BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/New_York BEGIN:DAYLIGHT DTSTART:20230312T030000 TZOFFSETFROM:-0500 TZOFFSETTO:-0400 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:EDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20231105T010000 TZOFFSETFROM:-0400 TZOFFSETTO:-0500 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:EST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20231016T131737Z UID:A2B765B5-99B5-4FD7-BD20-F738FEF6C785 DTSTART;TZID=America/New_York:20231012T110000 DTEND;TZID=America/New_York:20231012T130000 DESCRIPTION:Whether in the defense\, healthcare\, consumer electronics\, or communication industries\, performing electronic packaging reliability de monstration tests is a crucial part of the design process. This webinar wi ll cover a wide range of accelerated life tests (ALT)\, including ALT test s at the device level to determine characteristic life\, highly accelerate d life tests (HALT) to determine design flaws\, highly accelerated stress screens (HASS) to catch manufacturing defects\, and board level reliabilit y tests (BLTR) to demonstrate product reliability. The discussion of each test will include a definition of the test\, recommendations on how to des ign and complete the test\, and how to process the results. The lecture is focused on electronics reliability and will use electronics examples to a id in the discussion.\n\nThis presentation is the second part of a two-lec ture miniseries covering electronics reliability validation testing. The p revious lecture focused on developing a fundamental background of electron ics failures. This lecture will focus on using those fundamentals to devel op validation tests based.\n\nTAKEAWAYS:\n\n- How to use accelerated life testing to predict product life in the field.\n- Understanding the differe nces between the different ALT test – ALT/HALT/HASS/BLRT\n- How to devel op a reliability demonstration test.\n\nWe can offer Continuing Education Units (CEU) and Professional Development Hours (PDH)\, if requested.\n\nSp eaker(s): Dr. Jon Kordell\, Phd\, \n\nVirtual: https://events.vtools.ieee. org/m/369501 LOCATION:Virtual: https://events.vtools.ieee.org/m/369501 ORGANIZER:k.safina@ieee.org SEQUENCE:22 SUMMARY:IEEE-Ansys Electronics Reliability Validation Testing Series - Acce lerated Life Testing for Electronics Reliability URL;VALUE=URI:https://events.vtools.ieee.org/m/369501 X-ALT-DESC:Description: <br /><p>Whether in the defense\, healthcare\, cons umer electronics\, or communication industries\, performing electronic pac kaging reliability demonstration tests is a crucial part of the design pro cess. This webinar will cover a wide range of accelerated life tests (ALT) \, including ALT tests at the device level to determine characteristic lif e\, highly accelerated life tests (HALT) to determine design flaws\, highl y accelerated stress screens (HASS) to catch manufacturing defects\, and b oard level reliability tests (BLTR) to demonstrate product reliability. Th e discussion of each test will include a definition of the test\, recommen dations on how to design and complete the test\, and how to process the re sults. The lecture is focused on electronics reliability and will use elec tronics examples to aid in the discussion.</p>\n<p>This presentation is th e second part of a two-lecture miniseries covering electronics reliability validation testing. The previous lecture focused on developing a fundamen tal background of electronics failures. This lecture will focus on using t hose fundamentals to develop validation tests based.</p>\n<p><strong>TAKEA WAYS:</strong></p>\n<ul>\n<li>How to use accelerated life testing to predi ct product life in the field.</li>\n<li>Understanding the differences betw een the different ALT test &ndash\; ALT/HALT/HASS/BLRT</li>\n<li>How to de velop a reliability demonstration test.</li>\n</ul>\n<p>We can offer Conti nuing Education Units (CEU) and Professional Development Hours (PDH)\, if requested.</p> END:VEVENT END:VCALENDAR