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PRODID:IEEE vTools.Events//EN
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TZID:America/New_York
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DTSTART:20220313T030000
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DTSTART:20221106T010000
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BEGIN:VEVENT
DTSTAMP:20220615T162152Z
UID:C4CC660F-11AD-4483-8A40-EC83CFD6A54E
DTSTART;TZID=America/New_York:20220610T150000
DTEND;TZID=America/New_York:20220610T160000
DESCRIPTION:This Friday 3 pm is open to students (primarily Air Force Insti
 tute of Technology\, but all invited) presenting a 15 min (or so) talk on 
 what interests them. Open to any & all students\, so pass the word. This i
 s a good place for young folks to teach something new to old folks who sti
 ll like to learn\, & / or forgot what it was like to be young.\n\nCo-spons
 ored by: Wright-Patt Multi-Intelligence Development Consortium (WPMDC)\, T
 he DOD & DOE Communities\n\nSpeaker(s): Mike Ingold\, Mike Ingold\n\nAgend
 a: \n• Mike Ingold on: Radar cross-section measurements using electromag
 netic missile sources\, may go next week\, so we can take another today.\n
 \n• Eric Fairchild on: Effect of Gate Leakage Current on GaN HEMT COTS R
 eliability under DC and RF Stress Conditions\n\nVirtual: https://events.vt
 ools.ieee.org/m/316699
LOCATION:Virtual: https://events.vtools.ieee.org/m/316699
ORGANIZER:a.j.terzuoli@ieee.org
SEQUENCE:2
SUMMARY:Weekly "Inverted Conference" Seminar in Remote Sensing & Communicat
 ion
URL;VALUE=URI:https://events.vtools.ieee.org/m/316699
X-ALT-DESC:Description: <br /><p><strong>This Friday 3 pm is open to studen
 ts (primarily Air Force Institute of Technology\, but all invited) present
 ing a 15 min (or so) talk on what interests them.&nbsp\; Open to any &amp\
 ; all students\, so pass the word.&nbsp\; This is a good place for young f
 olks to teach something new to old folks who still like to learn\, &amp\; 
 / or forgot what it was like to be young.</strong></p><br /><br />Agenda: 
 <br /><p class="x_MsoNormal"><strong>&bull\; Mike Ingold on: Radar cross-s
 ection measurements using electromagnetic missile sources\, may go next we
 ek\, so we can take another today.</strong></p>\n<p class="x_MsoNormal"><s
 trong>&bull\; Eric Fairchild on: Effect of Gate Leakage Current on GaN HEM
 T COTS Reliability under DC and RF Stress Conditions</strong></p>
END:VEVENT
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