BEGIN:VCALENDAR VERSION:2.0 PRODID:IEEE vTools.Events//EN CALSCALE:GREGORIAN BEGIN:VTIMEZONE TZID:America/New_York BEGIN:DAYLIGHT DTSTART:20240310T030000 TZOFFSETFROM:-0500 TZOFFSETTO:-0400 RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3 TZNAME:EDT END:DAYLIGHT BEGIN:STANDARD DTSTART:20231105T010000 TZOFFSETFROM:-0400 TZOFFSETTO:-0500 RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11 TZNAME:EST END:STANDARD END:VTIMEZONE BEGIN:VEVENT DTSTAMP:20231214T165056Z UID:8717B38F-CE03-449A-AC3E-4D11D2167DCF DTSTART;TZID=America/New_York:20231213T170000 DTEND;TZID=America/New_York:20231213T193000 DESCRIPTION:Complex electronics systems and components are subject to vario us stressors and uncertainties that can affect their reliability and perfo rmance over time. Traditional reliability assessment methods\, such as sta tistical models\, MTBF estimations\, and testing\, may not be able to capt ure the complex interactions and dependencies among the system elements an d the failure mechanisms. Physics of failure is an alternative approach th at uses physics-based modeling and simulation to understand the root cause s of failure\, such as device degradation\, fatigue\, fracture\, wear\, an d corrosion\, and to predict the system reliability and life expectancy un der different operating conditions and environments. It can also estimate the remaining useful life and the state of degradation of the system. Phys ics of failure can also incorporate probabilistic methods to account for t he uncertainties and variabilities in the system parameters\, materials pr operties\, loading conditions\, and failure mechanisms. In this presentati on\, we will present the foundation and methods of physics of failure-base d tools for reliability modeling of complex electronics systems and compon ents and demonstrate how they can be applied to various domains. We will a lso discuss the advantages and limitations of the physics of failure-based reliability modeling and compare it with other reliability assessment met hods. The capabilities of Ansys Sherlock will be demonstrated for electron ics physics of failure.\n\nSpeaker(s): Mohammad Pourgol\, \n\nAgenda: \n5: 00 PM Networking\n\n5:30 PM Technical Presentation\n\n7:15 PM Questions a nd Answers\n\n7:30 PM Adjournment\n\nBldg: Main Cafeteria\, Lincoln Labora tory\, 244 Wood St\, Lexington\, MA 02421\, Massachusetts\, United States\ , Virtual: https://events.vtools.ieee.org/m/381012 LOCATION:Bldg: Main Cafeteria\, Lincoln Laboratory\, 244 Wood St\, Lexingto n\, MA 02421\, Massachusetts\, United States\, Virtual: https://events.vto ols.ieee.org/m/381012 ORGANIZER:michael.bannan@ieee.org SEQUENCE:75 SUMMARY:Hybrid Event- Complex Electronics Reliability and Life Modeling Bas ed on Physics of failure Simulation URL;VALUE=URI:https://events.vtools.ieee.org/m/381012 X-ALT-DESC:Description: <br /><p align="justify"><span style="color: #11111 1\; font-size: 12pt\;"><span style="font-family: Roboto\, serif\;">Complex electronics systems and components are subject to various stressors and u ncertainties that can affect their reliability and performance over time. Traditional reliability assessment methods\, such as statistical models\, MTBF estimations\, and testing\, may not be able to capture the complex in teractions and dependencies among the system elements and the failure mech anisms. Physics of failure is an alternative approach that uses physics-ba sed modeling and simulation to understand the root causes of failure\, suc h as device degradation\, fatigue\, fracture\, wear\, and corrosion\, and to predict the system reliability and life expectancy under different oper ating conditions and environments. It can also estimate the remaining usef ul life and the state of degradation of the system. Physics of failure can also incorporate probabilistic methods to account for the uncertainties a nd variabilities in the system parameters\, materials properties\, loading conditions\, and failure mechanisms. In this presentation\, we will prese nt the foundation and methods of physics of failure-based tools for reliab ility modeling of complex electronics systems and components and demonstra te how they can be applied to various domains. We will also discuss the ad vantages and limitations of the physics of failure-based reliability model ing and compare it with other reliability assessment methods. The capabili ties of Ansys Sherlock will be demonstrated for electronics physics of fai lure.</span></span></p><br /><br />Agenda: <br /><p><strong>5:00 PM&nbsp\; &nbsp\;</strong>&nbsp\; Networking</p>\n<p><strong>5:30 PM</strong>&nbsp\ ; &nbsp\;Technical Presentation</p>\n<p><strong>7:15 PM</strong>&nbsp\;&nb sp\; Questions and Answers</p>\n<p><strong>7:30 PM</strong>&nbsp\;&nbsp\;& nbsp\;Adjournment</p> END:VEVENT END:VCALENDAR