BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:Asia/Kolkata
BEGIN:STANDARD
DTSTART:19451014T230000
TZOFFSETFROM:+0630
TZOFFSETTO:+0530
TZNAME:IST
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20221021T143847Z
UID:81C0BCC9-1AAC-4872-8E02-DE2FD27CCE35
DTSTART;TZID=Asia/Kolkata:20221017T102600
DTEND;TZID=Asia/Kolkata:20221018T102600
DESCRIPTION:IEEE Electron Device Society-Delhi Chapter\n&amp;\nDepartment of El
 ectronic Science\, University of Delhi South Campus\n\nJointly Organizes\n
 Training Program on New Measurement Technologies and Simulation Techniques
  in Electronics\nOctober 17-18\, 2022\n\n- NO REGISTRATION FEES.\n\n- LIMI
 TED SEATS (30) TO BE FILLED ON FIRST-CUM-FIRST SERVE BASIS.\n\n- Intereste
 d faculty members/Research Scholars/PG students are requested to FILL THE 
 FORM https://docs.google.com/forms/d/e/1FAIpQLSem3Z86V9QxGqJ4diM3Fs3oGaXIA
 8RsYRhBftjxtUtveBVhIg/viewform ON OR BEFORE OCTOBER 07\,2022\n- SELECTED C
 ANDIDATES SHALL BE INFORMED VIA EMAIL ON OR BEFORE OCTOBER 11\, 2022.\n\nP
 athWave ADS offers integrated design guidance via templates to help you ge
 t started faster. Extensive component libraries make it easy to find the p
 art you want. Automatic sync with layout allows you to visualize the physi
 cal layout while making schematic designs.\n• Achieve design success wit
 h a complete desktop flow.\n• Easily integrate with PathWave electromagn
 etic simulators.\n• Share and manage workspaces across teams.\n• Model
  nonlinear designs with X-parameters*.\n• Incorporate leading foundry an
 d industry designs.\n• Increase yield with optimization cockpit and data
  display.\n\nSemiconductor Device Parameter Analyzer - The Keysight B1500A
  semiconductor parameter analyzer is an all-in-one device characterization
  analyzer supporting IV\, CV\, pulse/dynamic IV and more. The mainframe an
 d plug-in modules enable the characterization of most electronic devices\,
  as well as materials\, semiconductors\, and active/passive components. It
  provides a wide range of measurement capabilities to cover the electrical
  characterization and evaluation of devices\, materials\, semiconductors\,
  active/passive components\, or virtually any other type of electronic dev
 ice with uncompromised measurement reliability and efficiency.\n\nKeysight
  vector network analyzers are used to characterize and test active compone
 nts\, such as amplifiers\, mixers\, and frequency converters. They can eas
 ily measure commonly specified amplifier parameters such as gain\, gain an
 d phase compression\, isolation\, return loss\, and group delay. Analysis 
 of harmonic distortion helps to understand an amplifier’s nonlinear beha
 vior and requires the receiver to be tuned at a different frequency from t
 he source. Frequency-translating devices\, such as mixers and frequency co
 nverters present unique measurement challenges because their input and out
 put frequencies are different. Network analyzers used for testing these de
 vices need to have a frequency-offset mode (FOM) to detect output frequenc
 ies different from the input.\n\nCo-sponsored by: Department of Electronic
  Science University of Delhi South Campus\, New Delhi\, India\n\nAgenda: \
 nOctober 17\, 2022\n\n- Morning session: Demonstration of Test bench of Ke
 ysight with the virtual/remote access facility\n- Afternoon Session: ADS-K
 eysight trainingprogram along with RF &amp; Microwave Fundamentals\n\nOctober 
 18\, 2022\n\n- Morning session : Parametric analyser (DC IV\, PULSE IV\, T
 ransient and CV Measurement)\n- Afternoon Session : Vector network analyse
 r (Using VNAs for S-parameter Measurements\, load-pull measurement\, noise
  measurement)\n\nBldg: University of Delhi South Campus\, Department of El
 ectronic Science\, Benito Juarez Marg\, South Campus\, South Moti Bagh\, N
 ew Delhi\, Delhi\, New Delhi\, Delhi\, India\, 110021
LOCATION:Bldg: University of Delhi South Campus\, Department of Electronic 
 Science\, Benito Juarez Marg\, South Campus\, South Moti Bagh\, New Delhi\
 , Delhi\, New Delhi\, Delhi\, India\, 110021
ORGANIZER:msaxena@ieee.org
SEQUENCE:3
SUMMARY:Training Program on New Measurement Technologies and Simulation Tec
 hniques in Electronics
URL;VALUE=URI:https://events.vtools.ieee.org/m/326371
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;IEEE Electron Device Society-Delhi Chapter
 &lt;br /&gt;&amp;amp\;&lt;br /&gt;Department of Electronic Science\, University of Delhi S
 outh Campus &amp;nbsp\; &amp;nbsp\;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;Jointly Organizes&lt;br /&gt;Training
  Program on New Measurement Technologies and Simulation Techniques in Elec
 tronics&lt;br /&gt;October 17-18\, 2022&lt;/p&gt;\n&lt;ul&gt;\n&lt;li&gt;&lt;strong&gt;NO REGISTRATION F
 EES.&lt;br /&gt;&lt;/strong&gt;&lt;/li&gt;\n&lt;li&gt;&lt;span style=&quot;font-family: arial\, sans-serif
 \;&quot;&gt;&lt;strong&gt;LIMITED SEATS (30) TO BE FILLED ON FIRST-CUM-FIRST SERVE BASIS
 .&lt;/strong&gt;&lt;/span&gt;&lt;/li&gt;\n&lt;/ul&gt;\n&lt;ul&gt;\n&lt;li&gt;&lt;span style=&quot;font-family: arial\,
  sans-serif\;&quot;&gt;Interested faculty members/Research Scholars/PG students ar
 e requested to FILL THE FORM &lt;a href=&quot;https://docs.google.com/forms/d/e/1F
 AIpQLSem3Z86V9QxGqJ4diM3Fs3oGaXIA8RsYRhBftjxtUtveBVhIg/viewform&quot; target=&quot;_
 blank&quot; rel=&quot;noopener&quot; data-saferedirecturl=&quot;https://www.google.com/url?q=h
 ttps://docs.google.com/forms/d/e/1FAIpQLSem3Z86V9QxGqJ4diM3Fs3oGaXIA8RsYRh
 BftjxtUtveBVhIg/viewform&amp;amp\;source=gmail&amp;amp\;ust=1665032005445000&amp;amp\;
 usg=AOvVaw3MbXIUCEhb8y7LEsRbYmr-&quot;&gt;https://docs.google.com/&lt;wbr /&gt;forms/d/e
 /&lt;wbr /&gt;1FAIpQLSem3Z86V9QxGqJ4diM3Fs3o&lt;wbr /&gt;GaXIA8RsYRhBftjxtUtveBVhIg/&lt;w
 br /&gt;viewform&lt;/a&gt;&amp;nbsp\;&lt;strong&gt;&lt;u&gt;ON OR BEFORE OCTOBER 07\,2022&lt;/u&gt;&lt;/stro
 ng&gt;&lt;/span&gt;&lt;/li&gt;\n&lt;li&gt;&lt;span style=&quot;font-family: arial\, sans-serif\;&quot;&gt;SELEC
 TED CANDIDATES SHALL BE INFORMED VIA EMAIL ON OR BEFORE OCTOBER 11\, 2022.
 &lt;/span&gt;&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p&gt;&lt;strong&gt;PathWave ADS&lt;/strong&gt; offers integrated de
 sign guidance via templates to help you get started faster. Extensive comp
 onent libraries make it easy to find the part you want. Automatic sync wit
 h layout allows you to visualize the physical layout while making schemati
 c designs.&amp;nbsp\;&lt;br /&gt;&amp;bull\; &amp;nbsp\; &amp;nbsp\;Achieve design success with 
 a complete desktop flow.&lt;br /&gt;&amp;bull\; &amp;nbsp\; &amp;nbsp\;Easily integrate with
  PathWave electromagnetic simulators.&lt;br /&gt;&amp;bull\; &amp;nbsp\; &amp;nbsp\;Share an
 d manage workspaces across teams.&lt;br /&gt;&amp;bull\; &amp;nbsp\; &amp;nbsp\;Model nonlin
 ear designs with X-parameters*.&lt;br /&gt;&amp;bull\; &amp;nbsp\; &amp;nbsp\;Incorporate le
 ading foundry and industry designs.&lt;br /&gt;&amp;bull\; &amp;nbsp\; &amp;nbsp\;Increase y
 ield with optimization cockpit and data display.&lt;/p&gt;\n&lt;p&gt;&lt;br /&gt;&lt;strong&gt;Sem
 iconductor Device Parameter Analyzer&lt;/strong&gt; - The Keysight B1500A semico
 nductor parameter analyzer is an all-in-one device characterization analyz
 er supporting IV\, CV\, pulse/dynamic IV and more. The mainframe and plug-
 in modules enable the characterization of most electronic devices\, as wel
 l as materials\, semiconductors\, and active/passive components. It provid
 es a wide range of measurement capabilities to cover the electrical charac
 terization and evaluation of devices\, materials\, semiconductors\, active
 /passive components\, or virtually any other type of electronic device wit
 h uncompromised measurement reliability and efficiency.&lt;/p&gt;\n&lt;p&gt;&lt;br /&gt;&lt;str
 ong&gt;Keysight vector network analyzers&lt;/strong&gt; are used to characterize an
 d test active components\, such as amplifiers\, mixers\, and frequency con
 verters. They can easily measure commonly specified amplifier parameters s
 uch as gain\, gain and phase compression\, isolation\, return loss\, and g
 roup delay. Analysis of harmonic distortion helps to understand an amplifi
 er&amp;rsquo\;s nonlinear behavior and requires the receiver to be tuned at a 
 different frequency from the source. Frequency-translating devices\, such 
 as mixers and frequency converters present unique measurement challenges b
 ecause their input and output frequencies are different. Network analyzers
  used for testing these devices need to have a frequency-offset mode (FOM)
  to detect output frequencies different from the input.&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p
 &gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;&lt;strong&gt;October 17\, 2022&lt;/strong&gt;&lt;/p&gt;\n&lt;ul&gt;
 \n&lt;li&gt;Morning session: Demonstration of Test bench of Keysight with the vi
 rtual/remote access facility&lt;/li&gt;\n&lt;li&gt;Afternoon Session:&amp;nbsp\;ADS-Keysig
 ht&amp;nbsp\;trainingprogram along with RF &amp;amp\; Microwave Fundamentals&lt;/li&gt;\
 n&lt;/ul&gt;\n&lt;p&gt;&lt;strong&gt;October 18\, 2022&lt;/strong&gt;&lt;/p&gt;\n&lt;ul&gt;\n&lt;li&gt;Morning sessi
 on : Parametric analyser (DC IV\, PULSE IV\, Transient and CV Measurement)
 &lt;/li&gt;\n&lt;li&gt;Afternoon Session : Vector network analyser (Using VNAs for S-p
 arameter Measurements\, load-pull measurement\, noise measurement)&lt;/li&gt;\n&lt;
 /ul&gt;
END:VEVENT
END:VCALENDAR

