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DTSTAMP:20220918T192515Z
UID:E94E2547-2406-4428-B430-D791C2C5655E
DTSTART;TZID=America/New_York:20220915T180000
DTEND;TZID=America/New_York:20220915T190000
DESCRIPTION:Current microwave and high frequency instrumentation perform ma
 ny tasks behind the scenes\, even more so in the mm-wave and high modulati
 on rate regimes\, and it is easy to lose track of how the equipment\, the 
 processing algorithms\, the setup and the signals are interacting. By expl
 oring the measurement mechanics within some common instruments under pract
 ical conditions\, it may be easier to understand where sensitivities or an
 omalies might increase and how to mitigate them. Through a study of exampl
 e architectures and measurements\, including those in the 100+ GHz range a
 nd those with wide modulation bandwidths where linearity\, dynamic range a
 nd other physical metrics are stressed even more\, mechanisms and ideas fo
 r better measurements will be explored.\n\nSpeaker(s): IEEE MTT Distinguis
 hed Microwave Lecturer Dr. Jon Martens of Anritsu\, \n\nAgenda: \n5:45pm: 
 Log in to WebEx and wait to be admitted\;\n\n6:00pm: Presentation\;\n\n7:0
 0pm: Q&A and discussion\;\n\nVirtual: https://events.vtools.ieee.org/m/322
 424
LOCATION:Virtual: https://events.vtools.ieee.org/m/322424
ORGANIZER:menders@ieee.org
SEQUENCE:6
SUMMARY:What is my measurement equipment actually doing? Implications for 5
 G/6G\, mm-wave and related applications
URL;VALUE=URI:https://events.vtools.ieee.org/m/322424
X-ALT-DESC:Description: <br /><p>Current microwave and high frequency instr
 umentation perform many tasks behind the scenes\, even more so in the mm-w
 ave and high modulation rate regimes\, and it is easy to lose track of how
  the equipment\, the processing algorithms\, the setup and the signals are
  interacting.&nbsp\; By exploring the measurement mechanics within some co
 mmon instruments under practical conditions\, it may be easier to understa
 nd where sensitivities or anomalies might increase and how to mitigate the
 m.&nbsp\;&nbsp\; Through a study of example architectures and measurements
 \, including those in the 100+ GHz range and those with wide modulation ba
 ndwidths where linearity\, dynamic range and other physical metrics are st
 ressed even more\, mechanisms and ideas for better measurements will be ex
 plored.</p><br /><br />Agenda: <br /><p>5:45pm: Log in to WebEx and wait t
 o be admitted\;</p>\n<p><strong>6:00pm: Presentation\;</strong></p>\n<p>7:
 00pm: Q&amp\;A and discussion\;</p>
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