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DTSTART;TZID=America/Vancouver:20211119T150000
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DESCRIPTION:Jon Martens\, Anritsu\n\nIEEE MTT Distinguished Microwave Lectu
 rer\n\nAbstract - Current microwave and high frequency instrumentation per
 form many tasks behind the scenes\, even more so in the mm-wave and high m
 odulation rate regimes that are critical for new communications\, imaging\
 , and related application\, and it is easy to lose track of how the equipm
 ent\, the processing algorithms\, the setup and the signals are interactin
 g. By exploring the measurement mechanics within some common instruments u
 nder practical conditions\, it may be easier to understand where sensitivi
 ties or anomalies might increase\, how to mitigate them and how the hardwa
 re has been evolving. Through a study of example architectures and measure
 ments\, including those in the 100+ GHz range and those with wide modulati
 on bandwidths where linearity\, dynamic range and other physical metrics a
 re stressed even more\, mechanisms and ideas for better measurements will 
 be explored.\n\nSpeaker(s): Jon Martens\, \n\nVancouver\, British Columbia
 \, Canada\, V6T 1Z4\, Virtual: https://events.vtools.ieee.org/m/289793
LOCATION:Vancouver\, British Columbia\, Canada\, V6T 1Z4\, Virtual: https:/
 /events.vtools.ieee.org/m/289793
ORGANIZER:dmichelson@ieee.org
SEQUENCE:6
SUMMARY:What is my measurement equipment actually doing?   Implications f
 or 5G/6G\, mm-wave and related applications
URL;VALUE=URI:https://events.vtools.ieee.org/m/289793
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;Jon Martens&lt;em&gt;\, Anritsu&lt;/em&gt;&lt;/p&gt;\n&lt;p&gt;&lt;em
 &gt;I&lt;/em&gt;&lt;em&gt;EEE MTT Distinguished Microwave Lecturer&lt;/em&gt;&lt;/p&gt;\n&lt;p&gt;&lt;em&gt;Abstr
 act&lt;/em&gt; - Current microwave and high frequency instrumentation perform ma
 ny tasks behind the scenes\, even more so in the mm-wave and high modulati
 on rate regimes that are critical for new communications\, imaging\, and r
 elated application\, and it is easy to lose track of how the equipment\, t
 he processing algorithms\, the setup and the signals are interacting.&amp;nbsp
 \; By exploring the measurement mechanics within some common instruments u
 nder practical conditions\, it may be easier to understand where sensitivi
 ties or anomalies might increase\, how to mitigate them and how the hardwa
 re has been evolving.&amp;nbsp\;&amp;nbsp\; Through a study of example architectur
 es and measurements\, including those in the 100+ GHz range and those with
  wide modulation bandwidths where linearity\, dynamic range and other phys
 ical metrics are stressed even more\, mechanisms and ideas for better meas
 urements will be explored.&lt;/p&gt;
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