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TZID:Europe/Warsaw
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DTSTART:20230326T030000
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DTSTART:20231029T020000
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BEGIN:VEVENT
DTSTAMP:20230619T105912Z
UID:AD9DB593-B44F-4642-BCD7-DE95B9B701CC
DTSTART;TZID=Europe/Warsaw:20230613T170000
DTEND;TZID=Europe/Warsaw:20230613T183000
DESCRIPTION:Over the past three decades\, the demand for wireline communica
 tion makes different kinds of standards evolute exponentially in speed. Al
 so\, to accommodate different link partners in the ecosystem\, the receive
 r must tolerate different signal qualities at the inputs\; therefore\, mos
 t protocols specify the worst-case input signal to make sure the target re
 ceiver can still operate well such that it can perform better than the str
 essed eye under any better link conditions. For example\, the added impair
 ments of the stressed-eye test could be inter-symbol interference (ISI)\, 
 broadband noise\, random jitter\, sinusoidal jitter (SJ)\, differential mo
 de sinusoidal interference (DMSI)\, common mode sinusoidal interference (C
 MSI)\, etc. at the input.\nThis presentation will begin with introducing t
 he industry trends of a wireline serial link. Then move forward with a mul
 ti-protocol (MP) SerDes introduction. We’ll then show comprehensive impa
 irments of the receiver’s stressed eye test from different protocols\, a
 nd the corresponding design optimizations for improving the stressed-eye t
 olerance will also be discussed. A further Q&A discussion will be covered 
 at the end of this presentation.\n\nCo-sponsored by: Silicon Creations\n\n
 Speaker(s): Chung-Chun (CC) Chen\, \n\nRoom: 121\, Bldg: B-1\, AGH Univers
 ity\, Kraków\, Malopolskie\, Poland\, 30-059\, Virtual: https://events.vt
 ools.ieee.org/m/360362
LOCATION:Room: 121\, Bldg: B-1\, AGH University\, Kraków\, Malopolskie\, P
 oland\, 30-059\, Virtual: https://events.vtools.ieee.org/m/360362
ORGANIZER:krzysztof.kasinski@siliconcr.com
SEQUENCE:13
SUMMARY:CC Chen - Challenges of Overcoming the SERDES Receiver’s Stressed
  Eye Test among Protocols
URL;VALUE=URI:https://events.vtools.ieee.org/m/360362
X-ALT-DESC:Description: <br /><p>Over the past three decades\, the demand f
 or wireline communication makes different kinds of standards evolute expon
 entially in speed. Also\, to accommodate different link partners in the ec
 osystem\, the receiver must tolerate different signal qualities at the inp
 uts\; therefore\, most protocols specify the worst-case input signal to ma
 ke sure the target receiver can still operate well such that it can perfor
 m better than the stressed eye under any better link conditions. For examp
 le\, the added impairments of the stressed-eye test could be inter-symbol 
 interference (<em>ISI</em>)\, broadband noise\, random jitter\, sinusoidal
  jitter (<em>SJ</em>)\, differential mode sinusoidal interference (<em>DMS
 I</em>)\,<em> </em>common mode sinusoidal interference (<em>CMSI</em>)\,<e
 m> </em>etc. at the input.<br />This presentation will begin with introduc
 ing the industry trends of a wireline serial link. Then move forward with 
 a multi-protocol (<em>MP</em>) SerDes introduction. We&rsquo\;ll then show
  comprehensive impairments of the receiver&rsquo\;s stressed eye test from
  different protocols\, and the corresponding design optimizations for impr
 oving the stressed-eye tolerance will also be discussed. A further Q&amp\;
 A discussion will be covered at the end of this presentation.</p>
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