BEGIN:VCALENDAR
VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:America/New_York
BEGIN:DAYLIGHT
DTSTART:20230312T030000
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
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BEGIN:STANDARD
DTSTART:20231105T010000
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11
TZNAME:EST
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20230824T210710Z
UID:D481088B-23D4-4DF3-B13D-860F5BD98E74
DTSTART;TZID=America/New_York:20230823T180000
DTEND;TZID=America/New_York:20230823T200000
DESCRIPTION:Hello again! The IEEE Columbus Joint Chapter of the Solid-State
  Circuits and Circuits and Systems Societies is back with an exciting seri
 es of lectures given by distinguished lecturers. The next lecture in this 
 series will be on Correlated Double Sampling (CDS) for Solid-State Image S
 ensors by Prof. Marvin H. White from the Ohio State University. This talk 
 will be fully catered and will include around an hour of lecture as well a
 s an additional hour for questions\, discussion\, and networking. See belo
 w for more details on registration\, the lecture topic\, and the distingui
 shed speaker. Additionally\, be sure to click the web version of this noti
 ce for the full event flyer.\n\nSpeaker(s): Marv\, \n\nAgenda: \nShort Int
 roduction (5 min)\n\nTechnical Talk (60 minutes)\n\nQuestions (10 minutes)
 \n\nRefreshments and Social (30-60 minutes)\n\nRoom: 200\, Bldg: Rev1 Vent
 ures\, 1275 Kinnear Rd\, Columbus\, Ohio\, United States\, 43212\, Virtual
 : https://events.vtools.ieee.org/m/364668
LOCATION:Room: 200\, Bldg: Rev1 Ventures\, 1275 Kinnear Rd\, Columbus\, Ohi
 o\, United States\, 43212\, Virtual: https://events.vtools.ieee.org/m/3646
 68
ORGANIZER:roman@senseics.com
SEQUENCE:16
SUMMARY:CASS Outreach Round One: Correlated Double Sampling (CDS) for Solid
 -State Image Sensors
URL;VALUE=URI:https://events.vtools.ieee.org/m/364668
X-ALT-DESC:Description: <br /><p>Hello again! The IEEE Columbus Joint Chapt
 er of the Solid-State Circuits and Circuits and Systems Societies is back 
 with an exciting series of lectures given by distinguished lecturers. The 
 next lecture in this series will be on <strong>Correlated Double Sampling 
 (CDS) for Solid-State Image Sensors&nbsp\;</strong>by <strong>Prof. Marvin
  H. White from the Ohio State University</strong>. This talk will be fully
  catered and will include around an hour of lecture as well as an addition
 al hour for questions\, discussion\, and networking. See below for more de
 tails on registration\, the lecture topic\, and the distinguished speaker.
  Additionally\, be sure to click the web version of this notice for the fu
 ll event flyer.</p><br /><br />Agenda: <br /><p>Short Introduction (5 min)
 </p>\n<p>Technical Talk (60 minutes)</p>\n<p>Questions (10 minutes)</p>\n<
 p>Refreshments and Social (30-60 minutes)</p>
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