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PRODID:IEEE vTools.Events//EN
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DTSTART:20240310T030000
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BEGIN:VEVENT
DTSTAMP:20231122T091957Z
UID:37A66666-6A32-49CC-8547-18B3C8AD9431
DTSTART;TZID=America/New_York:20231121T130000
DTEND;TZID=America/New_York:20231121T140000
DESCRIPTION:The presentation will discuss our latest efforts in developing 
 a picowatt cryogenic thermal detector for use in measuring the emitted opt
 ical power from NRC quantum-dot single photon sources\, and linking this m
 easurement directly to the SI. I will also discuss the application of freq
 uency-programmable Josephson voltage standards to the direct measurement o
 f the electrical substitution power of the picowatt detector\n\nCo-sponsor
 ed by: National Research Council\, Canada. Optonique. \n\nSpeaker(s): Malc
 olm White\, \n\nVirtual: https://events.vtools.ieee.org/m/385143
LOCATION:Virtual: https://events.vtools.ieee.org/m/385143
ORGANIZER:matthew.t.posner@ieee.org
SEQUENCE:14
SUMMARY:SI power traceability for single photon quantum-dot emitters using 
 a picowatt cryogenic thermal detector
URL;VALUE=URI:https://events.vtools.ieee.org/m/385143
X-ALT-DESC:Description: <br /><p style="font-weight: 400\;">The presentatio
 n will discuss our latest efforts in developing a picowatt cryogenic therm
 al detector for use in measuring the emitted optical power from NRC quantu
 m-dot single photon sources\, and linking this measurement directly to the
  SI. I will also discuss the application of frequency-programmable Josephs
 on voltage standards to the direct measurement of the electrical substitut
 ion power of the picowatt detector</p>
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