BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:US/Pacific BEGIN:DAYLIGHT DTSTART:20220313T030000 TZOFFSETFROM:-0800 TZOFFSETTO:-0700 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:PDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20221106T010000 TZOFFSETFROM:-0700 TZOFFSETTO:-0800 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:PST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20221208T053802Z UID:1E493AA6-FE5F-4AD2-9B3C-AEC322E025D5 DTSTART;TZID=US/Pacific:20221027T110000 DTEND;TZID=US/Pacific:20221027T120000 DESCRIPTION:Power Management circuits are employed in almost all electronic equipment and they have energy storage elements (capacitors and inductors ) as building blocks along with other active circuitry. Power management c ircuits employ feedback to achieve load and line regulation and the feedba ck loop is designed at an operating point and component values are chosen to meet that design requirements. However the capacitors and inductors are subject to variations due to temperature\, aging and load stress. Due to these variations\, the feedback loop can cross its robustness margins and can lead to degraded performance and potential instability. Another issue in power management circuits is the measurement of their frequency respons e for stability assessment. The standard techniques used in production tes t environment require expensive measurement equipment (Network Analyzer) a nd time. These two issues of component variations and frequency response m easurement can be addressed if the frequency response of the power convert er is used as measure of component (capacitor and inductor) variations.\n\ nIn this presentation\, techniques to track changes in the dynamic loop ch aracteristics of the DC-DC converters without disturbing the normal mode o f operation is presented. A digital pseudo-noise (PN) based stimulus is us ed to excite the DC-DC system at various circuit nodes to calculate the co rresponding closed-loop impulse response. The test signal energy is spread over a wide bandwidth and the signal analysis is achieved by correlating the PN input sequence with the disturbed output generated\, thereby accumu lating the desired behavior over time. A mixed-signal cross-correlation ci rcuit is used to derive on-chip impulse responses\, with smaller memory an d lower computational requirement in comparison to a digital correlator ap proach. Model reference based parametric and non-parametric techniques are discussed to analyze the impulse response results in both time and freque ncy domain. The proposed techniques can extract open-loop phase margin and closed-loop unity-gain frequency within 5.2% and 4.1% error\, respectivel y\, for the load current range of 30-200mA. Converter parameters such as n atural frequency (ωn)\, quality factor (Q)\, and center frequency (ωc) c an be estimated within 3.6%\, 4.7%\, and 3.8% error respectively\, over lo ad inductance of 4.7-10.3µH\, and filter capacitance of 200- 400nF.\n\nSp eaker(s): Dr. Bertan Bakkaloglu\, \n\nVirtual: https://events.vtools.ieee. org/m/324633 LOCATION:Virtual: https://events.vtools.ieee.org/m/324633 ORGANIZER:kishan.g.joshi@gmail.com SEQUENCE:7 SUMMARY:Disturbance-Free Built-In Self-Test Techniques for Loop Characteriz ation of DC-DC Converters and LDOs URL;VALUE=URI:https://events.vtools.ieee.org/m/324633 X-ALT-DESC:Description: <br /><p>Power Management circuits are employed in almost all electronic equipment and they have energy storage elements (cap acitors and inductors) as building blocks along with other active circuitr y. Power management circuits employ feedback to achieve load and line regu lation and the feedback loop is designed at an operating point and compone nt values are chosen to meet that design requirements. However the capacit ors and inductors are subject to variations due to temperature\, aging and load stress. Due to these variations\, the feedback loop can cross its ro bustness margins and can lead to degraded performance and potential instab ility. Another issue in power management circuits is the measurement of th eir frequency response for stability assessment. The standard techniques u sed in production test environment require expensive measurement equipment (Network Analyzer) and time. These two issues of component variations and frequency response measurement can be addressed if the frequency response of the power converter is used as measure of component (capacitor and ind uctor) variations.</p>\n<p>In this presentation\, techniques to track chan ges in the dynamic loop characteristics of the DC-DC converters without di sturbing the normal mode of operation is presented. A digital pseudo-noise (PN) based stimulus is used to excite the DC-DC system at various circuit nodes to calculate the corresponding closed-loop impulse response. The te st signal energy is spread over a wide bandwidth and the signal analysis i s achieved by correlating the PN input sequence with the disturbed output generated\, thereby accumulating the desired behavior over time. A mixed-s ignal cross-correlation circuit is used to derive on-chip impulse response s\, with smaller memory and lower computational requirement in comparison to a digital correlator approach. Model reference based parametric and non -parametric techniques are discussed to analyze the impulse response resul ts in both time and frequency domain. The proposed techniques can extract open-loop phase margin and closed-loop unity-gain frequency within 5.2% an d 4.1% error\, respectively\, for the load current range of 30-200mA. Conv erter parameters such as natural frequency (&omega\;n)\, quality factor (Q )\, and center frequency (&omega\;c) can be estimated within 3.6%\, 4.7%\, and 3.8% error respectively\, over load inductance of 4.7-10.3&micro\;H\, and filter capacitance of 200- 400nF.</p> END:VEVENT END:VCALENDAR