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DTSTART:20160313T030000
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DTSTART:20161106T010000
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DTSTAMP:20161011T195330Z
UID:3C338287-8FEC-11E6-A7C6-0050568D7F66
DTSTART;TZID=US/Eastern:20161028T190000
DTEND;TZID=US/Eastern:20161028T210000
DESCRIPTION:Abstract - In many application domains\, Simulink/Stateflow ser
 ves as a platform for model-based development of the reactive embedded cod
 e\, that interacts with its environment in real-time fashion. The talk wil
 l present a model-based approach for testing Simulink/Stateflow code\, bas
 ed on its automated translation to input-output extended finite automaton 
 (I/O-EFA)\, followed by automated test-generation\, guaranteeing user-defi
 ned code as well as requirements coverage\, and also support for automated
  test-execution and error-localization. While testing is useful for design
 -time error analysis\, the talk will further discuss our model-based appro
 ach for run-time error monitoring\, detection and localization. Monitoring
  at system level (as opposed to software level) is necessarily stochastic\
 , and a more general I/O-Stochastic Hybrid Automaton (I/O-SHA) model is us
 ed\, and condition is obtained for bounded-delay detectability\, and achie
 ving desired levels of false-positives/-negatives.\n\nDr. Ratnesh Kumar is
  a Professor of Electrical &amp; Computer Engineering at the Iowa State Univer
 sity\, and prior to which he was with the ECE Dept. at the Univ. of Kentuc
 ky. He received B.Tech. in Electrical Eng. from Indian Institute of Techno
 logy\, Kanpur (IITK) in 1987\, and M.S. and Ph.D. in Electrical &amp; Computer
  Engineering from the Univ. of Texas\, Austin (UTAustin) in 1989 and 1991\
 , respectively. Ratnesh&#39;s research interest spans sensors\, networks\, con
 trols and software with application domains of cyberphysical (hybrid) syst
 ems\, embedded and real-time systems\, model-based software and web-servic
 es\, power systems\, energy harvesting\, and sustainable agriculture. Ratn
 esh received Gold Medals from IITK\, MCD Fellowship and Dissertation Award
  from UTAustin\, Fellowships from NASA-Ames\, Applied Research Lab-Penn St
 ate Univ\, Idaho National Lab\, and United Technologies Research Center\, 
 and several awards from NSF (including Research Initiation Award)\, DoE\, 
 ONR\, General Motors\, and Adobe. Ratnesh is a Fellow of the IEEE for cont
 ributions to discrete event system modeling\, control\, diagnosis and appl
 ications . Ratnesh has served on a number of editorial boards for IEEE and
  ACM\, has been General/Program Chair and also given keynote talks at IEEE
  and ACM conferences.\n\nCo-sponsored by: James Cross-Cole\n\nAgenda: \nDi
 nner (Pizza) 6:00 PM \, Presentation 6:30 to 7:15 PM\; discussion 7:15-8:0
 0 PM\n\nRoom: HT-122\, Bldg: Monntgomery College\, High Technology Buildin
 g\, 20200 Observation Drive\, Germantown\, Maryland\, United States\, 2087
 6
LOCATION:Room: HT-122\, Bldg: Monntgomery College\, High Technology Buildin
 g\, 20200 Observation Drive\, Germantown\, Maryland\, United States\, 2087
 6
ORGANIZER:hbiglari@IEEE.org
SEQUENCE:1
SUMMARY:Model-Based Testing and Monitoring for Embedded Software
URL;VALUE=URI:https://events.vtools.ieee.org/m/41629
X-ALT-DESC:Description: &lt;br /&gt;&lt;p&gt;&lt;strong&gt;Abstract -&lt;/strong&gt; In many applic
 ation domains\, Simulink/Stateflow serves as a platform for model-based de
 velopment of the reactive embedded code\, that interacts with its environm
 ent in real-time fashion. The talk will present a model-based approach for
  testing Simulink/Stateflow code\, based on its automated translation to i
 nput-output extended finite automaton (I/O-EFA)\, followed by automated te
 st-generation\, guaranteeing user-defined code as well as requirements cov
 erage\, and also support for automated test-execution and error-localizati
 on. While testing is useful for design-time error analysis\, the talk will
  further discuss our model-based approach for run-time error monitoring\, 
 detection and localization. Monitoring at system level (as opposed to soft
 ware level) is necessarily stochastic\, and a more general I/O-Stochastic 
 Hybrid Automaton (I/O-SHA) model is used\, and condition is obtained for b
 ounded-delay detectability\, and achieving desired levels of false-positiv
 es/-negatives.&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&lt;st
 rong&gt;Dr. Ratnesh Kumar&lt;/strong&gt; is a Professor of Electrical &amp;amp\; Comput
 er Engineering at the Iowa State University\, and prior to which he was wi
 th the ECE Dept. at the Univ. of Kentucky. He received B.Tech. in Electric
 al Eng. from Indian Institute of Technology\, Kanpur (IITK) in 1987\, and 
 M.S. and Ph.D. in Electrical &amp;amp\; Computer Engineering from the Univ. of
  Texas\, Austin (UTAustin) in 1989 and 1991\, respectively. Ratnesh&#39;s rese
 arch interest spans sensors\, networks\, controls and software with applic
 ation domains of cyberphysical (hybrid) systems\, embedded and real-time s
 ystems\, model-based software and web-services\, power systems\, energy ha
 rvesting\, and sustainable agriculture. Ratnesh received Gold Medals from 
 IITK\, MCD Fellowship and Dissertation Award from UTAustin\, Fellowships f
 rom NASA-Ames\, Applied Research Lab-Penn State Univ\, Idaho National Lab\
 , and United Technologies Research Center\, and several awards from NSF (i
 ncluding Research Initiation Award)\, DoE\, ONR\, General Motors\, and Ado
 be. Ratnesh is a Fellow of the IEEE for contributions to discrete event sy
 stem modeling\, control\, diagnosis and applications . Ratnesh has served 
 on a number of editorial boards for IEEE and ACM\, has been General/Progra
 m Chair and also given keynote talks at IEEE and ACM conferences.&lt;/p&gt;\n&lt;p&gt;
 &amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;\n&lt;p&gt;&amp;nbsp\;&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;Di
 nner (Pizza) 6:00 PM \, Presentation 6:30 to 7:15 PM\; discussion 7:15-8:0
 0 PM&lt;/p&gt;
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