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PRODID:IEEE vTools.Events//EN
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TZID:Europe/Paris
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DTSTART:20210328T030000
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TZOFFSETTO:+0200
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DTSTART:20211031T020000
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DTSTAMP:20220301T083248Z
UID:69AAEC35-5012-464B-ADC6-D9D697F09C10
DTSTART;TZID=Europe/Paris:20211004T091700
DTEND;TZID=Europe/Paris:20211008T091700
DESCRIPTION:Managing and organizing the session Silicon power devices\, IGB
 Ts\, thyristors Reliability at the 32th European Symposium on Reliability 
 of Electron Devices\, Failure Physics and Analysis\, 2021 (ESREF 2021)\n\n
 12 contributions\n\nCo-sponsored by: ETH Zurich\n\nBordeaux\, Aquitaine\, 
 France\, Virtual: https://events.vtools.ieee.org/m/306711
LOCATION:Bordeaux\, Aquitaine\, France\, Virtual: https://events.vtools.iee
 e.org/m/306711
ORGANIZER:ciappa@iis.ee.ethz.ch
SEQUENCE:0
SUMMARY:Silicon power devices\, IGBTs\, thyristors Reliability
URL;VALUE=URI:https://events.vtools.ieee.org/m/306711
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;Managing and organizing the session Silico
 n power devices\, IGBTs\, thyristors Reliability at the 32th European Symp
 osium on Reliability of Electron Devices\, Failure Physics and Analysis\, 
 2021 (ESREF 2021)&lt;/p&gt;\n&lt;p&gt;12 contributions&lt;/p&gt;
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