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DTSTART:20230326T030000
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DTSTAMP:20221207T092654Z
UID:8ABD51BD-D801-4FFA-B42E-644D181B43E3
DTSTART;TZID=Europe/Warsaw:20221206T160000
DTEND;TZID=Europe/Warsaw:20221206T170000
DESCRIPTION:Current microwave and high frequency instrumentation perform ma
 ny tasks behind the scenes\, even more so in the mm-wave and high modulati
 on rate regimes that are critical for new communications\, imaging\, and r
 elated application\, and it is easy to lose track of how the equipment\, t
 he processing algorithms\, the setup/environment and the signals are inter
 acting. By exploring the measurement mechanics within some common instrume
 nts under practical conditions\, it may be easier to understand where sens
 itivities or anomalies might increase\, how to mitigate them and how the h
 ardware has been evolving. Through a study of example architectures and me
 asurements\, including those in the 100+ GHz range and those with wide mod
 ulation bandwidths where linearity\, dynamic range and other physical metr
 ics are stressed even more\, mechanisms and ideas for better measurements 
 will be explored.\n\nSpeaker(s): Jon Martens \, \n\nGdansk\, Pomorskie\, P
 oland\, Virtual: https://events.vtools.ieee.org/m/332913
LOCATION:Gdansk\, Pomorskie\, Poland\, Virtual: https://events.vtools.ieee.
 org/m/332913
ORGANIZER:krzysztof.nyka@pg.edu.pl
SEQUENCE:2
SUMMARY:What is my measurement equipment actually doing? Implications for 5
 G/6G\, mm-wave and related applications
URL;VALUE=URI:https://events.vtools.ieee.org/m/332913
X-ALT-DESC:Description: <br /><p><span style="font-size: 10.0pt\; font-fami
 ly: 'Arial'\,sans-serif\; color: #181818\; background: white\;">Current mi
 crowave and high frequency instrumentation perform many tasks behind the s
 cenes\, even more so in the mm-wave and high modulation rate regimes that 
 are critical for new communications\, imaging\, and related application\, 
 and it is easy to lose track of how the equipment\, the processing algorit
 hms\, the setup/environment and the signals are interacting.&nbsp\; By exp
 loring the measurement mechanics within some common instruments under prac
 tical conditions\, it may be easier to understand where sensitivities or a
 nomalies might increase\, how to mitigate them and how the hardware has be
 en evolving.&nbsp\; Through a study of example architectures and measureme
 nts\, including those in the 100+ GHz range and those with wide modulation
  bandwidths where linearity\, dynamic range and other physical metrics are
  stressed even more\, mechanisms and ideas for better measurements will be
  explored.</span></p>
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