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DTSTART:20220327T030000
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DTSTAMP:20221127T105751Z
UID:DCC081AD-F531-484F-8F7F-3C7B53EBF3B8
DTSTART;TZID=Europe/Zurich:20220922T170000
DTEND;TZID=Europe/Zurich:20220922T180000
DESCRIPTION:Current microwave and high frequency instrumentation perform ma
 ny tasks behind the scenes\, even more so in the mm-wave and high modulati
 on rate regimes\, and it is easy to lose track of how the equipment\, the 
 processing algorithms\, the setup and the signals are interacting. By expl
 oring the measurement mechanics within some common instruments under pract
 ical conditions\, it may be easier to understand where sensitivities or an
 omalies might increase and how to mitigate them. Through a study of exampl
 e architectures and measurements\, including those in the 100+ GHz range a
 nd those with wide modulation bandwidths where linearity\, dynamic range a
 nd other physical metrics are stressed even more\, mechanisms and ideas fo
 r better measurements will be explored.\n\nSpeaker(s): Dr. Jon Martens\, \
 n\nVirtual: https://events.vtools.ieee.org/m/314015
LOCATION:Virtual: https://events.vtools.ieee.org/m/314015
ORGANIZER:mohammad.azadifar@epfl.ch
SEQUENCE:7
SUMMARY:WHAT IS MY MEASUREMENT EQUIPMENT ACTUALLY DOING? Implications for 5
 G/6G\, mm-wave and related applications
URL;VALUE=URI:https://events.vtools.ieee.org/m/314015
X-ALT-DESC:Description: <br /><p>Current microwave and high frequency instr
 umentation perform many tasks behind the scenes\, even more so in the mm-w
 ave and high modulation rate regimes\, and it is easy to lose track of how
  the equipment\, the processing algorithms\, the setup and the signals are
  interacting.&nbsp\; By exploring the measurement mechanics within some co
 mmon instruments under practical conditions\, it may be easier to understa
 nd where sensitivities or anomalies might increase and how to mitigate the
 m.&nbsp\;&nbsp\; Through a study of example architectures and measurements
 \, including those in the 100+ GHz range and those with wide modulation ba
 ndwidths where linearity\, dynamic range and other physical metrics are st
 ressed even more\, mechanisms and ideas for better measurements will be ex
 plored.</p>
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