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DTSTART:20240310T030000
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DTSTART:20241103T010000
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DTSTAMP:20241017T010526Z
UID:E4CB7EE0-193C-4623-925B-91C70CB55394
DTSTART;TZID=America/New_York:20241010T190000
DTEND;TZID=America/New_York:20241010T213000
DESCRIPTION:[]\n\nIonization profile monitors (IPMs) are widely used in acc
 elerators for non-destructive and fast diagnostics of high energy particle
  beams. These monitors provide information of particle beam shape and dyna
 mics. Profile monitors extract from the passing beam the vertical and hori
 zontal distributions of the beam particles\, be they electrons\, protons o
 r heavier ions.\n\nAttendees will learn:\n\n- The deposition of energy in 
 matter\, in this case the ionization of a background gas\n- How shaped ele
 ctrodes direct the ion pairs\n- How an amplification of 10^7 converts sing
 le ions to a detectable current\n\nI will cover basic principles of energy
  deposition in matter\, applicable to particle detection in solid-state de
 tectors as well as single-event upsets in CMOS\, electrode design for shap
 ed fields\, and ultra-high vacuum considerations for the use of materials.
 \n\nSpeaker(s): Arnold Stillman\n\nAgenda: \n7:00 PM Networking\n\n7:20 PM
  Presentation\n\nVirtual: https://events.vtools.ieee.org/m/433986
LOCATION:Virtual: https://events.vtools.ieee.org/m/433986
ORGANIZER:chair@licn.org
SEQUENCE:43
SUMMARY:Ionization Profile Monitors
URL;VALUE=URI:https://events.vtools.ieee.org/m/433986
X-ALT-DESC:Description: &lt;br /&gt;&lt;p class=&quot;MsoNormal&quot;&gt;&lt;img style=&quot;display: blo
 ck\; margin-left: auto\; margin-right: auto\;&quot; src=&quot;https://events.vtools.
 ieee.org/vtools_ui/media/display/087a7954-3771-481c-b958-c156b3ad9a4a&quot; alt
 =&quot;&quot; width=&quot;481&quot; height=&quot;358&quot;&gt;&lt;/p&gt;\n&lt;p&gt;Ionization profile monitors (IPMs) a
 re widely used in accelerators for non-destructive and fast diagnostics of
  high energy particle beams. These monitors provide information of particl
 e beam shape and dynamics. Profile monitors extract from the passing beam 
 the vertical and horizontal distributions of the beam particles\, be they 
 electrons\, protons or heavier ions.&lt;/p&gt;\n&lt;p class=&quot;vspace&quot;&gt;Attendees will
  learn:&lt;/p&gt;\n&lt;ul&gt;\n&lt;li&gt;The deposition of energy in matter\, in this case t
 he ionization of a background gas&lt;/li&gt;\n&lt;li&gt;How shaped electrodes direct t
 he ion pairs&lt;/li&gt;\n&lt;li&gt;How an amplification of 10^7 converts single ions t
 o a detectable current&lt;/li&gt;\n&lt;/ul&gt;\n&lt;p class=&quot;vspace&quot;&gt;I will cover basic p
 rinciples of energy deposition in matter\, applicable to particle detectio
 n in solid-state detectors as well as single-event upsets in CMOS\, electr
 ode design for shaped fields\, and ultra-high vacuum considerations for th
 e use of materials.&lt;/p&gt;&lt;br /&gt;&lt;br /&gt;Agenda: &lt;br /&gt;&lt;p&gt;7:00 PM &amp;nbsp\; Networ
 king&lt;/p&gt;\n&lt;p&gt;7:20 PM &amp;nbsp\; Presentation&lt;/p&gt;
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