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DTSTAMP:20231013T142311Z
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DTSTART;TZID=America/New_York:20231011T173000
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DESCRIPTION:Material properties affect the performance of electronic device
 s. Material characterization techniques can be used to analyze a wide rang
 e of properties. Mainly\, we will focus on Scanning Electron Microscope (S
 EM) based techniques that are commonly used to characterize materials. For
  example\, Energy Dispersive Spectrometry (EDS) is used to identify chemis
 try distribution within a surface while Electron Backscatter Diffraction (
 EBSD) provides information about the grain size\, crystal structure and or
 ientation\, among others. This presentation will offer an overview of some
  characterization techniques\, discussing how the techniques work and what
  information can be obtained from them. Some examples of applications will
  be shared to illustrate how they can solve research problems.\n\nSpeaker(
 s): Alfredo Díaz González\, \n\nAgenda: \n5:30 PM  Networking\n\n6:00 PM
  Technical Presentation\n\n6:45 PM Questions and Answers\n\n7:00 PM Adjour
 nment\n\nBldg: Main Cafeteria\, Lincoln Laboratory\, 244 Wood St\, Lexingt
 on\, MA 02421\, Massachusetts\, United States\, Virtual: https://events.vt
 ools.ieee.org/m/371485
LOCATION:Bldg: Main Cafeteria\, Lincoln Laboratory\, 244 Wood St\, Lexingto
 n\, MA 02421\, Massachusetts\, United States\, Virtual: https://events.vto
 ols.ieee.org/m/371485
ORGANIZER:michael.bannan@ieee.org 
SEQUENCE:66
SUMMARY:Hybrid Event- The State of the Art in Material Characterization for
  Electronics
URL;VALUE=URI:https://events.vtools.ieee.org/m/371485
X-ALT-DESC:Description: <br /><p><span style="font-size: medium\;"><span la
 ng="en-US">Material properties affect the performance of electronic device
 s. Material characterization techniques can be used to analyze a wide rang
 e of properties. Mainly\, we will focus on Scanning Electron Microscope (S
 EM) based techniques that are commonly used to characterize materials. For
  example\, Energy Dispersive Spectrometry (EDS) is used to identify chemis
 try distribution within a surface while Electron Backscatter Diffraction (
 EBSD) provides information about the grain size\, crystal structure and or
 ientation\, among others. This presentation will offer an overview of some
  characterization techniques\, discussing how the techniques work and what
  information can be obtained from them. Some examples of applications will
  be shared to illustrate how they can solve research problems.</span></spa
 n></p><br /><br />Agenda: <br /><p><strong>5:30 PM&nbsp\; &nbsp\;</strong>
 &nbsp\; Networking</p>\n<p><strong>6:00 PM</strong>&nbsp\; &nbsp\;Technica
 l Presentation</p>\n<p><strong>6:45 PM</strong>&nbsp\;&nbsp\; Questions an
 d Answers</p>\n<p><strong>7:00 PM</strong>&nbsp\;&nbsp\;&nbsp\;Adjournment
 </p>
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