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DTSTART:20230312T030000
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DTSTART:20231105T010000
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DTSTAMP:20230913T205532Z
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DTSTART;TZID=America/Denver:20230913T140000
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DESCRIPTION:Abhishek Saini presents his work on Defect characterization usi
 ng ultrasound - ray-based to wavefield based approach\n\nSpeaker(s): Abhis
 hek Saini\, \, John Greenhall\n\nVirtual: https://events.vtools.ieee.org/m
 /373759
LOCATION:Virtual: https://events.vtools.ieee.org/m/373759
ORGANIZER:jgreenhall@ieee.gov
SEQUENCE:4
SUMMARY:IEEE Fall Seminar Series
URL;VALUE=URI:https://events.vtools.ieee.org/m/373759
X-ALT-DESC:Description: <br /><p>Abhishek Saini presents his work on Defect
  characterization using ultrasound - ray-based to wavefield based approach
 </p>
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