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DTSTART:20240310T030000
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DTSTART:20241103T010000
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DTSTAMP:20240429T160313Z
UID:C48DEE6A-6699-4893-BFDD-FEBD6A187D71
DTSTART;TZID=America/Los_Angeles:20240326T173000
DTEND;TZID=America/Los_Angeles:20240326T200000
DESCRIPTION:5:30pm social and food\n\n6:15pm presentation starts\n\nGetting
  the money and space for implementing more anechoic chambers serving vario
 us test purposes can be a difficult path. The question “Dear Test &amp; Meas
 urement Solution Supplier\, I have a large full-vehicle EMC chamber. Could
  you modify it\, so it can do both EMC and OTA measurements?” is increas
 ingly asked these days. Even though the evaluation of unintended electroma
 gnetic radiation phenomena and intended radiation performance have a lot i
 n common\, they also differ in many respects. This talk discusses the trad
 e-off that has to be made when choosing to combine EMC and OTA in one test
  environment and discusses the scope of specific combinations that work be
 tter than others.\n\nSpeaker(s): Benoit Derat\, \n\n1120 Fulton Pl\, Fremo
 nt\, California\, United States\, 94539
LOCATION:1120 Fulton Pl\, Fremont\, California\, United States\, 94539
ORGANIZER:Caroline.chan.us@ieee.org
SEQUENCE:3
SUMMARY:Performing OTA Measurements in an EMC Range – A Real or False Goo
 d Idea?
URL;VALUE=URI:https://events.vtools.ieee.org/m/403453
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;5:30pm social and food&lt;/p&gt;\n&lt;p&gt;6:15pm pres
 entation starts&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;Getting the money and space for im
 plementing more anechoic chambers serving various test purposes can be a d
 ifficult path. The question &amp;ldquo\;Dear Test &amp;amp\; Measurement Solution 
 Supplier\, I have a large full-vehicle EMC chamber. Could you modify it\, 
 so it can do both EMC and OTA measurements?&amp;rdquo\; is increasingly asked 
 these days. Even though the evaluation of unintended electromagnetic radia
 tion phenomena and intended radiation performance have a lot in common\, t
 hey also differ in many respects. This talk discusses the trade-off that h
 as to be made when choosing to combine EMC and OTA in one test environment
  and discusses the scope of specific combinations that work better than ot
 hers.&lt;/p&gt;
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