<div><span style="font-size: 12pt\; font-family: verdana\, geneva\, sans-serif\;">&nbsp\;</span></div>\n<div><span style="font-size: 12pt\;"><strong><span style="font-family: verdana\, geneva\, sans-serif\; ">Daniel Watzenig</span></strong></span></div>\n<div><span style="font-siz e: 12pt\; font-family: verdana\, geneva\, sans-serif\;">Distinguished Lect urer IEEE I&amp\;M Society.<br /></span></div>\n<div><span style="font-siz e: 12pt\; font-family: verdana\, geneva\, sans-serif\;">Profesor de Conduc ci&oacute\;n Aut&oacute\;noma.</span></div>\n<div><span style="font-size: 12pt\; font-family: verdana\, geneva\, sans-serif\;">Instituto de Automaci &oacute\;n y Control.</span></div>\n<div><span style="font-size: 12pt\; fo nt-family: verdana\, geneva\, sans-serif\;">Universidad Tecnol&oacute\;gic a de Graz.</span></div>\n<div><span style="font-size: 12pt\; font-family: verdana\, geneva\, sans-serif\;">Austria.<br /></span></div>\n<div><span s tyle="font-size: 12pt\; font-family: verdana\, geneva\, sans-serif\;"><a h ref="https://ieee-ims.org/contact/daniel-watzenig" target="_blank" rel="no opener">https://ieee-ims.org/contact/daniel-watzenig</a></span></div>\n<di v><span style="font-size: 12pt\;">&nbsp\;</span></div>\n<div><span style=" font-size: 12pt\;"><strong><span style="font-family: verdana\, geneva\, sa ns-serif\;">H&eacute\;ctor Laiz</span></strong></span></div>\n<div><span s tyle="font-family: verdana\, geneva\, sans-serif\; font-size: 12pt\;">Miem bro I&amp\;M en Argentina desde 1991.</span></div>\n<div><span style="font -family: verdana\, geneva\, sans-serif\; font-size: 12pt\;">Gerente de Met rolog&iacute\;a y Calidad.</span></div>\n<div><span style="font-family: ve rdana\, geneva\, sans-serif\; font-size: 12pt\;">Instituto Nacional de Tec nolog&iacute\;a Industrial (INTI).</span></div>\n<div><span style="font-fa mily: verdana\, geneva\, sans-serif\; font-size: 12pt\;">Integrante del Co nsejo Directivo del Instituto Nacional de Normalizaci&oacute\;n y Certific aci&oacute\;n (IRAM).</span></div>\n<div><span style="font-family: verdana \, geneva\, sans-serif\; font-size: 12pt\;">Secretario Acad&eacute\;mico d el Instituto de Calidad Industrial (INCALIN\, INTI-UNSAM).</span></div>\n< div><span style="font-family: verdana\, geneva\, sans-serif\; font-size: 1 2pt\;">Miembro del CIPM (International Committee for Weights and Measureme nts).</span></div>\n<div><span style="font-size: 12pt\; font-family: verda na\, geneva\, sans-serif\;"> Ex presidente del Sistema Interamericano de M etrolog&iacute\;a (SIM). </span></div>\n<div><span style="font-size: 12pt\ ; font-family: verdana\, geneva\, sans-serif\;"><a href="https://www.linke din.com/in/hector-laiz-62367921/" target="_blank" rel="noopener">https://w ww.linkedin.com/in/hector-laiz-62367921/</a></span></div>\n<div><span styl e="font-size: 12pt\;">&nbsp\;</span></div>\n<div><span style="font-size: 1 2pt\;">* * *&nbsp\;&nbsp\;</span></div>\n<div><span style="font-size: 12pt \; font-family: verdana\, geneva\, sans-serif\;">&nbsp\;(Este evento cont& oacute\; con 30 asistentes\, 8 miembros IEEE y 22 externos)</span></div>\n </div><br /><br />Agenda: <br /><p><span style="font-family: verdana\, gen eva\, sans-serif\; font-size: 12pt\;"><strong>Mi&eacute\;rcoles 04 de agos to de 2021 - 09:00 a 10:30 AM ARG (GMT-3)</strong></span></p>\n<div><span style="font-family: verdana\, geneva\, sans-serif\; font-size: 12pt\;"><st rong>Inscripci&oacute\;n</strong></span></div>\n<div><span style="font-siz e: 12pt\; font-family: verdana\, geneva\, sans-serif\;">La asistencia a es te evento es libre y gratuita\, con <strong>inscripci&oacute\;n previa</st rong> a trav&eacute\;s de "<em><strong>Registration</strong></em>" (bot&oa cute\;n "<em>Register Now</em>") en este aviso</span></div>\n<div><span st yle="font-family: verdana\, geneva\, sans-serif\; font-size: 12pt\;"><a ti tle="IEEE AR Jornada IMS" href="https://events.vtools.ieee.org/tego_/event /manage/278525" target="_blank" rel="noopener">https://events.vtools.ieee. org/m/278525</a></span></div>\n<div><span style="font-size: 12pt\; font-fa mily: verdana\, geneva\, sans-serif\;">Las disertaciones de S. Baglio y D. Watzenig ser&aacute\;n en idioma Ingl&eacute\;s.</span></div>\n<div><span style="font-size: 12pt\; font-family: verdana\, geneva\, sans-serif\;">* * * * *&nbsp\;</span></div> END:VEVENT END:VCALENDAR