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VERSION:2.0
PRODID:IEEE vTools.Events//EN
CALSCALE:GREGORIAN
BEGIN:VTIMEZONE
TZID:Asia/Kolkata
BEGIN:STANDARD
DTSTART:19451014T230000
TZOFFSETFROM:+0630
TZOFFSETTO:+0530
TZNAME:IST
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BEGIN:VEVENT
DTSTAMP:20240331T174128Z
UID:BE410FBF-EC44-4187-A1DB-308B05133275
DTSTART;TZID=Asia/Kolkata:20240321T090000
DTEND;TZID=Asia/Kolkata:20240321T103000
DESCRIPTION:SiGe HBT technology and its combination with dense digital CMOS
  provides a highly attractive platform for compact integrated mm-wave and 
 THz systems. This talk introduces the architecture of modern SiGe HBTs. Ne
 xt successful numerical simulation (TCAD) approaches are discussed that ca
 n support device design. Then\, an industry-standard compact model for adv
 anced SiGe HBTs is built step-by-step\, addresses the information needs of
  circuit designers and process engineers. Examples of comparisons of the v
 arious models with measurements are provided and possible pitfalls are dis
 cussed. Two case studies are presented that show the application of the va
 rious modeling tools to process development\, generating PDK models\, and 
 technology roadmap generation.\n\nSpeaker(s): Prof. Michael Schroeter\, \n
 \nVirtual: https://events.vtools.ieee.org/m/413285
LOCATION:Virtual: https://events.vtools.ieee.org/m/413285
ORGANIZER:ieee.apmtts.sbciitkgp@gmail.com
SEQUENCE:32
SUMMARY:IEEE AP-MTTs SBC IITKGP presents IEEE MTTS SB Talk on SiGe HBT Tech
 nology
URL;VALUE=URI:https://events.vtools.ieee.org/m/413285
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;SiGe HBT technology and its combination wi
 th dense digital CMOS provides a highly attractive platform for compact in
 tegrated mm-wave and THz systems. This talk introduces the architecture of
  modern SiGe HBTs. Next successful numerical simulation (TCAD) approaches 
 are discussed that can support device design. Then\, an industry-standard 
 compact model for advanced SiGe HBTs is built step-by-step\, addresses the
  information needs of circuit designers and process engineers. Examples of
  comparisons of the various models with measurements are provided and poss
 ible pitfalls are discussed. Two case studies are presented that show the 
 application of the various modeling tools to process development\, generat
 ing PDK models\, and technology roadmap generation.&lt;/p&gt;
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