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DTSTART:20230312T030000
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DTSTART:20231105T010000
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DTSTART;TZID=US/Eastern:20230524T140000
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DESCRIPTION:This webinar is intended for engineers who work on digital desi
 gn and testing. Particularly we will be discussing the impact of test fixt
 ure de-embedding on digital interface testing.\n\nCo-sponsored by: IEEE No
 rth Jersey Section\n\nSpeaker(s): Martin Stumpf\, Dr. Mathias Hellwig\, Fa
 bian Altenbrunn\n\nVirtual: https://events.vtools.ieee.org/m/362056
LOCATION:Virtual: https://events.vtools.ieee.org/m/362056
ORGANIZER:anisha_apte@ieee.org
SEQUENCE:23
SUMMARY:Deembedding test fixtures for high-speed digital applications 
URL;VALUE=URI:https://events.vtools.ieee.org/m/362056
X-ALT-DESC:Description: <br /><p>This webinar is intended for engineers who
  work on digital design and testing. Particularly we will be discussing th
 e impact of test fixture de-embedding on digital interface testing.</p>
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