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DTSTART:20211003T030000
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DTSTAMP:20211118T231704Z
UID:6B2B9804-C865-4BE4-B5A2-A96FAD209577
DTSTART;TZID=Australia/Sydney:20211022T200000
DTEND;TZID=Australia/Sydney:20211022T210000
DESCRIPTION:Current microwave and high frequency instrumentation perform ma
 ny tasks behind the scenes\, even more so in the mm-wave and high modulati
 on rate regimes that are critical for new communications\, imaging\, and r
 elated applications\, and it is easy to lose track of how the equipment\, 
 the processing algorithms\, the setup and the signals are interacting. By 
 exploring the measurement mechanics within some common instruments\, it ma
 y be easier to understand where sensitivities or anomalies might increase\
 , how to mitigate them and how the hardware has been evolving. Through a s
 tudy of example architectures and measurements\, including those in the 10
 0+ GHz range and those with wide modulation bandwidths where linearity\, d
 ynamic range and other physical metrics are stressed even more\, mechanism
 s and ideas for better measurements will be explored.\n\nSpeaker(s): IEEE 
 MTT DL: Dr Jon Martens\, \n\nVirtual: https://events.vtools.ieee.org/m/283
 179
LOCATION:Virtual: https://events.vtools.ieee.org/m/283179
ORGANIZER:syed.abbas@mq.edu.au
SEQUENCE:6
SUMMARY:What is my measurement equipment actually doing? Implications for 5
 G/6G\, mm-wave and related applications
URL;VALUE=URI:https://events.vtools.ieee.org/m/283179
X-ALT-DESC:Description: <br /><p>Current microwave and high frequency instr
 umentation perform many tasks behind the scenes\, even more so in the mm-w
 ave and high modulation rate regimes that are critical for new communicati
 ons\, imaging\, and related applications\, and it is easy to lose track of
  how the equipment\, the processing algorithms\, the setup and the signals
  are interacting.&nbsp\; By exploring the measurement mechanics within som
 e common instruments\, it may be easier to understand where sensitivities 
 or anomalies might increase\, how to mitigate them and how the hardware ha
 s been evolving.&nbsp\;&nbsp\; Through a study of example architectures an
 d measurements\, including those in the 100+ GHz range and those with wide
  modulation bandwidths where linearity\, dynamic range and other physical 
 metrics are stressed even more\, mechanisms and ideas for better measureme
 nts will be explored.</p>
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