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DTSTAMP:20221222T013257Z
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DTSTART;TZID=America/New_York:20221221T190000
DTEND;TZID=America/New_York:20221221T203000
DESCRIPTION:Dr. Luciano Boglione\n\nUS Naval Research Laboratory\nWashingto
 n DC 20375\n\nWednesday Dec 21 2022 7:00 pm- 9:00 pm online\n\nThis presen
 tation will discuss the latest work on the microwave noise characterizatio
 n of active devices. Without diving into the details supporting the result
 s\, the presentation will provide qualitative reasons as to why the new ac
 hievements are state-of-the-art results in microwave noise.\n\nDr. Luciano
  Boglione is a PhD graduate of the University of Leeds\, Leeds UK\, under 
 the supervision of the late Prof. Roger Pollard. He has been a researcher 
 at the US Naval Research Laboratory for more than 10 years. His research h
 as focused on active circuit design and microwave noise characterization i
 n both silicon and compound semiconductors.\n\nDr. Boglione is a senior me
 mber of IEEE and a member of the IEEE Microwave Theory and Technology Soci
 ety\, MTT-S.\n\nAgenda: \nIntroduction\nLecture\nQuestions\n\nVirtual: htt
 ps://events.vtools.ieee.org/m/338415
LOCATION:Virtual: https://events.vtools.ieee.org/m/338415
ORGANIZER:ali.darwish.ieee@gmail.com
SEQUENCE:18
SUMMARY:Shhh… quiet\, please! Let’s talk about noise...
URL;VALUE=URI:https://events.vtools.ieee.org/m/338415
X-ALT-DESC:Description: <br /><h4><span style="font-family: arial\, helveti
 ca\, sans-serif\; color: #000000\;"><span style="font-size: 18pt\;"><stron
 g>Dr. Luciano Boglione </strong></span></span></h4>\n<h4><span style="font
 -family: arial\, helvetica\, sans-serif\; color: #000000\; font-size: 14pt
 \;"><strong>US Naval Research Laboratory<br />Washington DC 20375</strong>
 </span></h4>\n<h4><span style="font-family: arial\, helvetica\, sans-serif
 \; color: #236fa1\;"><span style="font-size: 18pt\;"><strong><span style="
 font-size: 14pt\;">Wednesday Dec 21 2022 7:00 pm- 9:00 pm online<br /></sp
 an></strong></span></span></h4>\n<p><span style="font-size: 14pt\; font-fa
 mily: arial\, helvetica\, sans-serif\;">This presentation will discuss the
  latest work on the microwave noise characterization of active devices. </
 span><span style="font-size: 14pt\; font-family: arial\, helvetica\, sans-
 serif\;">Without diving into the details supporting the results\, the pres
 entation will provide qualitative reasons as to why the new achievements a
 re state-of-the-art results in microwave noise.</span></p>\n<p><span style
 ="font-size: 14pt\; font-family: arial\, helvetica\, sans-serif\;">Dr. Luc
 iano Boglione is a PhD graduate of the University of Leeds\, Leeds UK\, un
 der the supervision of the late Prof. Roger&nbsp\; Pollard. He has been a 
 researcher at the US Naval Research Laboratory for more than 10 years. His
  research has focused on active circuit design and microwave noise charact
 erization in both silicon and compound semiconductors. </span></p>\n<p><sp
 an style="font-size: 14pt\; font-family: arial\, helvetica\, sans-serif\;"
 >Dr. Boglione is a senior member of IEEE and a member of the IEEE Microwav
 e Theory and Technology Society\, MTT-S.&nbsp\;</span></p><br /><br />Agen
 da: <br /><p>Introduction<br />Lecture<br />Questions</p>
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