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PRODID:IEEE vTools.Events//EN
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BEGIN:VTIMEZONE
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DTSTART:20240310T030000
TZOFFSETFROM:-0600
TZOFFSETTO:-0500
RRULE:FREQ=YEARLY;BYDAY=2SU;BYMONTH=3
TZNAME:CDT
END:DAYLIGHT
BEGIN:STANDARD
DTSTART:20241103T010000
TZOFFSETFROM:-0500
TZOFFSETTO:-0600
RRULE:FREQ=YEARLY;BYDAY=1SU;BYMONTH=11
TZNAME:CST
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTAMP:20240928T194218Z
UID:E843E8D5-C83F-4808-993B-8BD3EDC5B86B
DTSTART;TZID=America/Chicago:20240919T180000
DTEND;TZID=America/Chicago:20240919T193000
DESCRIPTION:System and platform debug is extremely important to launch prod
 ucts quickly\, to avoid undue delays in production\, for faster customer p
 roduct introduction\, for in-field debug\, etc. Traditional debug techniqu
 es using open-chassis are useful for system debug\, but removing the chips
  from the platform takes an unacceptable amount of time in today&#39;s competi
 tive environment. The availability of USB Type-C connectors on most comput
 er platforms opens up an entirely new platform debug method called closed-
 chassis debug. This new type of debug eliminates the need to open up the p
 latform.\n\nClosed-Chassis Platform Debug using an available functional re
 ceptacle\, such as USB Type-C\, on a final form factor device is now highl
 y important for Hardware\, Software and Firmware debug. The wide acceptanc
 e of the Type-C receptacle by most OEMs/ODMs\, makes this connector/recept
 acle the optimum interface for debug purposes. This presentation starts by
  introducing traditional debug techniques\, then gives details on the hist
 ory of USB and how USB evolved to the Type-C connector. It then goes cover
 s new system and platform debug techniques including open and closed-chass
 is debug using the ubiquitous USB Type-C connector.\n\nSpeaker(s): Sankara
 n Menon\, \n\nAgenda: \n6:00 to 6:05 PM - Open for participants to enter a
 nd network.\n6:05 to 6:10 PM - IEEE LM and CTCN Business meeting and to in
 troduce speaker.\n6:10 to 7:30 PM - Formal Program and Q&amp;A.\n\nRoom: 8\, B
 ldg: Asian American Resource Center\, 8401 Cameron Rd.\, Austin\, Texas\, 
 United States\, 78754\, Virtual: https://events.vtools.ieee.org/m/431672
LOCATION:Room: 8\, Bldg: Asian American Resource Center\, 8401 Cameron Rd.\
 , Austin\, Texas\, United States\, 78754\, Virtual: https://events.vtools.
 ieee.org/m/431672
ORGANIZER:lbasto@ieee.org
SEQUENCE:20
SUMMARY:IEEE CTS LMAG &amp; CTCN 9.19.2024 meeting - System and Platform Debug 
 using USB Type-C Connector
URL;VALUE=URI:https://events.vtools.ieee.org/m/431672
X-ALT-DESC:Description: &lt;br /&gt;&lt;div style=&quot;font-family: Calibri\, Helvetica\
 , sans-serif\; font-size: 12pt\; color: rgb(0\, 0\, 0)\;&quot;&gt;System and platf
 orm debug is extremely important to launch products quickly\, to avoid und
 ue delays&amp;nbsp\;in production\, for faster customer product introduction\,
  for in-field debug\, etc. Traditional debug techniques using open-chassis
  are&amp;nbsp\;useful for system debug\, but removing the chips from the&amp;nbsp\
 ;platform takes an unacceptable amount of time in today&#39;s competitive envi
 ronment. The availability of USB Type-C&amp;nbsp\;connectors on most computer 
 platforms opens up an&amp;nbsp\;entirely new platform debug method called clos
 ed-chassis debug.&amp;nbsp\; This new type of debug eliminates the need to ope
 n up the platform.&lt;/div&gt;\n&lt;div style=&quot;font-family: Calibri\, Helvetica\, s
 ans-serif\; font-size: 12pt\; color: rgb(0\, 0\, 0)\;&quot;&gt;&amp;nbsp\;&lt;/div&gt;\n&lt;div
  style=&quot;font-family: Calibri\, Helvetica\, sans-serif\; font-size: 12pt\; 
 color: rgb(0\, 0\, 0)\;&quot;&gt;Closed-Chassis Platform Debug using an available 
 functional receptacle\, such as USB Type-C\, on a final&amp;nbsp\;form factor 
 device is now highly important for Hardware\, Software and Firmware debug.
  The wide acceptance of the&amp;nbsp\;Type-C receptacle by most OEMs/ODMs\, ma
 kes this&amp;nbsp\;connector/receptacle the optimum interface for debug purpos
 es. This presentation starts by introducing&amp;nbsp\;traditional debug techni
 ques\, then gives details on the history of USB and how USB evolved to the
  Type-C&amp;nbsp\;connector.&amp;nbsp\; It then goes covers new system and platfor
 m debug techniques including open and closed-chassis debug using the ubiqu
 itous USB Type-C connector.&lt;/div&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;div dir=&quot;ltr&quot; 
 data-setdir=&quot;false&quot;&gt;6:00 to 6:05 PM - Open for participants to enter and n
 etwork.&amp;nbsp\;&lt;/div&gt;\n&lt;div dir=&quot;ltr&quot; data-setdir=&quot;false&quot;&gt;6:05 to 6:10 PM -
  IEEE LM and CTCN Business meeting and to introduce speaker.&lt;/div&gt;\n&lt;div d
 ir=&quot;ltr&quot; data-setdir=&quot;false&quot;&gt;6:10 to 7:30 PM - Formal Program and Q&amp;amp\;A
 .&amp;nbsp\;&lt;/div&gt;
END:VEVENT
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