BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:Asia/Kolkata
BEGIN:STANDARD
DTSTART:19451014T230000
TZOFFSETFROM:+0630
TZOFFSETTO:+0530
TZNAME:IST
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BEGIN:VEVENT
DTSTAMP:20230421T131733Z
UID:C9BBB6A9-7795-4A01-A173-F98409A47038
DTSTART;TZID=Asia/Kolkata:20230421T093000
DTEND;TZID=Asia/Kolkata:20230421T110000
DESCRIPTION:Reliability and failure physics modeling of electronic componen
 ts and systems. Finite element modeling of materials degradation. Reliabil
 ity of Li Ion battery and high power LEDs. Statistical modeling of enginee
 ring systems. Nano-materials and devices reliability. Prognosis & health m
 anagement of engineering system.\n\nSpeaker(s): Cher-Ming\, \n\nRoom: H05\
 , Bldg: Academic Building\, H-05\, IIITDM Kancheepuram\, Vandalur-Kelambak
 kam Road\, Chennai\, Tamil Nadu\, India\, 600127
LOCATION:Room: H05\, Bldg: Academic Building\, H-05\, IIITDM Kancheepuram\,
  Vandalur-Kelambakkam Road\, Chennai\, Tamil Nadu\, India\, 600127
ORGANIZER:kppradhan@iiitdm.ac.in
SEQUENCE:2
SUMMARY:Challenges of Reliability in Advanced Electronics
URL;VALUE=URI:https://events.vtools.ieee.org/m/354318
X-ALT-DESC:Description: <br /><p>Reliability and failure physics modeling o
 f electronic components and systems. Finite element modeling of materials 
 degradation. Reliability of Li Ion battery and high power LEDs. Statistica
 l modeling of engineering systems. Nano-materials and devices reliability.
  Prognosis &amp\; health management of engineering system.</p>
END:VEVENT
END:VCALENDAR