BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:US/Eastern BEGIN:DAYLIGHT DTSTART:20220313T030000 TZOFFSETFROM:-0500 TZOFFSETTO:-0400 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:EDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20211107T010000 TZOFFSETFROM:-0400 TZOFFSETTO:-0500 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:EST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20221123T030540Z UID:B71D1392-E02A-4FE8-8CD3-4772EBBA26FB DTSTART;TZID=US/Eastern:20220228T110000 DTEND;TZID=US/Eastern:20220228T130000 DESCRIPTION:This presentation will begin with a general discussion on the c urrent landscape of THz research and development. In particular\, the stat e-of-the-art of MHz-through-THz material characterization will be briefly reviewed. Subsequently\, two groups of free-space THz measurement techniqu es will be described for accurate material characterization and parametric extraction in connection with frequency independent optical paths. Quasi- optical mirror and lens systems are studied and developed over THz range t o achieve precision complex permittivity measurements of dielectric substr ates\, films\, and materials. To achieve a wide plane wave zone for the ce nter of four-parabolic-mirror systems\, two corrugated horns are designed and fabricated for the measurement systems. The Gaussicity of the corrugat ed horn is larger than 97.4%. For the proposed multiple reflection model a nd direct wave model\, a set of closed-form expressions of loss tangent ar e derived from transmission parameters of the measurement systems. The res olution and uncertainty of loss tangent are examined according to the work ing frequency\, the thickness of wafer or substrate\, the real part of rel ative permittivity\, and the transmission measurement uncertainty. The com plex permittivity of Rogers/Duroid series PCB substrates\, which are commo nly used at microwave frequencies\, and silicon wafers are measured over T Hz ranges.\n\nCo-sponsored by: STARaCOM (Montreal)\n\nSpeaker(s): Ke Wu\, \n\nAgenda: \n10:45 AM - 10:55 AM: Opening the workshop\, Mansour Naslcher aghi\, Chair of YP Montreal\n\n10:55 AM - 11:05 AM: Workshop and Speaker i ntroduction by chair of Terahertz Days workshop Series\, Dr. Gunes Karabul ut Kurt\n\n11:05 AM - 12:05 PM: Talk by Prof. Ke Wu\n\n12:05 PM - 12:45 PM : Q & A session\n\nMontreal\, Quebec\, Canada\, Virtual: https://events.vt ools.ieee.org/m/303374 LOCATION:Montreal\, Quebec\, Canada\, Virtual: https://events.vtools.ieee.o rg/m/303374 ORGANIZER:mansour.nch@ieee.org SEQUENCE:3 SUMMARY:Accurate Material Characterization over THz Frequency Range URL;VALUE=URI:https://events.vtools.ieee.org/m/303374 X-ALT-DESC:Description: <br /><p>This presentation will begin with a genera l discussion on the current landscape of THz research and development.&nbs p\; In particular\, the state-of-the-art of MHz-through-THz material chara cterization will be briefly reviewed. Subsequently\, two groups of free-sp ace THz measurement techniques will be described for accurate material cha racterization and parametric extraction in connection with frequency indep endent optical paths. Quasi-optical mirror and lens systems are studied an d developed over THz range to achieve precision complex permittivity measu rements of dielectric substrates\, films\, and materials. To achieve a wid e plane wave zone for the center of four-parabolic-mirror systems\, two co rrugated horns are designed and fabricated for the measurement systems. Th e Gaussicity of the corrugated horn is larger than 97.4%. For the proposed multiple reflection model and direct wave model\, a set of closed-form ex pressions of loss tangent are derived from transmission parameters of the measurement systems. The resolution and uncertainty of loss tangent are ex amined according to the working frequency\, the thickness of wafer or subs trate\, the real part of relative permittivity\, and the transmission meas urement uncertainty. The complex permittivity of Rogers/Duroid series PCB substrates\, which are commonly used at microwave frequencies\, and silico n wafers are measured over THz ranges.</p><br /><br />Agenda: <br /><p><st rong>10:45 AM - 10:55 AM:&nbsp\; </strong>Opening the workshop\, <strong>M ansour Naslcheraghi</strong>\, Chair of YP Montreal</p>\n<p><strong>10:55 AM - 11:05 AM:&nbsp\; </strong>Workshop and Speaker introduction by chair of <span style="color: #169179\;"><strong>Terahertz Days workshop Series\, </strong></span> <strong>Dr. Gunes Karabulut Kurt</strong></p>\n<p><strong >11:05 AM - 12:05 PM:&nbsp\; <span style="color: #169179\;">Talk</span></s trong> by Prof. <strong>Ke Wu<br /></strong></p>\n<p><strong>12:05 PM - 12 :45 PM:&nbsp\; <span style="color: #169179\;">Q &amp\; A</span></strong> s ession</p> END:VEVENT END:VCALENDAR