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DTSTART:20230312T030000
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DTSTART:20221106T010000
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DTSTAMP:20230113T014517Z
UID:54D52569-3AEB-4336-AD66-8B75D06AEFD0
DTSTART;TZID=US/Eastern:20221214T130000
DTEND;TZID=US/Eastern:20221214T140000
DESCRIPTION:This webinar addresses the key aspects for making accurate meas
 urements with differential probes on high-speed PCB signal structures: The
  selection of the right probe and the characterization of this probe\, so 
 that it can be completely de-embedded from the measurement result. This al
 so includes the discontinuity at the contact area between probe tips and m
 easured PCB structure. It is caused by the probing and is not part of the 
 PCB structure. For accurate results\, this discontinuity also needs to be 
 characterized and removed from the measurement results. In this webinar\, 
 we demonstrate the measurements and compare the results\, when just de-emb
 edding the probe tips and when correctly also removing this discontinuity.
  In this webinar\, the speaker will start with some typical use cases for 
 measurements with differential probes\, introduce the concept of test fixt
 ure characterization and de-embedding\, and the particular challenges and 
 solutions for accurate measurements with differential probes. We also disc
 uss the specifics of differential probes and their advantages. By referenc
 e to practical measurements of a differential trace on a test board\, we w
 ill explain the steps required to obtain the best measurement results.\n\n
 - Please click the link for registration for attending the webinar: [REGIS
 TER](https://smc-link.s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/l
 ink/100/F066F624227B7549551AE7D0B682989AFA2E49C7?_V_=2&amp;_K11_=811FEBBF12611
 2C37F7F240CE19935E3A4BAB500&amp;_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15M
 zAyMDM5LnM0aGFuYS5vbmRlbWFuZC5jb20mdGFyZ2V0PWh0dHBzOi8vZXZlbnQub24yNC5jb20
 vd2NjL3IvNDAxOTEyNi80OEYwRDA5N0QxQzU1N0I5NjY2MjczRTgwMTgzRjRDNC80MzIzMDc3P
 3BhcnRuZXJyZWY9bmFfbTRjX19h&amp;_K13_=398&amp;_K14_=cce211539b0a3c237993220cfe34db
 2507d4659ac26908f75956b60a769bf072)\n\nCo-sponsored by: IEEE North Jersey 
 Section\n\nSpeaker(s): Brian Shumaker \, \n\nAgenda: \n- Please click the 
 link for registration for attending the webinar: [REGISTER](https://smc-li
 nk.s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/link/100/F066F624227
 B7549551AE7D0B682989AFA2E49C7?_V_=2&amp;_K11_=811FEBBF126112C37F7F240CE19935E3
 A4BAB500&amp;_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15MzAyMDM5LnM0aGFuYS5v
 bmRlbWFuZC5jb20mdGFyZ2V0PWh0dHBzOi8vZXZlbnQub24yNC5jb20vd2NjL3IvNDAxOTEyNi
 80OEYwRDA5N0QxQzU1N0I5NjY2MjczRTgwMTgzRjRDNC80MzIzMDc3P3BhcnRuZXJyZWY9bmFf
 bTRjX19h&amp;_K13_=398&amp;_K14_=cce211539b0a3c237993220cfe34db2507d4659ac26908f75
 956b60a769bf072)\n\nVirtual: https://events.vtools.ieee.org/m/342952
LOCATION:Virtual: https://events.vtools.ieee.org/m/342952
ORGANIZER:anisha_apte@ieee.org
SEQUENCE:2
SUMMARY:Selection\, characterization and de-embedding of differential probe
 s for accurate measurements of high-speed PCB signal structures
URL;VALUE=URI:https://events.vtools.ieee.org/m/342952
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;This webinar addresses the key aspects for
  making accurate measurements with differential probes on high-speed PCB s
 ignal structures: The selection of the right probe and the characterizatio
 n of this probe\, so that it can be completely de-embedded from the measur
 ement result. This also includes the discontinuity at the contact area bet
 ween probe tips and measured PCB structure. It is caused by the probing an
 d is not part of the PCB structure. For accurate results\, this discontinu
 ity also needs to be characterized and removed from the measurement result
 s. In this webinar\, we demonstrate the measurements and compare the resul
 ts\, when just de-embedding the probe tips and when correctly also removin
 g this discontinuity. In this webinar\, the speaker will start with some t
 ypical use cases for measurements with differential probes\, introduce the
  concept of test fixture characterization and de-embedding\, and the parti
 cular challenges and solutions for accurate measurements with differential
  probes. We also discuss the specifics of differential probes and their ad
 vantages. By reference to practical measurements of a differential trace o
 n a test board\, we will explain the steps required to obtain the best mea
 surement results.&lt;/p&gt;\n&lt;ul&gt;\n&lt;li&gt;&lt;span style=&quot;font-size: 14pt\;&quot;&gt;Please cl
 ick the link for registration for attending the webinar: &lt;a id=&quot;yiv5591015
 242igdtkkh&quot; title=&quot;Save your spot for our webinar&quot; href=&quot;https://smc-link.
 s4hana.ondemand.com/eu/data-buffer/sap/public/cuan/link/100/F066F624227B75
 49551AE7D0B682989AFA2E49C7?_V_=2&amp;amp\;_K11_=811FEBBF126112C37F7F240CE19935
 E3A4BAB500&amp;amp\;_L54AD1F204_=c2NlbmFyaW89TUxDUEcmdGVuYW50PW15MzAyMDM5LnM0a
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 WY9bmFfbTRjX19h&amp;amp\;_K13_=398&amp;amp\;_K14_=cce211539b0a3c237993220cfe34db25
 07d4659ac26908f75956b60a769bf072&quot; target=&quot;_blank&quot; rel=&quot;noopener noreferrer
 &quot;&gt;REGISTER&lt;/a&gt;&amp;nbsp\;&lt;/span&gt;&lt;/li&gt;\n&lt;/ul&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;ul&gt;\n&lt;l
 i&gt;&lt;span style=&quot;font-size: 14pt\;&quot;&gt;Please click the link for registration f
 or attending the webinar: &lt;a id=&quot;yiv5591015242igdtkkh&quot; title=&quot;Save your sp
 ot for our webinar&quot; href=&quot;https://smc-link.s4hana.ondemand.com/eu/data-buf
 fer/sap/public/cuan/link/100/F066F624227B7549551AE7D0B682989AFA2E49C7?_V_=
 2&amp;amp\;_K11_=811FEBBF126112C37F7F240CE19935E3A4BAB500&amp;amp\;_L54AD1F204_=c2
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 2&quot; target=&quot;_blank&quot; rel=&quot;noopener noreferrer&quot;&gt;REGISTER&lt;/a&gt;&lt;/span&gt;&lt;/li&gt;\n&lt;/u
 l&gt;
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